DOI: 10.1016/j.micron.2007.01.001. Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary

Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary

10.1016/j.micron.2007.01.001

Crossref journal-article

Elsevier BV

Micron (78)

Bibliography

PÃ©rez-Willard, F., Wolde-Giorgis, D., Al-Kassab, T., LÃ³pez, G. A., Mittemeijer, E. J., Kirchheim, R., & Gerthsen, D. (2008). Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary. Micron, 39(1), 45â52.

Authors 7

Fabián Pérez-Willard (first)
Daniel Wolde-Giorgis (additional)
Talaát Al-Kassab (additional)
Gabriel A. López (additional)
Eric J. Mittemeijer (additional)
Reiner Kirchheim (additional)
Dagmar Gerthsen (additional)

References 14 Referenced 18

10.1016/0169-4332(94)00525-7 / Appl. Surf. Sci. / FIM/TAP analysis of Cu–Pd multilayers by Al-Kassab (1995)
Anon., 2007. For more information, please refer to the SIMION homepage: www.simion.com.
10.1017/S1431927604883193 / Microsc. Microanal. / Site-specific FIB preparation of atom probe samples by Colijn (2004)
10.1016/S0968-4328(99)00005-0 / Micron / A review of focused ion beam milling techniques for TEM specimen preparation by Giannuzzi (1999)
10.1016/0169-4332(93)90345-C / Appl. Surf. Sci. / A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films by Hasegawa (1993)
10.1016/S0304-3991(98)00058-8 / Ultramicroscopy / Focused-ion-beam milling for field-ion specimen preparation: preliminary investigations by Larson (1998)
10.1016/S0304-3991(99)00055-8 / Ultramicroscopy / Field-ion specimen preparation using focused ion-beam milling by Larson (1999)
{'key': '10.1016/j.micron.2007.01.001_bib8', 'series-title': 'Atom Probe Microanalysis—Principles and Applications to Materials Problems', 'author': 'Miller', 'year': '1989'} / Atom Probe Microanalysis—Principles and Applications to Materials Problems by Miller (1989)
10.1016/j.ultramic.2004.10.011 / Ultramicroscopy / Strategies for fabrication atom probe specimens with a dual beam FIB by Miller (2005)
{'key': '10.1016/j.micron.2007.01.001_bib10', 'series-title': 'Field Ion Microscopy—Principles and Applications', 'author': 'Müller', 'year': '1969'} / Field Ion Microscopy—Principles and Applications by Müller (1969)
10.1093/jmicro/dfh054 / J. Electron Microsc. / Focused ion beam fabrication of field-ion microscope specimens from mechanically milled pearlitic steel powder by Ohsaki (2004)
10.1116/1.586537 / J. Vac. Sci. Technol. / Novel scheme for the preparation of transmission electron microscopy specimens with a focused ion beam by Overwijk (1993)
10.1080/01418610208240039 / Phil. Mag. A / On the correlation between grain-boundary segregation, faceting and embrittlement in Bi-doped Cu by Sigle (2002)
Wolde-Giorgis, D., 2005. Grain boundary segregation in silver-nickel and copper-bismuth alloys. Ph.D. Thesis. Göttingen.

Dates

Type	When
Created	18 years, 7 months ago (Jan. 21, 2007, 7:08 a.m.)
Deposited	6 years, 7 months ago (Jan. 9, 2019, 3:51 p.m.)
Indexed	1 year, 1 month ago (July 21, 2024, 4:21 a.m.)
Issued	17 years, 7 months ago (Jan. 1, 2008)
Published	17 years, 7 months ago (Jan. 1, 2008)
Published Print	17 years, 7 months ago (Jan. 1, 2008)

Funders 0

None

BibTeX

@article{P_rez_Willard_2008, title={Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary}, volume={39}, ISSN={0968-4328}, url={http://dx.doi.org/10.1016/j.micron.2007.01.001}, DOI={10.1016/j.micron.2007.01.001}, number={1}, journal={Micron}, publisher={Elsevier BV}, author={Pérez-Willard, Fabián and Wolde-Giorgis, Daniel and Al-Kassab, Talaát and López, Gabriel A. and Mittemeijer, Eric J. and Kirchheim, Reiner and Gerthsen, Dagmar}, year={2008}, month=jan, pages={45–52} }

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