DOI: 10.1016/j.jmmm.2008.03.014. On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography

On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography

10.1016/j.jmmm.2008.03.014

Crossref journal-article

Elsevier BV

Journal of Magnetism and Magnetic Materials (78)

Bibliography

Zheng, R. K., Moody, M. P., Gault, B., Liu, Z. W., Liu, H., & Ringer, S. P. (2009). On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography. Journal of Magnetism and Magnetic Materials, 321(8), 935â943.

Authors 6

R.K. Zheng (first)
M.P. Moody (additional)
B. Gault (additional)
Z.W. Liu (additional)
Hui Liu (additional)
S.P. Ringer (additional)

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Dates

Type	When
Created	17 years, 5 months ago (March 10, 2008, 12:38 p.m.)
Deposited	6 years, 3 months ago (May 8, 2019, 2:31 p.m.)
Indexed	2 years ago (Aug. 1, 2023, 7:14 p.m.)
Issued	16 years, 4 months ago (April 1, 2009)
Published	16 years, 4 months ago (April 1, 2009)
Published Print	16 years, 4 months ago (April 1, 2009)

Funders 0

None

BibTeX

@article{Zheng_2009, title={On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography}, volume={321}, ISSN={0304-8853}, url={http://dx.doi.org/10.1016/j.jmmm.2008.03.014}, DOI={10.1016/j.jmmm.2008.03.014}, number={8}, journal={Journal of Magnetism and Magnetic Materials}, publisher={Elsevier BV}, author={Zheng, R.K. and Moody, M.P. and Gault, B. and Liu, Z.W. and Liu, Hui and Ringer, S.P.}, year={2009}, month=apr, pages={935–943} }

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