Crossref
journal-article
Elsevier BV
Micron (78)
References
51
Referenced
1,814
10.1007/s004110050125
/ Radiat. Environ. Biophys. / Absolute and effective cross-sections for low-energy electron-scattering processes within condensed matter by Bass (1998){'key': '10.1016/j.micron.2004.02.003_BIB2', 'series-title': 'Proceedings of the 1st International Conference on Electron and Ion Beam Science and Technology', 'first-page': '191', 'article-title': 'Micromachining by sputtering through a mask of contamination laid down by an electron beam', 'author': 'Broers', 'year': '1964'}
/ Proceedings of the 1st International Conference on Electron and Ion Beam Science and Technology / Micromachining by sputtering through a mask of contamination laid down by an electron beam by Broers (1964)10.1147/rd.324.0502
/ IBM J. Res. Dev. / Resolution limits for electron-beam lithography by Broers (1988)10.1007/BF00617890
/ Appl. Phys. A / Mean-free paths and scattering processes for 0.1–4500 eV electrons in saturated hydrocarbon films by Cartier (1997)10.1016/0304-3991(95)00077-1
/ Ultramicroscopy / Correlations between ionization radiation damage and charging effects in transmission electron microscopy by Cazaux (1995){'key': '10.1016/j.micron.2004.02.003_BIB6', 'series-title': 'Introduction to Health Physics', 'author': 'Cember', 'year': '1992'}
/ Introduction to Health Physics by Cember (1992)10.1016/0029-554X(76)90760-6
/ Nuclear Instr. Meth / Sputtering in the high voltage electron microscope by Cherns (1976)10.1080/14786437708235999
/ Phil. Mag. / Sputtering of gold foils in a high voltage electron microscope: a comparison of theory and experiment by Cherns (1977)-
Clark, W.R.K., Chapman, J.N., Macleod, A.M., Ferrier, R.P., 1980. Radiation damage mechanism in copper phthalocyanine and its chlarinated derivatives. Ultramicroscopy 5, 195–208.
(
10.1016/0304-3991(80)90024-8
) {'key': '10.1016/j.micron.2004.02.003_BIB9', 'first-page': '232', 'article-title': 'Observation of exit surface sputtering in TiO2 using biased secondary electron imaging', 'volume': '237', 'author': 'Crozier', 'year': '1990', 'journal-title': 'Ultramicroscopy'}
/ Ultramicroscopy / Observation of exit surface sputtering in TiO2 using biased secondary electron imaging by Crozier (1990)10.1088/0022-3727/2/7/312
/ J. Phys. D / The electric charging of electron-microscope images by Curtis (1969)10.1016/0304-3991(89)90318-5
/ Ultramicroscopy / Nanolithography using field emission and conventional thermionic electron sources by Devenish (1989)10.1016/0304-3991(86)90191-9
/ Ultramicroscopy / Improvement in high resolution image quality of radiation-sensitive specimens achieved with reduced spot size of the electron beam by Downing (1986)10.1016/S0304-3991(80)80009-X
/ Ultramicroscopy / Chemical measurements of radiation damage in organic samples at and below room temperature by Egerton (1980)-
Egerton, R.F., Malac, M., 2004. The lateral range and energy deposition of fast secondary electrons, submitted for publication.
(
10.1017/S1431927604880541
) 10.1016/0304-3991(87)90240-3
/ Ultramicroscopy / Electron energy-loss spectroscopy and chemical change by Egerton (1987)10.1016/0304-3991(83)90055-4
/ Ultramicroscopy / The reduction of radiation damage in the electron microscope by Fryer (1983)10.1016/0304-3991(84)90091-3
/ Ultramicroscopy / Radiation damage in organic crystalline films by Fryer (1984)10.1098/rspa.1984.0062
/ Proc. R. Soc. (London) / High resolution electron microscopy of molecular crystals. III. Radiation processes at room temperature by Fryer (1984)10.1016/0304-3991(87)90242-7
/ Ultramicroscopy / The effect of dose rate on imaging aromatic organic crystals by Fryer (1987)10.1016/0304-3991(85)90069-5
/ Ultramicroscopy / Quantitative analysis of image contrast in electron micrographs of beam-sensitive crystals by Henderson (1985){'key': '10.1016/j.micron.2004.02.003_BIB21', 'series-title': 'Introduction to Analytical Electron Microscopy', 'first-page': '399', 'article-title': 'Radiation effects in analysis by TEM', 'author': 'Hobbs', 'year': '1987'}
/ Introduction to Analytical Electron Microscopy / Radiation effects in analysis by TEM by Hobbs (1987){'key': '10.1016/j.micron.2004.02.003_BIB22', 'first-page': '171', 'article-title': "Murphy's law and the uncertainty of electron probes", 'volume': '4', 'author': 'Hobbs', 'year': '1990', 'journal-title': 'Scanning Microscopy Supplement'}
/ Scanning Microscopy Supplement / Murphy's law and the uncertainty of electron probes by Hobbs (1990)10.1080/13642818508240634
/ Phil. Mag. / Electron beam ionization damage processes in p-terphenyl by Howie (1985){'key': '10.1016/j.micron.2004.02.003_BIB24', 'first-page': '155', 'article-title': 'Beam damage in organic crystals', 'author': 'Howie', 'year': '1987', 'journal-title': 'Inst. Phys. Conf. Ser. No. 90(Proc. EMAG 87)'}
/ Inst. Phys. Conf. Ser. No. 90(Proc. EMAG 87) / Beam damage in organic crystals by Howie (1987){'key': '10.1016/j.micron.2004.02.003_BIB25', 'series-title': 'Barriers to AEM: contamination and etching', 'author': 'Hren', 'year': '1979'}
/ Barriers to AEM: contamination and etching by Hren (1979){'key': '10.1016/j.micron.2004.02.003_BIB26', 'first-page': '185', 'article-title': 'Electron beam nano-etching in oxides, fluorides, metals and semiconductors', 'volume': '4', 'author': 'Humphreys', 'year': '1990', 'journal-title': 'Scanning Microscopy Supplement'}
/ Scanning Microscopy Supplement / Electron beam nano-etching in oxides, fluorides, metals and semiconductors by Humphreys (1990)10.1111/j.1365-2818.1986.tb02731.x
/ J. Microsc. / Cryoprotection in electron microscopy (1986){'key': '10.1016/j.micron.2004.02.003_BIB29', 'series-title': 'Physical Aspects of Electron Microscopy and Microbeam Analysis', 'article-title': 'Inelastic scattering and beam damage in biological molecules', 'author': 'Isaacson', 'year': '1975'}
/ Physical Aspects of Electron Microscopy and Microbeam Analysis / Inelastic scattering and beam damage in biological molecules by Isaacson (1975){'key': '10.1016/j.micron.2004.02.003_BIB30', 'series-title': 'Specimen damage in the electron microscope', 'volume': 'Vol. 7', 'author': 'Isaacson', 'year': '1977'}
/ Specimen damage in the electron microscope by Isaacson (1977)10.1017/S1431927699000094
/ Microsc. Microanal. / Plasma cleaning and its applications for electron microscopy by Isabell (1999)10.1016/0968-4328(96)00023-6
/ Micron / Low voltage scanning electron microscopy by Joy (1996)- Li, P., 2003. Electron irradiation damage to organic light-emitting materials. MSc thesis, University of Alberta, Canada.
{'key': '10.1016/j.micron.2004.02.003_BIB33', 'first-page': '31', 'article-title': 'Developments in Cs-corrected STEM', 'author': 'Lupini', 'year': '2001', 'journal-title': 'Inst. Phys. Conf. Ser. No. 168'}
/ Inst. Phys. Conf. Ser. No. 168 / Developments in Cs-corrected STEM by Lupini (2001)10.1016/0042-207X(91)90042-H
/ Vacuum / Electron-beram-induced reactions at transition metal oxide surfaces by McCartney (1991){'key': '10.1016/j.micron.2004.02.003_BIB35', 'series-title': 'The roles of sputtering and atomic displacement in electron irradiation induced mass loss', 'author': 'Medlin', 'year': '1991'}
/ The roles of sputtering and atomic displacement in electron irradiation induced mass loss by Medlin (1991)10.1016/0032-3861(93)90321-Z
/ Polymer / Parallel electron energy-loss spectroscopy and X-ray photoelectron spectroscopy of poly (ether ether ketone) by Payne (1993){'key': '10.1016/j.micron.2004.02.003_BIB37', 'series-title': 'Physical Aspects of Electron Microscopy and Microbeam Analysis', 'article-title': 'Review of the radiation damage problem or organic specimens in electron microscopy', 'author': 'Reimer', 'year': '1975'}
/ Physical Aspects of Electron Microscopy and Microbeam Analysis / Review of the radiation damage problem or organic specimens in electron microscopy by Reimer (1975){'key': '10.1016/j.micron.2004.02.003_BIB38', 'series-title': 'Transmission Electron Microscopy', 'author': 'Reimer', 'year': '1989'}
/ Transmission Electron Microscopy by Reimer (1989){'key': '10.1016/j.micron.2004.02.003_BIB39', 'series-title': 'Scanning Electron Microscopy', 'author': 'Reimer', 'year': '1998'}
/ Scanning Electron Microscopy by Reimer (1998){'key': '10.1016/j.micron.2004.02.003_BIB40', 'first-page': '14', 'article-title': 'Charging of bulk specimens, insulating layers and free-supporting films in scanning electron microscopy', 'volume': '92', 'author': 'Reimer', 'year': '1992', 'journal-title': 'Optik'}
/ Optik / Charging of bulk specimens, insulating layers and free-supporting films in scanning electron microscopy by Reimer (1992)10.1080/14786439808206550
/ Phil. Mag. / Reduction in electron irradiation damage to organic compounds by conducting coatings by Salih (1974)10.1063/1.95115
/ Appl. Phys. Lett. / Nanometer scale electron beam lithography in inorganic materials by Salisbury (1984)10.1002/sia.740010103
/ Surface and Interface Analysis / Quantitative electron spectroscopy of surfaces: a standard data base for electron inelastic mean free paths in solids by Seah (1979)10.1080/01418610008212095
/ Phil. Mag. A / The influence of fast secondary electrons on the aromatic structure of polystyrene by Siangchaew (2000)10.1016/S0968-4328(97)00008-5
/ Micron / STEM and shadow-imaging of biomolecules at 6eV beam energy by Spence (1997)10.1017/S1431927602000636
/ Microscopy and Microanalysis / Transmission electron diffraction at 200eV and damage thresholds below the carbon K edge by Stevens (2000)10.1016/0304-3991(88)90019-8
/ Ultramicroscopy / Encapsulation, diffusion and DIET in the electron microscope by Strane (1988)10.1016/0304-3991(85)90135-4
/ Ultramicroscopy / Light-element analysis with electrons and X-rays in a high-resolution STEM by Thomas (1985)10.1016/S0304-3991(97)00019-3
/ Ultramicroscopy / Towards sun-nanometer scale EELS analysis of polymers in the TEM by Varlot (1997){'key': '10.1016/j.micron.2004.02.003_BIB50', 'series-title': 'Contamination in the STEM at ultra high vacuum', 'author': 'Wall', 'year': '1980'}
/ Contamination in the STEM at ultra high vacuum by Wall (1980)
@article{Egerton_2004, title={Radiation damage in the TEM and SEM}, volume={35}, ISSN={0968-4328}, url={http://dx.doi.org/10.1016/j.micron.2004.02.003}, DOI={10.1016/j.micron.2004.02.003}, number={6}, journal={Micron}, publisher={Elsevier BV}, author={Egerton, R.F. and Li, P. and Malac, M.}, year={2004}, month=aug, pages={399–409} }