DOI: 10.1016/j.orgel.2007.10.003. Conductive atomic force microscopy (C-AFM) analysis of photoactive layers in inert atmosphere

Conductive atomic force microscopy (C-AFM) analysis of photoactive layers in inert atmosphere

10.1016/j.orgel.2007.10.003

Crossref journal-article

Elsevier BV

Organic Electronics (78)

Bibliography

Alexeev, A., & Loos, J. (2008). Conductive atomic force microscopy (C-AFM) analysis of photoactive layers in inert atmosphere. Organic Electronics, 9(1), 149â154.

Authors 2

Alexander Alexeev (first)
Joachim Loos (additional)

References 21 Referenced 26

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Dates

Type	When
Created	17 years, 9 months ago (Oct. 25, 2007, 2:12 a.m.)
Deposited	6 years, 7 months ago (Jan. 3, 2019, 1:21 a.m.)
Indexed	1 year, 2 months ago (May 27, 2024, 8:03 p.m.)
Issued	17 years, 6 months ago (Feb. 1, 2008)
Published	17 years, 6 months ago (Feb. 1, 2008)
Published Print	17 years, 6 months ago (Feb. 1, 2008)

Funders 0

None

BibTeX

@article{Alexeev_2008, title={Conductive atomic force microscopy (C-AFM) analysis of photoactive layers in inert atmosphere}, volume={9}, ISSN={1566-1199}, url={http://dx.doi.org/10.1016/j.orgel.2007.10.003}, DOI={10.1016/j.orgel.2007.10.003}, number={1}, journal={Organic Electronics}, publisher={Elsevier BV}, author={Alexeev, Alexander and Loos, Joachim}, year={2008}, month=feb, pages={149–154} }

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