DOI: 10.1016/j.jmps.2007.01.011. Effects of interface dislocations on properties of ferroelectric thin films

Effects of interface dislocations on properties of ferroelectric thin films

10.1016/j.jmps.2007.01.011

Crossref journal-article

Elsevier BV

Journal of the Mechanics and Physics of Solids (78)

Bibliography

Zheng, Y., Wang, B., & Woo, C. H. (2007). Effects of interface dislocations on properties of ferroelectric thin films. Journal of the Mechanics and Physics of Solids, 55(8), 1661â1676.

Authors 3

Yue Zheng (first)
Biao Wang (additional)
C.H. Woo (additional)

References 40 Referenced 32

10.1103/PhysRevB.70.092103 / Phys. Rev. B / Defect-related lattice strain and the transition temperature in ferroelectric thin films by Balzar (2004)
10.1063/1.1524310 / J. Appl. Phys. / Optimization of the tenability of barium strontium titanate films via epitaxial stresses by Ban (2003)
10.1103/PhysRevB.66.184109 / Phys. Rev. B / Formation and rapid evolution of domain structure at phase transitions in slightly inhomogeneous ferroelectrics and ferroelastics by Bratkovksy (2002)
10.1063/1.1308531 / Appl. Phys. Lett. / Dielectric properties in heteroepitaxial Ba0.6Sr0.4TiO3 thin film: Effect of internal stresses and dislocation-type defects by Canedy (2000)
10.1103/PhysRevB.72.020102 / Phys. Rev. B by Catalan (2005)
10.1038/nmat1057 / Nat. Mater. / Impact of misfit dislocations on the polarization instability of epitaxial nanostructured ferroelectric perovskites by Chu (2004)
10.1126/science.1098252 / Science / Ferroelectricity in ultrathin perovskite films by Fong (2004)
10.1038/nature02773 / Nature (London) / Room-temperature ferroelectricity in strained SrTiO3 by Haeni (2004)
10.1063/1.339293 / J. Appl. Phys. / Thermodynamic theory of PbTiO3 by Haun (1987)
{'key': '10.1016/j.jmps.2007.01.011_bib10', 'series-title': 'Theory of Dislocation', 'author': 'Hirth', 'year': '1982'} / Theory of Dislocation by Hirth (1982)
10.1063/1.1590416 / J. Appl. Phys. / Effect of interfacial dislocations on ferroelectric phase stability and domain morphology in a thin film—a phase-field model by Hu (2003)
Hull, D., Bacon, D., 2001. Introduction to Dislocations, fourth ed. Butterworth-Heinemann, Oxford. (10.1016/B978-075064681-9/50003-1)
10.1063/1.2402238 / Appl. Phys. Lett. / Coercive fields in ultrathin BaTiO3 capacitors by Jo (2006)
10.1103/PhysRevB.20.1065 / Phys. Rev. B / Surface effects on phase transitions in ferroelectrics and dipolar magnets by Kretchmer (1979)
10.1063/1.1359141 / Appl. Phys. Lett. / Dependence of dielectric properties on internal stresses in epitaxial barum strontium thin film by Li (2001)
10.1063/1.1492025 / Appl. Phys. Lett. / Effect of electrical boundary conditions on ferroelectric domain structures in thin films by Li (2002)
10.1016/S1359-6454(01)00360-3 / Acta Mater. / Effect of substrate constraint on the stability and evolution of ferroelectric domain structures in thin films by Li (2002)
10.1063/1.1504488 / Appl. Phys. Lett. / Doping and thickness effects on dielectric properties and subswitching behavior of lead titanate thin films by Lakovlev (2002)
{'key': '10.1016/j.jmps.2007.01.011_bib19', 'series-title': 'Fatigue in Ferroelectric Ceramics and Related Issues', 'author': 'Lupascu', 'year': '2004'} / Fatigue in Ferroelectric Ceramics and Related Issues by Lupascu (2004)
{'key': '10.1016/j.jmps.2007.01.011_bib20', 'first-page': '118', 'article-title': 'Defects in epitaxial multilayers: I. Misfit dislocations', 'volume': '27', 'author': 'Matthews', 'year': '1974', 'journal-title': 'J. Cryst. Growth'} / J. Cryst. Growth / Defects in epitaxial multilayers: I. Misfit dislocations by Matthews (1974)
10.1063/1.1662770 / J. Appl. Phys. / Depolarization fields in thin ferroelectric films by Mehta (1973)
10.1007/BF02666659 / Metall. Trans. A / Mechanical properties of thin films by Nix (1989)
10.1103/PhysRevLett.80.1988 / Phys. Rev. Lett. / Effect of mechanical boundary conditions on phase diagrams of epitaxial ferroelectric thin films by Pertsev (1998)
10.1111/j.1551-2916.2005.00486.x / J. Am. Ceram. Soc. / Recent materials characterizations of [2D] and [3D] thin film ferroelectric structures by Scott (2005)
10.1063/1.1649460 / J. Appl. Phys / Pyroelectric response of ferroelectric thin film by Sharma (2004)
10.1063/1.1496144 / Appl. Phys. Lett. / Thickness-induced stabilization of ferroelectricity in SrRuO3/Ba0.5Sr0.5TiO3/Au thin film capacitors by Sinnamon (2002)
10.1103/PhysRevLett.89.067601 / Phys. Rev. Lett. / Observation of nanoscale 180° stripe domains in ferroelectric PbTiO3 thin films by Streiffer (2002)
10.1063/1.1728300 / Appl. Phys. Lett. / Evolution of dislocation arrays in epitaxial BaTiO3 thin films grown on (100) SrTiO3 by Sun (2004)
10.1080/01418619908214294 / Philo. Mag. A. / Analysis of misfit relaxation in heteroepitaxial BaTiO3 thin films by Suzuki (1999)
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10.1088/0953-8984/17/29/010 / J. Phys. Condens. Matter / Impact of layer defects in ferroelectric thin films by Wesselinawa (2005)
10.1080/14786437708236001 / Philos. Mag. / Atomistic breathing shell model calculations of dislocation core configurations in ionic crystals by Woo (1977)
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Dates

Type	When
Created	18 years, 6 months ago (Feb. 22, 2007, 4:27 a.m.)
Deposited	6 years, 4 months ago (April 24, 2019, 1:14 p.m.)
Indexed	3 months, 3 weeks ago (May 5, 2025, 6:04 a.m.)
Issued	18 years ago (Aug. 1, 2007)
Published	18 years ago (Aug. 1, 2007)
Published Print	18 years ago (Aug. 1, 2007)

Funders 0

None

BibTeX

@article{Zheng_2007, title={Effects of interface dislocations on properties of ferroelectric thin films}, volume={55}, ISSN={0022-5096}, url={http://dx.doi.org/10.1016/j.jmps.2007.01.011}, DOI={10.1016/j.jmps.2007.01.011}, number={8}, journal={Journal of the Mechanics and Physics of Solids}, publisher={Elsevier BV}, author={Zheng, Yue and Wang, Biao and Woo, C.H.}, year={2007}, month=aug, pages={1661–1676} }

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