DOI: 10.1016/j.chemgeo.2008.05.019. Focused Ion Beam (FIB) combined with SEM and TEM: Advanced analytical tools for studies of chemical composition, microstructure and crystal structure in geomaterials on a nanometre scale

Focused Ion Beam (FIB) combined with SEM and TEM: Advanced analytical tools for studies of chemical composition, microstructure and crystal structure in geomaterials on a nanometre scale

10.1016/j.chemgeo.2008.05.019

Crossref journal-article

Elsevier BV

Chemical Geology (78)

Bibliography

Wirth, R. (2009). Focused Ion Beam (FIB) combined with SEM and TEM: Advanced analytical tools for studies of chemical composition, microstructure and crystal structure in geomaterials on a nanometre scale. Chemical Geology, 261(3â4), 217â229.

Authors 1

Richard Wirth (first)

References 63 Referenced 461

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Dates

Type	When
Created	17 years, 2 months ago (June 12, 2008, 5:44 a.m.)
Deposited	6 years, 3 months ago (May 11, 2019, 6:46 p.m.)
Indexed	2 days, 1 hour ago (Aug. 19, 2025, 6:06 a.m.)
Issued	16 years, 4 months ago (April 1, 2009)
Published	16 years, 4 months ago (April 1, 2009)
Published Print	16 years, 4 months ago (April 1, 2009)

Funders 0

None

BibTeX

@article{Wirth_2009, title={Focused Ion Beam (FIB) combined with SEM and TEM: Advanced analytical tools for studies of chemical composition, microstructure and crystal structure in geomaterials on a nanometre scale}, volume={261}, ISSN={0009-2541}, url={http://dx.doi.org/10.1016/j.chemgeo.2008.05.019}, DOI={10.1016/j.chemgeo.2008.05.019}, number={3–4}, journal={Chemical Geology}, publisher={Elsevier BV}, author={Wirth, Richard}, year={2009}, month=apr, pages={217–229} }

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