DOI: 10.1016/j.nimb.2007.12.008. Application of mass-separated focused ion beams in nano-technology

Application of mass-separated focused ion beams in nano-technology

10.1016/j.nimb.2007.12.008

Crossref journal-article

Elsevier BV

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms (78)

Bibliography

Bischoff, L. (2008). Application of mass-separated focused ion beams in nano-technology. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 266(8), 1846â1851.

Authors 1

L. Bischoff (first)

References 51 Referenced 29

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Dates

Type	When
Created	17 years, 6 months ago (Jan. 30, 2008, 9:59 a.m.)
Deposited	6 years, 7 months ago (Dec. 31, 2018, 8:31 p.m.)
Indexed	11 months, 2 weeks ago (Sept. 6, 2024, 6:53 a.m.)
Issued	17 years, 4 months ago (April 1, 2008)
Published	17 years, 4 months ago (April 1, 2008)
Published Print	17 years, 4 months ago (April 1, 2008)

Funders 0

None

BibTeX

@article{Bischoff_2008, title={Application of mass-separated focused ion beams in nano-technology}, volume={266}, ISSN={0168-583X}, url={http://dx.doi.org/10.1016/j.nimb.2007.12.008}, DOI={10.1016/j.nimb.2007.12.008}, number={8}, journal={Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms}, publisher={Elsevier BV}, author={Bischoff, L.}, year={2008}, month=apr, pages={1846–1851} }

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