Crossref
journal-article
Elsevier BV
Micron (78)
References
31
Referenced
28
10.1016/j.ultramic.2010.03.008
/ Ultramicroscopy / Elemental mapping at the atomic scale using low accelerating voltages by Botton (2010){'key': '10.1016/j.micron.2011.05.011_bib0010', 'series-title': 'Proceedings of the EMC 2008', 'article-title': 'Characterization of indium doped zinc oxide nanorods', 'author': 'Burghardt', 'year': '2008'}
/ Proceedings of the EMC 2008 / Characterization of indium doped zinc oxide nanorods by Burghardt (2008)10.1016/S0304-3991(01)00155-3
/ Ultramicroscopy / Improved background-fitting algorithms for ionization edges in EEL spectra by Egerton (2002)10.1063/1.3265946
/ Appl. Phys. Lett. / Robust atomic resolution imaging of light elements using scanning transmission electron microscopy by Findlay (2009)10.1016/S0304-3991(98)00048-5
/ Ultramicroscopy / A spherical-aberration-corrected 200kV transmission electron microscope by Haider (1998)10.1039/a805291c
/ J. Mater. Chem. / Extended defect structures in zinc oxide doped with iron and indium by Hörlin (1998)10.1017/S1551929500050045
/ Microsc. Today / Development of a 200kV atomic resolution analytical electron microscope by Isabell (2009){'key': '10.1016/j.micron.2011.05.011_bib0040', 'first-page': '636', 'article-title': 'The crystal structure of InGaO3(ZnO)4: a single crystal X-ray and electron diffraction study', 'author': 'Keller', 'year': '2010', 'journal-title': 'Z. Anorg. Allg. Chem.'}
/ Z. Anorg. Allg. Chem. / The crystal structure of InGaO3(ZnO)4: a single crystal X-ray and electron diffraction study by Keller (2010)10.1111/j.1551-2916.2007.02066.x
/ J. Am. Ceram. Soc. / ZnO with additions of Fe2O3: microstructure defects, and Fe solubility by Köster-Scherger (2007){'issue': '7', 'key': '10.1016/j.micron.2011.05.011_bib0050', 'first-page': 'S9', 'article-title': 'Development of a cold field-emission gun for a 200kV atomic resolution electron microscope', 'volume': '24', 'author': 'Kohno', 'year': '2010', 'journal-title': 'Microsc. Anal.'}
/ Microsc. Anal. / Development of a cold field-emission gun for a 200kV atomic resolution electron microscope by Kohno (2010)10.1038/nature08879
/ Nat. Lett. / Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy by Krivanek (2010)10.1017/S1431927610013504
/ Microsc. Microanal. / Imaging, core-loss, and low-loss electron-energy-loss spectroscopy mapping in aberration-corrected STEM by Lazar (2010)10.1006/jssc.1998.7856
/ J. Solid State Chem. / Modulated structures of homologous compounds InMO3(ZnO)m (M=In Ga; m=integer) described by four-dimensional superspace group by Li (1998)10.1016/0022-4596(90)90110-J
/ J. Solid State Chem. / The phase relations in the In2O3–Fe2ZnO4–ZnO system at 1350°C by Nakamura (1990){'key': '10.1016/j.micron.2011.05.011_bib0075', 'series-title': 'Proceedings of the MC2009, Vol. 1', 'article-title': 'Structural and elemental analysis under the sub-Angstrom resolution with Cs-corrected STEM', 'author': 'Oikawa', 'year': '2009'}
/ Proceedings of the MC2009, Vol. 1 / Structural and elemental analysis under the sub-Angstrom resolution with Cs-corrected STEM by Oikawa (2009)10.1017/S1431927609093891
/ Microsc. Microanal. / Visualization of light elements at ultrahigh resolution by STEM annular bright field microscopy by Okunishi (2009)10.1063/1.1992666
/ J. Appl. Phys. / A comprehensive review of ZnO materials and devices by Özgür (2005)10.1016/0304-3991(90)90078-Z
/ Ultramicroscopy / ELNES of 3d transition-metal oxides: II. Variations with oxidation state and crystal structure by Paterson (1990)10.1016/0304-3991(89)90173-3
/ Ultramicroscopy / Z-contrast STEM for materials science by Pennycook (1989)10.1017/S1431927602000594
/ Microsc. Microanal. / Z-contrast imaging in an aberration-corrected STEM by Pennycook (2000)10.1016/j.ultramic.2009.10.005
/ Ultramicroscopy / Long-range correlations in In2O3(ZnO)7 investigated by DFT calculations and electron holography by Röder (2010)10.1039/a900790c
/ J. Mater. Chem. / Zn3In2O6—crystallographic and electronic structure by Schinzer (1999)10.1016/j.micron.2005.12.004
/ Micron / Oxidation states of Mn and Fe in various compound oxide systems by Schmid (2006){'issue': 'Suppl. 3', 'key': '10.1016/j.micron.2011.05.011_bib0120', 'first-page': '50', 'article-title': 'Structural investigation using Fe–L2,3 ELNES recorded by high energy-resolution EELS', 'volume': '13', 'author': 'Schmid', 'year': '2007', 'journal-title': 'Microsc. Microanal.'}
/ Microsc. Microanal. / Structural investigation using Fe–L2,3 ELNES recorded by high energy-resolution EELS by Schmid (2007){'issue': '2', 'key': '10.1016/j.micron.2011.05.011_bib0125', 'first-page': '13', 'article-title': 'Distribution of Fe and In dopants in zinc oxide: combined EELS and EDS analysis', 'volume': '23', 'author': 'Schmid', 'year': '2009', 'journal-title': 'Microsc. Anal.'}
/ Microsc. Anal. / Distribution of Fe and In dopants in zinc oxide: combined EELS and EDS analysis by Schmid (2009)10.1023/B:INTS.0000028656.12913.8a
/ Interface Sci. / A new method to measure small amounts of solute atoms on planar defects and application to inversion domain boundaries in doped zinc oxide by Walther (2004)10.3139/146.101322
/ Int. J. Mater. Res. (formerly Z. Metallkunde) / Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide by Walther (2006)10.1016/j.micron.2006.07.021
/ Micron / Inversion domain boundaries in ZnO with additions of Fe2O3 studied by high-resolution ADF imaging by Wolf (2007){'year': '2009', 'series-title': 'Transmission Electron Microscopy. Part 4: Spectroscopy', 'author': 'Williams', 'key': '10.1016/j.micron.2011.05.011_bib0145'}
/ Transmission Electron Microscopy. Part 4: Spectroscopy by Williams (2009)10.1063/1.122513
/ Appl. Phys. Lett. / Polytypoid structures in annealed In2O3–ZnO films by Yan (1998)10.1016/j.ultramic.2009.11.023
/ Ultramicroscopy / Displacement field measurement of metal sub-lattice in inversion domains of indium-doped zinc oxide by Yu (2010)
Dates
Type | When |
---|---|
Created | 14 years, 2 months ago (June 19, 2011, 1:15 a.m.) |
Deposited | 1 year, 4 months ago (April 7, 2024, 3:30 p.m.) |
Indexed | 1 month, 1 week ago (July 26, 2025, 4:39 a.m.) |
Issued | 13 years, 8 months ago (Jan. 1, 2012) |
Published | 13 years, 8 months ago (Jan. 1, 2012) |
Published Print | 13 years, 8 months ago (Jan. 1, 2012) |
@article{Schmid_2012, title={Structural and elemental analysis of iron and indium doped zinc oxide by spectroscopic imaging in Cs-corrected STEM}, volume={43}, ISSN={0968-4328}, url={http://dx.doi.org/10.1016/j.micron.2011.05.011}, DOI={10.1016/j.micron.2011.05.011}, number={1}, journal={Micron}, publisher={Elsevier BV}, author={Schmid, H. and Okunishi, E. and Oikawa, T. and Mader, W.}, year={2012}, month=jan, pages={49–56} }