DOI: 10.1016/j.enganabound.2007.12.003. Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method

Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method

10.1016/j.enganabound.2007.12.003

Crossref journal-article

Elsevier BV

Engineering Analysis with Boundary Elements (78)

Bibliography

Shen, Y., Barnett, D. M., & Pinsky, P. M. (2008). Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method. Engineering Analysis with Boundary Elements, 32(8), 682â691.

Authors 3

Y. Shen (first)
D.M. Barnett (additional)
P.M. Pinsky (additional)

References 36 Referenced 13

10.1103/PhysRevLett.56.930 / Phys Rev Lett / Atomic force microscope by Binnig (1986)
10.1063/1.100162 / Appl Phys Lett / Deposition and imaging of localized charge on insulator surfaces using a force microscope by Stern (1988)
10.1063/1.105227 / Appl Phys Lett / Kelvin probe force microscopy by Nonnenmacher (1991)
10.1063/1.102096 / Appl Phys Lett / Scanning capacitance microscopy on a 25nm scale by Williams (1989)
10.1088/0957-4484/12/4/321 / Nanotechnology / Electrostatic force microscopy: principles and some applications to semiconductors by Girard (2001)
10.1126/science.268.5208.267 / Science / Imaging the condensation and evaporation of molecularly thin films of water with nanometer resolution by Hu (1995)
10.1116/1.585188 / J Vac Sci Technol B / Electrostatic and contact forces in force microscopy by Hao (1991)
10.1103/PhysRevLett.63.2669 / Phys Rev Lett / Contact electrification using force microscopy by Terris (1989)
10.1063/1.112775 / Appl Phys Lett / Three-dimensional electrostatic potential, and potential-energy barrier, near a tip-base junction by Pan (1994)
10.1116/1.588494 / J Vac Sci Technol B / Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes by Hochwitz (1996)
10.1007/s100510050219 / Eur Phys J B / Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface by Hudlet (1998)
10.1103/PhysRevB.64.245403 / Phys Rev B / Resolution enhancement and improved data interpretation in electrostatic force microscopy by Colchero (2001)
10.1103/PhysRevB.59.2436 / Phys Rev B / Model of noncontact scanning force microscopy on ionic surfaces by Livshits (1999)
10.1088/0953-8984/13/10/303 / J Phys Condens Matter / Contrast formation in atomic resolution scanning force microscopy on CaF2(111): experiment and theory by Barth (2001)
10.1063/1.360951 / J Appl Phys / Image charge method for electrostatic calculations in field-emission diodes by Mesa (1996)
10.1063/1.363884 / J Appl Phys / Electrostatic forces acting on the tip in atomic force microscopy: modelization and comparison with analytic expressions by Belaidi (1997)
10.1063/1.126528 / Appl Phys Lett / Theory of electrostatic probe microscopy: a simple perturbative approach by Gómez-Moñivas (2000)
10.1063/1.1424478 / Appl Phys Lett / Electrostatic force between sharp tips and metallic and dielectric samples by Gómez-Moñivas (2001)
10.1063/1.2364862 / Appl Phys Lett / Quantitative theory for the imaging of conducting objects in electrostatic force microscopy by Sacha (2006)
10.1007/s003390051138 / Appl Phys A / Finite element simulations of the resolution in electrostatic force microscopy by Belaidi (1998)
10.1103/PhysRevB.57.9225 / Phys Rev B / Scanning-electrostatic-force microscopy: self-consistent method for mesoscopic surface structures by Li (1998)
10.1063/1.368181 / J Appl Phys / Resolution and contrast in Kelvin probe force microscopy by Jacobs (1998)
10.1063/1.1988089 / Rev Sci Instrum / Reconstruction of electrostatic force microscopy images by Strassburg (2005)
10.1063/1.338807 / J Appl Phys / Atomic force microscope—force mapping and profiling on a sub 100-Å scale by Martin (1987)
10.1088/0957-4484/6/1/001 / Nanotechnology / Calculation of thermal noise in atomic force microscopy by Butt (1995)
10.1016/S0039-6028(00)00378-2 / Surf Sci / Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation by Stark (2000)
10.1088/0957-4484/5/4/003 / Nanotechnology / Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever by Chen (1994)
10.1116/1.589163 / J Vac Sci Technol B / Driven nonlinear atomic force microscopy cantilevers: from noncontact to tapping modes of operation by Sarid (1996)
10.1016/S0304-3991(97)00002-8 / Ultramicroscopy / Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation by Anczykowski (1996)
10.1103/PhysRevB.54.8908 / Phys Rev B / Imaging material properties by resonant tapping-force microscopy: a model investigation by Winkler (1996)
10.1103/PhysRevB.60.4961 / Phys Rev B / Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy by García (1999)
10.1016/S0039-6028(99)00368-4 / Surf Sci / The role of damping in phase imaging in tapping mode atomic force microscopy by Wang (1999)
{'key': '10.1016/j.enganabound.2007.12.003_bib33', 'series-title': 'Classical electrodynamics', 'author': 'Jackson', 'year': '1998'} / Classical electrodynamics by Jackson (1998)
{'key': '10.1016/j.enganabound.2007.12.003_bib34', 'series-title': 'Static and dynamic electricity', 'author': 'Smythe', 'year': '1968'} / Static and dynamic electricity by Smythe (1968)
{'key': '10.1016/j.enganabound.2007.12.003_bib35', 'series-title': 'Programming the boundary element method: an introduction for engineers', 'author': 'Beer', 'year': '2001'} / Programming the boundary element method: an introduction for engineers by Beer (2001)
10.1111/j.1151-2916.1996.tb08569.x / J Am Ceram Soc / Solute segregation and grain-boundary impedance in high-purity stabilized zirconia by Aoki (1996)

Dates

Type	When
Created	17 years, 6 months ago (Feb. 6, 2008, 4:13 a.m.)
Deposited	6 years, 7 months ago (Dec. 31, 2018, 12:53 p.m.)
Indexed	1 year, 3 months ago (May 2, 2024, 4:19 a.m.)
Issued	17 years ago (Aug. 1, 2008)
Published	17 years ago (Aug. 1, 2008)
Published Print	17 years ago (Aug. 1, 2008)

Funders 0

None

BibTeX

@article{Shen_2008, title={Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method}, volume={32}, ISSN={0955-7997}, url={http://dx.doi.org/10.1016/j.enganabound.2007.12.003}, DOI={10.1016/j.enganabound.2007.12.003}, number={8}, journal={Engineering Analysis with Boundary Elements}, publisher={Elsevier BV}, author={Shen, Y. and Barnett, D.M. and Pinsky, P.M.}, year={2008}, month=aug, pages={682–691} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        5,
        2
      ]
    ],
    "date-time": "2024-05-02T08:19:35Z",
    "timestamp": 1714637975532
  },
  "reference-count": 36,
  "publisher": "Elsevier BV",
  "issue": "8",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2008,
            8,
            1
          ]
        ],
        "date-time": "2008-08-01T00:00:00Z",
        "timestamp": 1217548800000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2008,
        8
      ]
    ]
  },
  "DOI": "10.1016/j.enganabound.2007.12.003",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2008,
        2,
        6
      ]
    ],
    "date-time": "2008-02-06T09:13:05Z",
    "timestamp": 1202289185000
  },
  "page": "682-691",
  "source": "Crossref",
  "is-referenced-by-count": 13,
  "title": "Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method",
  "prefix": "10.1016",
  "volume": "32",
  "author": [
    {
      "given": "Y.",
      "family": "Shen",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "D.M.",
      "family": "Barnett",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "P.M.",
      "family": "Pinsky",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib1",
      "doi-asserted-by": "crossref",
      "first-page": "930",
      "DOI": "10.1103/PhysRevLett.56.930",
      "article-title": "Atomic force microscope",
      "volume": "56",
      "author": "Binnig",
      "year": "1986",
      "journal-title": "Phys Rev Lett"
    },
    {
      "issue": "26",
      "key": "10.1016/j.enganabound.2007.12.003_bib2",
      "doi-asserted-by": "crossref",
      "first-page": "2717",
      "DOI": "10.1063/1.100162",
      "article-title": "Deposition and imaging of localized charge on insulator surfaces using a force microscope",
      "volume": "53",
      "author": "Stern",
      "year": "1988",
      "journal-title": "Appl Phys Lett"
    },
    {
      "issue": "25",
      "key": "10.1016/j.enganabound.2007.12.003_bib3",
      "doi-asserted-by": "crossref",
      "first-page": "2921",
      "DOI": "10.1063/1.105227",
      "article-title": "Kelvin probe force microscopy",
      "volume": "58",
      "author": "Nonnenmacher",
      "year": "1991",
      "journal-title": "Appl Phys Lett"
    },
    {
      "issue": "2",
      "key": "10.1016/j.enganabound.2007.12.003_bib4",
      "doi-asserted-by": "crossref",
      "first-page": "203",
      "DOI": "10.1063/1.102096",
      "article-title": "Scanning capacitance microscopy on a 25nm scale",
      "volume": "55",
      "author": "Williams",
      "year": "1989",
      "journal-title": "Appl Phys Lett"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib5",
      "doi-asserted-by": "crossref",
      "first-page": "485",
      "DOI": "10.1088/0957-4484/12/4/321",
      "article-title": "Electrostatic force microscopy: principles and some applications to semiconductors",
      "volume": "12",
      "author": "Girard",
      "year": "2001",
      "journal-title": "Nanotechnology"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib6",
      "doi-asserted-by": "crossref",
      "first-page": "267",
      "DOI": "10.1126/science.268.5208.267",
      "article-title": "Imaging the condensation and evaporation of molecularly thin films of water with nanometer resolution",
      "volume": "268",
      "author": "Hu",
      "year": "1995",
      "journal-title": "Science"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib7",
      "doi-asserted-by": "crossref",
      "first-page": "1323",
      "DOI": "10.1116/1.585188",
      "article-title": "Electrostatic and contact forces in force microscopy",
      "volume": "9",
      "author": "Hao",
      "year": "1991",
      "journal-title": "J Vac Sci Technol B"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib8",
      "doi-asserted-by": "crossref",
      "first-page": "2669",
      "DOI": "10.1103/PhysRevLett.63.2669",
      "article-title": "Contact electrification using force microscopy",
      "volume": "63",
      "author": "Terris",
      "year": "1989",
      "journal-title": "Phys Rev Lett"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib9",
      "doi-asserted-by": "crossref",
      "first-page": "2151",
      "DOI": "10.1063/1.112775",
      "article-title": "Three-dimensional electrostatic potential, and potential-energy barrier, near a tip-base junction",
      "volume": "65",
      "author": "Pan",
      "year": "1994",
      "journal-title": "Appl Phys Lett"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib10",
      "doi-asserted-by": "crossref",
      "first-page": "457",
      "DOI": "10.1116/1.588494",
      "article-title": "Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes",
      "volume": "14",
      "author": "Hochwitz",
      "year": "1996",
      "journal-title": "J Vac Sci Technol B"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib11",
      "doi-asserted-by": "crossref",
      "first-page": "5",
      "DOI": "10.1007/s100510050219",
      "article-title": "Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface",
      "volume": "2",
      "author": "Hudlet",
      "year": "1998",
      "journal-title": "Eur Phys J B"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib12",
      "doi-asserted-by": "crossref",
      "first-page": "245403",
      "DOI": "10.1103/PhysRevB.64.245403",
      "article-title": "Resolution enhancement and improved data interpretation in electrostatic force microscopy",
      "volume": "64",
      "author": "Colchero",
      "year": "2001",
      "journal-title": "Phys Rev B"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib13",
      "doi-asserted-by": "crossref",
      "first-page": "2436",
      "DOI": "10.1103/PhysRevB.59.2436",
      "article-title": "Model of noncontact scanning force microscopy on ionic surfaces",
      "volume": "59",
      "author": "Livshits",
      "year": "1999",
      "journal-title": "Phys Rev B"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib14",
      "doi-asserted-by": "crossref",
      "first-page": "2061",
      "DOI": "10.1088/0953-8984/13/10/303",
      "article-title": "Contrast formation in atomic resolution scanning force microscopy on CaF2(111): experiment and theory",
      "volume": "13",
      "author": "Barth",
      "year": "2001",
      "journal-title": "J Phys Condens Matter"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib15",
      "doi-asserted-by": "crossref",
      "first-page": "39",
      "DOI": "10.1063/1.360951",
      "article-title": "Image charge method for electrostatic calculations in field-emission diodes",
      "volume": "79",
      "author": "Mesa",
      "year": "1996",
      "journal-title": "J Appl Phys"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib16",
      "doi-asserted-by": "crossref",
      "first-page": "1023",
      "DOI": "10.1063/1.363884",
      "article-title": "Electrostatic forces acting on the tip in atomic force microscopy: modelization and comparison with analytic expressions",
      "volume": "81",
      "author": "Belaidi",
      "year": "1997",
      "journal-title": "J Appl Phys"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib17",
      "doi-asserted-by": "crossref",
      "first-page": "2955",
      "DOI": "10.1063/1.126528",
      "article-title": "Theory of electrostatic probe microscopy: a simple perturbative approach",
      "volume": "76",
      "author": "G\u00f3mez-Mo\u00f1ivas",
      "year": "2000",
      "journal-title": "Appl Phys Lett"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib18",
      "doi-asserted-by": "crossref",
      "first-page": "4048",
      "DOI": "10.1063/1.1424478",
      "article-title": "Electrostatic force between sharp tips and metallic and dielectric samples",
      "volume": "79",
      "author": "G\u00f3mez-Mo\u00f1ivas",
      "year": "2001",
      "journal-title": "Appl Phys Lett"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib19",
      "doi-asserted-by": "crossref",
      "first-page": "173122",
      "DOI": "10.1063/1.2364862",
      "article-title": "Quantitative theory for the imaging of conducting objects in electrostatic force microscopy",
      "volume": "89",
      "author": "Sacha",
      "year": "2006",
      "journal-title": "Appl Phys Lett"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib20",
      "doi-asserted-by": "crossref",
      "first-page": "S239",
      "DOI": "10.1007/s003390051138",
      "article-title": "Finite element simulations of the resolution in electrostatic force microscopy",
      "volume": "66",
      "author": "Belaidi",
      "year": "1998",
      "journal-title": "Appl Phys A"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib21",
      "doi-asserted-by": "crossref",
      "first-page": "9225",
      "DOI": "10.1103/PhysRevB.57.9225",
      "article-title": "Scanning-electrostatic-force microscopy: self-consistent method for mesoscopic surface structures",
      "volume": "57",
      "author": "Li",
      "year": "1998",
      "journal-title": "Phys Rev B"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib22",
      "doi-asserted-by": "crossref",
      "first-page": "1168",
      "DOI": "10.1063/1.368181",
      "article-title": "Resolution and contrast in Kelvin probe force microscopy",
      "volume": "84",
      "author": "Jacobs",
      "year": "1998",
      "journal-title": "J Appl Phys"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib23",
      "doi-asserted-by": "crossref",
      "first-page": "083705",
      "DOI": "10.1063/1.1988089",
      "article-title": "Reconstruction of electrostatic force microscopy images",
      "volume": "76",
      "author": "Strassburg",
      "year": "2005",
      "journal-title": "Rev Sci Instrum"
    },
    {
      "issue": "10",
      "key": "10.1016/j.enganabound.2007.12.003_bib24",
      "doi-asserted-by": "crossref",
      "first-page": "4723",
      "DOI": "10.1063/1.338807",
      "article-title": "Atomic force microscope\u2014force mapping and profiling on a sub 100-\u00c5 scale",
      "volume": "61",
      "author": "Martin",
      "year": "1987",
      "journal-title": "J Appl Phys"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib25",
      "doi-asserted-by": "crossref",
      "first-page": "1",
      "DOI": "10.1088/0957-4484/6/1/001",
      "article-title": "Calculation of thermal noise in atomic force microscopy",
      "volume": "6",
      "author": "Butt",
      "year": "1995",
      "journal-title": "Nanotechnology"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib26",
      "doi-asserted-by": "crossref",
      "first-page": "219",
      "DOI": "10.1016/S0039-6028(00)00378-2",
      "article-title": "Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation",
      "volume": "457",
      "author": "Stark",
      "year": "2000",
      "journal-title": "Surf Sci"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib27",
      "doi-asserted-by": "crossref",
      "first-page": "199",
      "DOI": "10.1088/0957-4484/5/4/003",
      "article-title": "Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever",
      "volume": "5",
      "author": "Chen",
      "year": "1994",
      "journal-title": "Nanotechnology"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib28",
      "doi-asserted-by": "crossref",
      "first-page": "864",
      "DOI": "10.1116/1.589163",
      "article-title": "Driven nonlinear atomic force microscopy cantilevers: from noncontact to tapping modes of operation",
      "volume": "14",
      "author": "Sarid",
      "year": "1996",
      "journal-title": "J Vac Sci Technol B"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib29",
      "doi-asserted-by": "crossref",
      "first-page": "251",
      "DOI": "10.1016/S0304-3991(97)00002-8",
      "article-title": "Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation",
      "volume": "66",
      "author": "Anczykowski",
      "year": "1996",
      "journal-title": "Ultramicroscopy"
    },
    {
      "issue": "12",
      "key": "10.1016/j.enganabound.2007.12.003_bib30",
      "doi-asserted-by": "crossref",
      "first-page": "8908",
      "DOI": "10.1103/PhysRevB.54.8908",
      "article-title": "Imaging material properties by resonant tapping-force microscopy: a model investigation",
      "volume": "54",
      "author": "Winkler",
      "year": "1996",
      "journal-title": "Phys Rev B"
    },
    {
      "issue": "7",
      "key": "10.1016/j.enganabound.2007.12.003_bib31",
      "doi-asserted-by": "crossref",
      "first-page": "4961",
      "DOI": "10.1103/PhysRevB.60.4961",
      "article-title": "Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy",
      "volume": "60",
      "author": "Garc\u00eda",
      "year": "1999",
      "journal-title": "Phys Rev B"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib32",
      "doi-asserted-by": "crossref",
      "first-page": "178",
      "DOI": "10.1016/S0039-6028(99)00368-4",
      "article-title": "The role of damping in phase imaging in tapping mode atomic force microscopy",
      "volume": "429",
      "author": "Wang",
      "year": "1999",
      "journal-title": "Surf Sci"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib33",
      "series-title": "Classical electrodynamics",
      "author": "Jackson",
      "year": "1998"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib34",
      "series-title": "Static and dynamic electricity",
      "author": "Smythe",
      "year": "1968"
    },
    {
      "key": "10.1016/j.enganabound.2007.12.003_bib35",
      "series-title": "Programming the boundary element method: an introduction for engineers",
      "author": "Beer",
      "year": "2001"
    },
    {
      "issue": "5",
      "key": "10.1016/j.enganabound.2007.12.003_bib36",
      "doi-asserted-by": "crossref",
      "first-page": "1169",
      "DOI": "10.1111/j.1151-2916.1996.tb08569.x",
      "article-title": "Solute segregation and grain-boundary impedance in high-purity stabilized zirconia",
      "volume": "79",
      "author": "Aoki",
      "year": "1996",
      "journal-title": "J Am Ceram Soc"
    }
  ],
  "container-title": "Engineering Analysis with Boundary Elements",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0955799707002172?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0955799707002172?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2018,
        12,
        31
      ]
    ],
    "date-time": "2018-12-31T17:53:56Z",
    "timestamp": 1546278836000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0955799707002172"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2008,
        8
      ]
    ]
  },
  "references-count": 36,
  "journal-issue": {
    "issue": "8",
    "published-print": {
      "date-parts": [
        [
          2008,
          8
        ]
      ]
    }
  },
  "alternative-id": [
    "S0955799707002172"
  ],
  "URL": "http://dx.doi.org/10.1016/j.enganabound.2007.12.003",
  "relation": {},
  "ISSN": [
    "0955-7997"
  ],
  "subject": [],
  "container-title-short": "Engineering Analysis with Boundary Elements",
  "published": {
    "date-parts": [
      [
        2008,
        8
      ]
    ]
  }
}