Crossref journal-article
Elsevier BV
Microelectronic Engineering (78)
Bibliography

Raoux, S., Shelby, R. M., Jordan-Sweet, J., Munoz, B., Salinga, M., Chen, Y.-C., Shih, Y.-H., Lai, E.-K., & Lee, M.-H. (2008). Phase change materials and their application to random access memory technology. Microelectronic Engineering, 85(12), 2330–2333.

Authors 9
  1. Simone Raoux (first)
  2. Robert M. Shelby (additional)
  3. Jean Jordan-Sweet (additional)
  4. Becky Munoz (additional)
  5. Martin Salinga (additional)
  6. Yi-Chou Chen (additional)
  7. Yen-Hao Shih (additional)
  8. Erh-Kun Lai (additional)
  9. Ming-Hsiu Lee (additional)
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Dates
Type When
Created 16 years, 11 months ago (Sept. 1, 2008, 5:27 a.m.)
Deposited 6 years, 3 months ago (May 13, 2019, 3:03 p.m.)
Indexed 1 month ago (July 16, 2025, 8:36 a.m.)
Issued 16 years, 8 months ago (Dec. 1, 2008)
Published 16 years, 8 months ago (Dec. 1, 2008)
Published Print 16 years, 8 months ago (Dec. 1, 2008)
Funders 0

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@article{Raoux_2008, title={Phase change materials and their application to random access memory technology}, volume={85}, ISSN={0167-9317}, url={http://dx.doi.org/10.1016/j.mee.2008.08.004}, DOI={10.1016/j.mee.2008.08.004}, number={12}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Raoux, Simone and Shelby, Robert M. and Jordan-Sweet, Jean and Munoz, Becky and Salinga, Martin and Chen, Yi-Chou and Shih, Yen-Hao and Lai, Erh-Kun and Lee, Ming-Hsiu}, year={2008}, month=dec, pages={2330–2333} }