DOI: 10.1016/j.micron.2004.01.007. How to optimize the experimental design of quantitative atomic resolution TEM experiments?

How to optimize the experimental design of quantitative atomic resolution TEM experiments?

10.1016/j.micron.2004.01.007

Crossref journal-article

Elsevier BV

Micron (78)

Bibliography

Van Aert, S., den Dekker, A. J., & Van Dyck, D. (2004). How to optimize the experimental design of quantitative atomic resolution TEM experiments? Micron, 35(6), 425â429.

Authors 3

S. Van Aert (first)
A.J. den Dekker (additional)
D. Van Dyck (additional)

References 27 Referenced 23

10.1016/S0304-3991(99)00026-1 / Ultramicroscopy / Advanced spatially resolved EELS in the STEM by Batson (1999)
10.1046/j.1365-2818.1999.00473.x / Journal of Microscopy / How to optimize the design of a quantitative HREM experiment so as to attain the highest precision by den Dekker (1999)
10.1016/S0304-3991(01)00089-4 / Ultramicroscopy / Does a monochromator improve the precision in quantitative HRTEM? by den Dekker (2001)
{'key': '10.1016/j.micron.2004.01.007_BIB4', 'series-title': 'Theory of Optimal Experiments', 'author': 'Fedorov', 'year': '1972'} / Theory of Optimal Experiments by Fedorov (1972)
10.1038/33823 / Nature / Electron microscopy image enhanced by Haider (1998)
10.1016/0304-3991(96)00020-4 / Ultramicroscopy / Conditions and reasons for incoherent imaging in STEM by Hartel (1996)
10.1017/S003358350000305X / Quarterly Reviews of Biophysics / The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules by Henderson (1995)
10.1016/0304-3991(83)90008-6 / Ultramicroscopy / Real space image simulation in high resolution electron microscopy by Kilaas (1983)
10.1016/S0921-4526(01)00896-1 / Physica B / Benefits of microscopy with super resolution by Kisielowski (2001)
{'key': '10.1016/j.micron.2004.01.007_BIB10', 'first-page': '29', 'article-title': 'Aberration correction in the STEM', 'volume': 'vol. 3', 'author': 'Krivanek', 'year': '2002'} / Aberration correction in the STEM by Krivanek (2002)
10.1016/S0168-9002(98)01511-3 / Nuclear Instruments and Methods in Physics Research A / Optics and design of the fringe field monochromator for a Schottky field emission gun by Mook (1999)
10.1016/S0304-3991(99)00029-7 / Ultramicroscopy / Why changes in bond lengths and cohesion lead to core-level shifts in metals, and consequences for the spatial difference method by Muller (1999)
{'key': '10.1016/j.micron.2004.01.007_BIB13', 'series-title': 'Nanostructured Materials and Nanotechnology: Concise Edition', 'author': 'Nalwa', 'year': '2002'} / Nanostructured Materials and Nanotechnology: Concise Edition by Nalwa (2002)
10.1126/science.288.5468.993 / Science / Designing a new material world by Olson (2000)
{'key': '10.1016/j.micron.2004.01.007_BIB15', 'series-title': 'Foundations of Optimum Experimental Design', 'author': 'Pázman', 'year': '1986'} / Foundations of Optimum Experimental Design by Pázman (1986)
10.1016/0304-3991(91)90004-P / Ultramicroscopy / High-resolution Z-contrast imaging of crystals by Pennycook (1991)
{'key': '10.1016/j.micron.2004.01.007_BIB17', 'first-page': '231', 'article-title': 'Z-contrast imaging in the scanning transmission electron microscope', 'volume': '1', 'author': 'Pennycook', 'year': '1995', 'journal-title': 'Journal of the Microscopy Society of America'} / Journal of the Microscopy Society of America / Z-contrast imaging in the scanning transmission electron microscope by Pennycook (1995)
{'key': '10.1016/j.micron.2004.01.007_BIB18', 'first-page': '19', 'article-title': 'Outline of a spherically corrected semiaplanatic medium-voltage transmission electron microscope', 'volume': '85', 'author': 'Rose', 'year': '1990', 'journal-title': 'Optik'} / Optik / Outline of a spherically corrected semiaplanatic medium-voltage transmission electron microscope by Rose (1990)
10.1063/1.1698233 / Journal of Applied Physics / The theoretical resolution limit of the electron microscope by Scherzer (1949)
{'key': '10.1016/j.micron.2004.01.007_BIB20', 'series-title': 'Methods of Electronic-Structure Calculations: From Molecules to Solids', 'author': 'Springborg', 'year': '2000'} / Methods of Electronic-Structure Calculations: From Molecules to Solids by Springborg (2000)
10.1016/0304-3991(87)90080-5 / Ultramicroscopy / EMS—a software package for electron diffraction analysis and HREM image simulation in materials science by Stadelmann (1987)
10.1080/13642810110079674 / Philosophical Magazine B / Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? by Van Aert (2001)
10.1016/S0304-3991(01)00152-8 / Ultramicroscopy / Optimal experimental design of STEM measurement of atom column positions by Van Aert (2002)
10.1109/TIM.2002.802250 / IEEE Transactions on Instrumentation and Measurement / High-resolution electron microscopy: from imaging toward measuring by Van Aert (2002)
10.1016/S1047-8477(02)00016-3 / Journal of Structural Biology / High-resolution electron microscopy and electron tomography: resolution versus precision by Van Aert (2002)
Van Aert, S., 2003. Statistical experimental design for quantitative atomic resolution transmission electron microscopy. PhD Thesis Delft University of Technology. Delft: Ponsen and Looijen b.v. (10.1016/S1076-5670(04)30001-7)
10.1016/S1076-5670(01)80114-2 / Advances in Imaging and Electron Physics / Resolution reconsidered—conventional approaches and an alternative by van den Bos (2001)

Dates

Type	When
Created	21 years, 5 months ago (March 6, 2004, 6:42 a.m.)
Deposited	5 years, 5 months ago (March 31, 2020, 9:39 a.m.)
Indexed	1 week, 1 day ago (Aug. 23, 2025, 9:40 p.m.)
Issued	21 years, 1 month ago (Aug. 1, 2004)
Published	21 years, 1 month ago (Aug. 1, 2004)
Published Print	21 years, 1 month ago (Aug. 1, 2004)

Funders 0

None

BibTeX

@article{Van_Aert_2004, title={How to optimize the experimental design of quantitative atomic resolution TEM experiments?}, volume={35}, ISSN={0968-4328}, url={http://dx.doi.org/10.1016/j.micron.2004.01.007}, DOI={10.1016/j.micron.2004.01.007}, number={6}, journal={Micron}, publisher={Elsevier BV}, author={Van Aert, S. and den Dekker, A.J. and Van Dyck, D.}, year={2004}, month=aug, pages={425–429} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        8,
        24
      ]
    ],
    "date-time": "2025-08-24T01:40:23Z",
    "timestamp": 1755999623546
  },
  "reference-count": 27,
  "publisher": "Elsevier BV",
  "issue": "6",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2004,
            8,
            1
          ]
        ],
        "date-time": "2004-08-01T00:00:00Z",
        "timestamp": 1091318400000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2004,
        8
      ]
    ]
  },
  "DOI": "10.1016/j.micron.2004.01.007",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2004,
        3,
        6
      ]
    ],
    "date-time": "2004-03-06T11:42:33Z",
    "timestamp": 1078573353000
  },
  "page": "425-429",
  "source": "Crossref",
  "is-referenced-by-count": 23,
  "title": "How to optimize the experimental design of quantitative atomic resolution TEM experiments?",
  "prefix": "10.1016",
  "volume": "35",
  "author": [
    {
      "given": "S.",
      "family": "Van Aert",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "A.J.",
      "family": "den Dekker",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "D.",
      "family": "Van Dyck",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/j.micron.2004.01.007_BIB1",
      "doi-asserted-by": "crossref",
      "first-page": "33",
      "DOI": "10.1016/S0304-3991(99)00026-1",
      "article-title": "Advanced spatially resolved EELS in the STEM",
      "volume": "78",
      "author": "Batson",
      "year": "1999",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB2",
      "doi-asserted-by": "crossref",
      "first-page": "95",
      "DOI": "10.1046/j.1365-2818.1999.00473.x",
      "article-title": "How to optimize the design of a quantitative HREM experiment so as to attain the highest precision",
      "volume": "194",
      "author": "den Dekker",
      "year": "1999",
      "journal-title": "Journal of Microscopy"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB3",
      "doi-asserted-by": "crossref",
      "first-page": "275",
      "DOI": "10.1016/S0304-3991(01)00089-4",
      "article-title": "Does a monochromator improve the precision in quantitative HRTEM?",
      "volume": "89",
      "author": "den Dekker",
      "year": "2001",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB4",
      "series-title": "Theory of Optimal Experiments",
      "author": "Fedorov",
      "year": "1972"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB5",
      "doi-asserted-by": "crossref",
      "first-page": "768",
      "DOI": "10.1038/33823",
      "article-title": "Electron microscopy image enhanced",
      "volume": "392",
      "author": "Haider",
      "year": "1998",
      "journal-title": "Nature"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB6",
      "doi-asserted-by": "crossref",
      "first-page": "93",
      "DOI": "10.1016/0304-3991(96)00020-4",
      "article-title": "Conditions and reasons for incoherent imaging in STEM",
      "volume": "63",
      "author": "Hartel",
      "year": "1996",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB7",
      "doi-asserted-by": "crossref",
      "first-page": "171",
      "DOI": "10.1017/S003358350000305X",
      "article-title": "The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules",
      "volume": "28",
      "author": "Henderson",
      "year": "1995",
      "journal-title": "Quarterly Reviews of Biophysics"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB8",
      "doi-asserted-by": "crossref",
      "first-page": "289",
      "DOI": "10.1016/0304-3991(83)90008-6",
      "article-title": "Real space image simulation in high resolution electron microscopy",
      "volume": "11",
      "author": "Kilaas",
      "year": "1983",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB9",
      "doi-asserted-by": "crossref",
      "first-page": "1090",
      "DOI": "10.1016/S0921-4526(01)00896-1",
      "article-title": "Benefits of microscopy with super resolution",
      "volume": "308\u2013310",
      "author": "Kisielowski",
      "year": "2001",
      "journal-title": "Physica B"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB10",
      "first-page": "29",
      "article-title": "Aberration correction in the STEM",
      "volume": "vol. 3",
      "author": "Krivanek",
      "year": "2002"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB11",
      "doi-asserted-by": "crossref",
      "first-page": "109",
      "DOI": "10.1016/S0168-9002(98)01511-3",
      "article-title": "Optics and design of the fringe field monochromator for a Schottky field emission gun",
      "volume": "427",
      "author": "Mook",
      "year": "1999",
      "journal-title": "Nuclear Instruments and Methods in Physics Research A"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB12",
      "doi-asserted-by": "crossref",
      "first-page": "163",
      "DOI": "10.1016/S0304-3991(99)00029-7",
      "article-title": "Why changes in bond lengths and cohesion lead to core-level shifts in metals, and consequences for the spatial difference method",
      "volume": "78",
      "author": "Muller",
      "year": "1999",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB13",
      "series-title": "Nanostructured Materials and Nanotechnology: Concise Edition",
      "author": "Nalwa",
      "year": "2002"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB14",
      "doi-asserted-by": "crossref",
      "first-page": "993",
      "DOI": "10.1126/science.288.5468.993",
      "article-title": "Designing a new material world",
      "volume": "288",
      "author": "Olson",
      "year": "2000",
      "journal-title": "Science"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB15",
      "series-title": "Foundations of Optimum Experimental Design",
      "author": "P\u00e1zman",
      "year": "1986"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB16",
      "doi-asserted-by": "crossref",
      "first-page": "14",
      "DOI": "10.1016/0304-3991(91)90004-P",
      "article-title": "High-resolution Z-contrast imaging of crystals",
      "volume": "37",
      "author": "Pennycook",
      "year": "1991",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB17",
      "first-page": "231",
      "article-title": "Z-contrast imaging in the scanning transmission electron microscope",
      "volume": "1",
      "author": "Pennycook",
      "year": "1995",
      "journal-title": "Journal of the Microscopy Society of America"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB18",
      "first-page": "19",
      "article-title": "Outline of a spherically corrected semiaplanatic medium-voltage transmission electron microscope",
      "volume": "85",
      "author": "Rose",
      "year": "1990",
      "journal-title": "Optik"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB19",
      "doi-asserted-by": "crossref",
      "first-page": "20",
      "DOI": "10.1063/1.1698233",
      "article-title": "The theoretical resolution limit of the electron microscope",
      "volume": "20",
      "author": "Scherzer",
      "year": "1949",
      "journal-title": "Journal of Applied Physics"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB20",
      "series-title": "Methods of Electronic-Structure Calculations: From Molecules to Solids",
      "author": "Springborg",
      "year": "2000"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB21",
      "doi-asserted-by": "crossref",
      "first-page": "131",
      "DOI": "10.1016/0304-3991(87)90080-5",
      "article-title": "EMS\u2014a software package for electron diffraction analysis and HREM image simulation in materials science",
      "volume": "21",
      "author": "Stadelmann",
      "year": "1987",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB22",
      "doi-asserted-by": "crossref",
      "first-page": "1833",
      "DOI": "10.1080/13642810110079674",
      "article-title": "Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns?",
      "volume": "81",
      "author": "Van Aert",
      "year": "2001",
      "journal-title": "Philosophical Magazine B"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB23",
      "doi-asserted-by": "crossref",
      "first-page": "273",
      "DOI": "10.1016/S0304-3991(01)00152-8",
      "article-title": "Optimal experimental design of STEM measurement of atom column positions",
      "volume": "90",
      "author": "Van Aert",
      "year": "2002",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB24",
      "doi-asserted-by": "crossref",
      "first-page": "611",
      "DOI": "10.1109/TIM.2002.802250",
      "article-title": "High-resolution electron microscopy: from imaging toward measuring",
      "volume": "51",
      "author": "Van Aert",
      "year": "2002",
      "journal-title": "IEEE Transactions on Instrumentation and Measurement"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB25",
      "doi-asserted-by": "crossref",
      "first-page": "21",
      "DOI": "10.1016/S1047-8477(02)00016-3",
      "article-title": "High-resolution electron microscopy and electron tomography: resolution versus precision",
      "volume": "138",
      "author": "Van Aert",
      "year": "2002",
      "journal-title": "Journal of Structural Biology"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB26",
      "doi-asserted-by": "crossref",
      "unstructured": "Van Aert, S., 2003. Statistical experimental design for quantitative atomic resolution transmission electron microscopy. PhD Thesis Delft University of Technology. Delft: Ponsen and Looijen b.v.",
      "DOI": "10.1016/S1076-5670(04)30001-7"
    },
    {
      "key": "10.1016/j.micron.2004.01.007_BIB27",
      "doi-asserted-by": "crossref",
      "first-page": "241",
      "DOI": "10.1016/S1076-5670(01)80114-2",
      "article-title": "Resolution reconsidered\u2014conventional approaches and an alternative",
      "volume": "117",
      "author": "van den Bos",
      "year": "2001",
      "journal-title": "Advances in Imaging and Electron Physics"
    }
  ],
  "container-title": "Micron",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S096843280400040X?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S096843280400040X?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2020,
        3,
        31
      ]
    ],
    "date-time": "2020-03-31T13:39:56Z",
    "timestamp": 1585661996000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S096843280400040X"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2004,
        8
      ]
    ]
  },
  "references-count": 27,
  "journal-issue": {
    "issue": "6",
    "published-print": {
      "date-parts": [
        [
          2004,
          8
        ]
      ]
    }
  },
  "alternative-id": [
    "S096843280400040X"
  ],
  "URL": "http://dx.doi.org/10.1016/j.micron.2004.01.007",
  "relation": {},
  "ISSN": [
    "0968-4328"
  ],
  "subject": [],
  "container-title-short": "Micron",
  "published": {
    "date-parts": [
      [
        2004,
        8
      ]
    ]
  }
}