DOI: 10.1016/j.matlet.2009.03.021. Dielectric strength and reliability of ferroelectric PLZT films deposited on nickel substrates

Dielectric strength and reliability of ferroelectric PLZT films deposited on nickel substrates

10.1016/j.matlet.2009.03.021

Crossref journal-article

Elsevier BV

Materials Letters (78)

Bibliography

Ma, B., Narayanan, M., & Balachandran, U. (Balu). (2009). Dielectric strength and reliability of ferroelectric PLZT films deposited on nickel substrates. Materials Letters, 63(15), 1353â1356.

Authors 3

Beihai Ma (first)
Manoj Narayanan (additional)
U. (Balu) Balachandran (additional)

References 12 Referenced 49

10.1063/1.122334 / Appl Phys Lett by Zhu (1998)
10.1007/s10832-005-0866-6 / J. Electroceramics by Ihlefeld (2005)
10.1038/nmat1334 / Nat. Mater. by Kingon (2005)
10.1063/1.1350425 / Appl Phys Lett by Zou (2001)
Ma B, Kwon DK, Narayanan M, Balachandran U. J Electroceramics, in press (DOI 10.1007/s10832-007-9410-1).
10.1016/j.tsf.2006.05.001 / Thin Solid Films by Chen (2006)
10.1016/j.matlet.2008.03.060 / Mater Lett by Ma (2008)
10.1109/33.16665 / IEEE Trans Components Hybrids Manuf Technol by Munikoti (1988)
{'key': '10.1016/j.matlet.2009.03.021_bib9', 'first-page': '85', 'volume': '23', 'author': 'Polcawich', 'year': '2000', 'journal-title': 'Intl. J. Microcircuits Electronic Packaging'} / Intl. J. Microcircuits Electronic Packaging by Polcawich (2000)
10.1115/1.4010337 / J Appl Mech by Weibull (1951)
10.1088/0022-3727/23/12/015 / J Phys D: Appl Phys by Dissado (1990)
D.J. Smith, Reliability, maintainability and risk: practical methods for engineers, Butterworth-Heineman, Boston (2001).

Dates

Type	When
Created	16 years, 5 months ago (March 21, 2009, 4:50 a.m.)
Deposited	3 years, 10 months ago (Oct. 3, 2021, 9:32 a.m.)
Indexed	1 year, 5 months ago (March 6, 2024, 5:54 a.m.)
Issued	16 years, 2 months ago (June 1, 2009)
Published	16 years, 2 months ago (June 1, 2009)
Published Print	16 years, 2 months ago (June 1, 2009)

Funders 0

None

BibTeX

@article{Ma_2009, title={Dielectric strength and reliability of ferroelectric PLZT films deposited on nickel substrates}, volume={63}, ISSN={0167-577X}, url={http://dx.doi.org/10.1016/j.matlet.2009.03.021}, DOI={10.1016/j.matlet.2009.03.021}, number={15}, journal={Materials Letters}, publisher={Elsevier BV}, author={Ma, Beihai and Narayanan, Manoj and Balachandran, U. (Balu)}, year={2009}, month=jun, pages={1353–1356} }

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