DOI: 10.1016/j.microrel.2006.07.064. Kelvin probe force microscopy – An appropriate tool for the electrical characterisation of LED heterostructures

Kelvin probe force microscopy – An appropriate tool for the electrical characterisation of LED heterostructures

10.1016/j.microrel.2006.07.064

Crossref journal-article

Elsevier BV

Microelectronics Reliability (78)

Bibliography

Bergbauer, W., Lutz, T., Frammelsberger, W., & Benstetter, G. (2006). Kelvin probe force microscopy â An appropriate tool for the electrical characterisation of LED heterostructures. Microelectronics Reliability, 46(9â11), 1736â1740.

Authors 4

W. Bergbauer (first)
T. Lutz (additional)
W. Frammelsberger (additional)
G. Benstetter (additional)

References 13 Referenced 10

10.1063/1.1413721 / Applied Physics Letters / Identification of aging mechanisms in the optical and electrical characteristics of light-emitting diodes by Pursiainen (2001)
10.1016/S0026-2714(98)00029-8 / Microelectronics Reliability / The degradation of GaAlAs red light-emitting diodes under continuous and low-speed pulse operation by Yanagisawa (1998)
Altieri P, Lutz T, Jaeger A, Stauss P, Streubel K. Influence of doping on the reliability of AlGaInP LEDs. Applied Physics Letters, submitted for publication, 2005.
10.1063/1.1767280 / Applied Physics Letter / Electrical characteristics of InGaN/GaN light-emitting diodes grown on GaN and sapphire substrates by Cao (2004)
10.1063/1.1651337 / Journal of Applied Physics / Degradation mechanism limiting the lifetime of ZnSe-based white light-emitting diodes by Katayama (2004)
Behnke UE. Dynamische Spannungsmessungen an Submikrometerleitungen mittels der elektrischen Kraftmikroskopie, Dissertation, Gerhard-Mercator-Universität—Gesamthochschule Duisburg, 2002.
10.1063/1.105227 / Applied Physics Letter / Kelvin probe microscopy by Nonnenmacher (1991)
10.1063/1.368181 / Journal of Applied Physics / Resolution and contrast in Kelvin probe force microscopy by Jacobs (1998)
Veeco 2005. Dimension 3100 Scanning Probe Microscope (SPM). Online. Available from: http://www.veeco.com/html/datasheet/_d3100.asp [Accessed 9 September 2005].
Serry FM, Kjoller K, Thornton JT, Tench RJ, Cook D. Electric Force Microscopy, Surface Potential Imaging and Surface Electric Modification Application Note AN27. Available from www.veeco.com [Accessed from 17.05.2006], Digital Instruments Veeco Metrology Group, 2004.
10.1016/S0043-1648(00)00450-6 / Wear / Kelvin probe microscopy measurements of surface potential change under wear at low loads, Elsevier by Bushan (2000)
10.1051/jp1:1994217 / Journal de Physique I, France / Electrostatic forces between a metallic tip and semiconductor surfaces by Hudlet (1994)
10.1063/1.368181 / Journal of Applied Physics / Resolution and contrast in Kelvin probe force microscopy by Jacobs (1998)

Dates

Type	When
Created	19 years ago (Aug. 25, 2006, 7:43 a.m.)
Deposited	6 years, 4 months ago (April 20, 2019, 12:31 p.m.)
Indexed	1 year, 10 months ago (Oct. 5, 2023, 10:54 p.m.)
Issued	18 years, 11 months ago (Sept. 1, 2006)
Published	18 years, 11 months ago (Sept. 1, 2006)
Published Print	18 years, 11 months ago (Sept. 1, 2006)

Funders 0

None

BibTeX

@article{Bergbauer_2006, title={Kelvin probe force microscopy – An appropriate tool for the electrical characterisation of LED heterostructures}, volume={46}, ISSN={0026-2714}, url={http://dx.doi.org/10.1016/j.microrel.2006.07.064}, DOI={10.1016/j.microrel.2006.07.064}, number={9–11}, journal={Microelectronics Reliability}, publisher={Elsevier BV}, author={Bergbauer, W. and Lutz, T. and Frammelsberger, W. and Benstetter, G.}, year={2006}, month=sep, pages={1736–1740} }

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