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Solid-State Electronics (78)
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Jeong, D. S., Cheong, B., & Kohlstedt, H. (2011). Pt/Ti/Al2O3/Al tunnel junctions exhibiting electroforming-free bipolar resistive switching behavior. Solid-State Electronics, 63(1), 1–4.

Authors 3
  1. Doo Seok Jeong (first)
  2. Byung-ki Cheong (additional)
  3. Hermann Kohlstedt (additional)
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Dates
Type When
Created 14 years ago (Aug. 14, 2011, 4:06 p.m.)
Deposited 6 years, 8 months ago (Nov. 30, 2018, 9:25 a.m.)
Indexed 11 months, 1 week ago (Sept. 16, 2024, 2:22 p.m.)
Issued 13 years, 11 months ago (Sept. 1, 2011)
Published 13 years, 11 months ago (Sept. 1, 2011)
Published Print 13 years, 11 months ago (Sept. 1, 2011)
Funders 0

None

@article{Jeong_2011, title={Pt/Ti/Al2O3/Al tunnel junctions exhibiting electroforming-free bipolar resistive switching behavior}, volume={63}, ISSN={0038-1101}, url={http://dx.doi.org/10.1016/j.sse.2011.05.028}, DOI={10.1016/j.sse.2011.05.028}, number={1}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Jeong, Doo Seok and Cheong, Byung-ki and Kohlstedt, Hermann}, year={2011}, month=sep, pages={1–4} }