DOI: 10.1016/j.surfrep.2010.10.001. Kelvin probe force microscopy and its application

Kelvin probe force microscopy and its application

10.1016/j.surfrep.2010.10.001

Crossref journal-article

Elsevier BV

Surface Science Reports (78)

Bibliography

Melitz, W., Shen, J., Kummel, A. C., & Lee, S. (2011). Kelvin probe force microscopy and its application. Surface Science Reports, 66(1), 1â27.

Authors 4

Wilhelm Melitz (first)
Jian Shen (additional)
Andrew C. Kummel (additional)
Sangyeob Lee (additional)

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Dates

Type	When
Created	14 years, 8 months ago (Nov. 26, 2010, 2:42 a.m.)
Deposited	6 years, 8 months ago (Dec. 6, 2018, 5:50 a.m.)
Indexed	15 hours, 52 minutes ago (Aug. 22, 2025, 12:49 a.m.)
Issued	14 years, 7 months ago (Jan. 1, 2011)
Published	14 years, 7 months ago (Jan. 1, 2011)
Published Print	14 years, 7 months ago (Jan. 1, 2011)

Funders 0

None

BibTeX

@article{Melitz_2011, title={Kelvin probe force microscopy and its application}, volume={66}, ISSN={0167-5729}, url={http://dx.doi.org/10.1016/j.surfrep.2010.10.001}, DOI={10.1016/j.surfrep.2010.10.001}, number={1}, journal={Surface Science Reports}, publisher={Elsevier BV}, author={Melitz, Wilhelm and Shen, Jian and Kummel, Andrew C. and Lee, Sangyeob}, year={2011}, month=jan, pages={1–27} }

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