DOI: 10.1016/j.matchar.2006.02.002. Extending electrical resistivity measurements in micro-scratching of silicon to determine thermal conductivity of the metallic phase Si-II

Extending electrical resistivity measurements in micro-scratching of silicon to determine thermal conductivity of the metallic phase Si-II

10.1016/j.matchar.2006.02.002

Crossref journal-article

Elsevier BV

Materials Characterization (78)

Bibliography

Abdel-Aal, H. A., Reyes, Y., Patten, J. A., & Dong, L. (2006). Extending electrical resistivity measurements in micro-scratching of silicon to determine thermal conductivity of the metallic phase Si-II. Materials Characterization, 57(4â5), 281â289.

Authors 4

Hisham A. Abdel-Aal (first)
Ysai Reyes (additional)
John A. Patten (additional)
Lei Dong (additional)

References 23 Referenced 5

{'key': '10.1016/j.matchar.2006.02.002_bib1', 'series-title': 'Silicon based materials and devices', 'year': '2001'} / Silicon based materials and devices (2001)
10.1111/j.1151-2916.1990.tb05142.x / J Am Ceram Soc by Blake (1990)
{'key': '10.1016/j.matchar.2006.02.002_bib3', 'series-title': 'Surface phases on silicon: preparation, structures, and properties', 'author': 'Lifshits', 'year': '1994'} / Surface phases on silicon: preparation, structures, and properties by Lifshits (1994)
{'key': '10.1016/j.matchar.2006.02.002_bib4', 'first-page': '195', 'volume': 'vol. 2', 'author': 'Domnich', 'year': '2001'} by Domnich (2001)
10.1063/1.3253148 / J Phys Chem Ref Data by Cannon (1974)
{'key': '10.1016/j.matchar.2006.02.002_bib6', 'series-title': 'Properties of crystalline silicon', 'first-page': '104', 'author': 'George', 'year': '1999'} / Properties of crystalline silicon by George (1999)
10.1016/0022-3697(62)90085-9 / J Phys Chem Solids by Minomura (1962)
10.1126/science.139.3556.762 / Science by Jamieson (1963)
10.1103/PhysRevB.34.4679 / Phys Rev B by Hu (1986)
10.1126/science.139.3552.338.b / Science by Wentorf (1963)
10.1107/S0365110X64001840 / Acta Crystallogr by Kasper (1964)
10.1002/pssa.2210140139 / Phys Stat Sol (a) by Eremenko (1972)
10.1103/PhysRevB.8.3799 / Phys Rev B by Kobliska (1973)
10.1088/0268-1242/16/5/311 / Semicond Sci Technol by Gogotsi (2001)
{'key': '10.1016/j.matchar.2006.02.002_bib15', 'series-title': 'Proceedings of the R.S.N.S.W', 'author': 'Jaeger', 'year': '1942'} / Proceedings of the R.S.N.S.W by Jaeger (1942)
10.1109/84.825788 / IEEE J MEMS / Process-dependent thin film thermal conductivities for thermal CMOS MEMS by Von Arx (2000)
{'key': '10.1016/j.matchar.2006.02.002_bib17', 'first-page': '395', 'article-title': 'Microsensor for in situ thermal conductivity measurements of thin films', 'volume': '7', 'author': 'Völklein', 'year': '1995', 'journal-title': 'Sens Mater'} / Sens Mater / Microsensor for in situ thermal conductivity measurements of thin films by Völklein (1995)
10.1016/S0927-0256(02)00396-8 / Comput Mater Sci / The influence of thermal conductivity on segmented chip formation by Bäker (2003)
10.1016/j.wear.2005.02.074 / Wear / On the thermal aspects of ductile regime microscratching of single crystal silicon for NEMS/MEMS applications by Abdel-Aal (2005)
10.1016/S0301-679X(02)00031-2 / Trib Intern by Abdel-Aal (2002)
{'issue': '11–12', 'key': '10.1016/j.matchar.2006.02.002_bib21', 'first-page': '336', 'volume': '253', 'author': 'Abdel-Aal', 'year': '2003', 'journal-title': 'Wear'} / Wear by Abdel-Aal (2003)
10.1002/(SICI)1521-3951(199901)211:1<379::AID-PSSB379>3.0.CO;2-4 / Phys Status Solidi, B / Metallization of monocrystalline silicon under shock compression by Gilev (1999)
{'key': '10.1016/j.matchar.2006.02.002_bib23', 'first-page': '429', 'volume': '2', 'author': 'Bundy', 'year': '1970', 'journal-title': 'High Temp High Press'} / High Temp High Press by Bundy (1970)

Dates

Type	When
Created	19 years, 5 months ago (March 8, 2006, 7:21 a.m.)
Deposited	2 years, 6 months ago (Feb. 13, 2023, 10:11 a.m.)
Indexed	2 years, 5 months ago (March 6, 2023, 2:52 a.m.)
Issued	18 years, 9 months ago (Dec. 1, 2006)
Published	18 years, 9 months ago (Dec. 1, 2006)
Published Print	18 years, 9 months ago (Dec. 1, 2006)

Funders 0

None

BibTeX

@article{Abdel_Aal_2006, title={Extending electrical resistivity measurements in micro-scratching of silicon to determine thermal conductivity of the metallic phase Si-II}, volume={57}, ISSN={1044-5803}, url={http://dx.doi.org/10.1016/j.matchar.2006.02.002}, DOI={10.1016/j.matchar.2006.02.002}, number={4–5}, journal={Materials Characterization}, publisher={Elsevier BV}, author={Abdel-Aal, Hisham A. and Reyes, Ysai and Patten, John A. and Dong, Lei}, year={2006}, month=dec, pages={281–289} }

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