DOI: 10.1016/j.mee.2009.03.069. Improved GeOI substrates for pMOSFET off-state leakage control

Improved GeOI substrates for pMOSFET off-state leakage control

10.1016/j.mee.2009.03.069

Crossref journal-article

Elsevier BV

Microelectronic Engineering (78)

Bibliography

Romanjek, K., Augendre, E., Van Den Daele, W., Grandchamp, B., Sanchez, L., Le Royer, C., Hartmann, J.-M., Ghyselen, B., Guiot, E., Bourdelle, K., Cristoloveanu, S., Boulanger, F., & Clavelier, L. (2009). Improved GeOI substrates for pMOSFET off-state leakage control. Microelectronic Engineering, 86(7â9), 1585â1588.

Authors 13

K. Romanjek (first)
E. Augendre (additional)
W. Van Den Daele (additional)
B. Grandchamp (additional)
L. Sanchez (additional)
C. Le Royer (additional)
J.-M. Hartmann (additional)
B. Ghyselen (additional)
E. Guiot (additional)
K. Bourdelle (additional)
S. Cristoloveanu (additional)
F. Boulanger (additional)
L. Clavelier (additional)

References 12 Referenced 23

T. Yamamoto, Y. Yamashita, M. Harada, N. Taoka, K. Ikeda, K. Suzuki, O. Kiso, N. Sugiyama, S. Takagi, in: IEEE International Electron Devices Meeting Technical Digest, 2007, pp. 1041–1044. (10.1109/IEDM.2007.4419098)
K. Romanjek, L. Hutin, C. Le Royer, A. Pouydebasque, M.-A. Jaud, C. Tabone, E. Augendre, L. Sanchez, J.-M. Hartmann, H. Grampeix, V. Mazzocchi, S. Soliveres, R. Truche, L. Clavelier, P. Scheiblin, X. Garros, G. Reimbold, M. Vinet, F. Boulanger, S. Deleonibus, in: Proceedings of European Solid-State Device Research Conference, 2008, pp. 75–78. (10.1109/ESSDERC.2008.4681702)
J. Mitard, B. De Jaeger, F.E. Leys, G. Hellings, K. Martens, G. Eneman, D.P. Brunco, R. Loo, J.C. Lin, D. Shamiryan, T. Vandeweyer, G. Winderickx, E. Vrancken, C.H. Yu, K. De Meyer, M. Caymax, L. Pantisano, M. Meuris, M.M. Heyns, in: IEEE International Electron Devices Meeting Technical Digest, 2008, pp. 873–876.
{'key': '10.1016/j.mee.2009.03.069_bib4', 'first-page': '78', 'volume': '6', 'author': 'Deguet', 'year': '2005', 'journal-title': 'ECS Proceedings'} / ECS Proceedings by Deguet (2005)
10.1016/j.jcrysgro.2004.10.042 / Journal of Crystal Growth by Hartmann (2005)
10.1149/1.2986815 / ECS Transactions by Hartmann (2008)
10.1109/55.57923 / IEEE Electron Device Letters by Groeseneken (1990)
W. Van Den Daele, E. Augendre, K. Romanjek, S. Cristoloveanu, C. Le Royer, L. Clavelier, J.-F. Damlencourt, E. Guiot, B. Ghyselen, in: SOI Symposium, ECS Spring Meeting, 2009.
C.G. Van de Walle, in: IEEE International Electron Devices Meeting Technical Digest, 2005, pp. 401–404.
10.1063/1.3068497 / Applied Physics Letters by Tsipas (2009)
10.1109/LED.2007.903405 / IEEE Electron Device Letters by Nicholas (2007)
10.1016/j.mssp.2006.08.034 / Materials Science in Semiconductor Processing by Leys (2006)

Dates

Type	When
Created	16 years, 5 months ago (March 17, 2009, 5:24 a.m.)
Deposited	6 months, 2 weeks ago (Feb. 8, 2025, 8:02 a.m.)
Indexed	6 months, 2 weeks ago (Feb. 8, 2025, 8:40 a.m.)
Issued	16 years, 1 month ago (July 1, 2009)
Published	16 years, 1 month ago (July 1, 2009)
Published Print	16 years, 1 month ago (July 1, 2009)

Funders 0

None

BibTeX

@article{Romanjek_2009, title={Improved GeOI substrates for pMOSFET off-state leakage control}, volume={86}, ISSN={0167-9317}, url={http://dx.doi.org/10.1016/j.mee.2009.03.069}, DOI={10.1016/j.mee.2009.03.069}, number={7–9}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Romanjek, K. and Augendre, E. and Van Den Daele, W. and Grandchamp, B. and Sanchez, L. and Le Royer, C. and Hartmann, J.-M. and Ghyselen, B. and Guiot, E. and Bourdelle, K. and Cristoloveanu, S. and Boulanger, F. and Clavelier, L.}, year={2009}, month=jul, pages={1585–1588} }

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