DOI: 10.1016/j.pmatsci.2011.01.011. Topological and atomic scale characterization of grain boundary networks in polycrystalline and nanocrystalline materials

Topological and atomic scale characterization of grain boundary networks in polycrystalline and nanocrystalline materials

10.1016/j.pmatsci.2011.01.011

Crossref journal-article

Elsevier BV

Progress in Materials Science (78)

Bibliography

Li, M., & Xu, T. (2011). Topological and atomic scale characterization of grain boundary networks in polycrystalline and nanocrystalline materials. Progress in Materials Science, 56(6), 864â899.

Authors 2

Mo Li (first)
Tao Xu (additional)

References 40 Referenced 28

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Dates

Type	When
Created	14 years, 6 months ago (Feb. 2, 2011, 4:34 a.m.)
Deposited	6 years, 2 months ago (June 8, 2019, 4:27 a.m.)
Indexed	3 months ago (May 27, 2025, 12:23 p.m.)
Issued	14 years, 1 month ago (Aug. 1, 2011)
Published	14 years, 1 month ago (Aug. 1, 2011)
Published Print	14 years, 1 month ago (Aug. 1, 2011)

Funders 0

None

BibTeX

@article{Li_2011, title={Topological and atomic scale characterization of grain boundary networks in polycrystalline and nanocrystalline materials}, volume={56}, ISSN={0079-6425}, url={http://dx.doi.org/10.1016/j.pmatsci.2011.01.011}, DOI={10.1016/j.pmatsci.2011.01.011}, number={6}, journal={Progress in Materials Science}, publisher={Elsevier BV}, author={Li, Mo and Xu, Tao}, year={2011}, month=aug, pages={864–899} }

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