DOI: 10.1016/j.micron.2011.10.019. Model-based electron microscopy: From images toward precise numbers for unknown structure parameters

Model-based electron microscopy: From images toward precise numbers for unknown structure parameters

10.1016/j.micron.2011.10.019

Crossref journal-article

Elsevier BV

Micron (78)

Bibliography

Van Aert, S., Van den Broek, W., Goos, P., & Van Dyck, D. (2012). Model-based electron microscopy: From images toward precise numbers for unknown structure parameters. Micron, 43(4), 509â515.

Authors 4

S. Van Aert (first)
W. Van den Broek (additional)
P. Goos (additional)
D. Van Dyck (additional)

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Dates

Type	When
Created	13 years, 9 months ago (Nov. 3, 2011, 3 a.m.)
Deposited	6 years, 8 months ago (Nov. 28, 2018, 1:22 p.m.)
Indexed	4 weeks, 1 day ago (July 25, 2025, 6:34 a.m.)
Issued	13 years, 5 months ago (March 1, 2012)
Published	13 years, 5 months ago (March 1, 2012)
Published Print	13 years, 5 months ago (March 1, 2012)

Funders 0

None

BibTeX

@article{Van_Aert_2012, title={Model-based electron microscopy: From images toward precise numbers for unknown structure parameters}, volume={43}, ISSN={0968-4328}, url={http://dx.doi.org/10.1016/j.micron.2011.10.019}, DOI={10.1016/j.micron.2011.10.019}, number={4}, journal={Micron}, publisher={Elsevier BV}, author={Van Aert, S. and Van den Broek, W. and Goos, P. and Van Dyck, D.}, year={2012}, month=mar, pages={509–515} }

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