DOI: 10.1016/j.apsusc.2004.10.145. In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment

In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment

10.1016/j.apsusc.2004.10.145

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Kato, N., Konomi, I., Seno, Y., & Motohiro, T. (2005). In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment. Applied Surface Science, 244(1â4), 281â284.

Authors 4

Naohiko Kato (first)
Ichiro Konomi (additional)
Yoshiki Seno (additional)
Tomoyoshi Motohiro (additional)

References 7 Referenced 29

10.1063/1.348620 / J. Appl. Phys. by Yamada (1991)
10.1143/JJAP.38.1649 / Jpn. J. Appl. Phys. by Chiang (1999)
10.1143/JJAP.38.1707 / Jpn. J. Appl. Phys. by Kato (1999)
10.1143/JJAP.37.2098 / Jpn. J. Appl. Phys. by Kojima (1998)
{'key': '10.1016/j.apsusc.2004.10.145_bib5', 'first-page': '387', 'volume': '5', 'author': 'Kato', 'year': '2000', 'journal-title': 'Spring-8 User Exp. Rep.'} / Spring-8 User Exp. Rep. by Kato (2000)
10.1143/JJAP.39.2775 / Jpn. J. Appl. Phys. by Jeong (2000)
{'key': '10.1016/j.apsusc.2004.10.145_bib7', 'first-page': '417', 'volume': '13', 'author': 'Petrov', 'year': '1968', 'journal-title': 'Kristallografiya'} / Kristallografiya by Petrov (1968)

Dates

Type	When
Created	20 years, 7 months ago (Jan. 11, 2005, 7:29 a.m.)
Deposited	6 years, 6 months ago (Jan. 30, 2019, 4:51 a.m.)
Indexed	1 year, 7 months ago (Jan. 3, 2024, 12:28 a.m.)
Issued	20 years, 3 months ago (May 1, 2005)
Published	20 years, 3 months ago (May 1, 2005)
Published Print	20 years, 3 months ago (May 1, 2005)

Funders 0

None

BibTeX

@article{Kato_2005, title={In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment}, volume={244}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/j.apsusc.2004.10.145}, DOI={10.1016/j.apsusc.2004.10.145}, number={1–4}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Kato, Naohiko and Konomi, Ichiro and Seno, Yoshiki and Motohiro, Tomoyoshi}, year={2005}, month=may, pages={281–284} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        1,
        3
      ]
    ],
    "date-time": "2024-01-03T05:28:13Z",
    "timestamp": 1704259693953
  },
  "reference-count": 7,
  "publisher": "Elsevier BV",
  "issue": "1-4",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2005,
            5,
            1
          ]
        ],
        "date-time": "2005-05-01T00:00:00Z",
        "timestamp": 1114905600000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2005,
        5
      ]
    ]
  },
  "DOI": "10.1016/j.apsusc.2004.10.145",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2005,
        1,
        11
      ]
    ],
    "date-time": "2005-01-11T12:29:51Z",
    "timestamp": 1105446591000
  },
  "page": "281-284",
  "source": "Crossref",
  "is-referenced-by-count": 29,
  "title": "In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment",
  "prefix": "10.1016",
  "volume": "244",
  "author": [
    {
      "given": "Naohiko",
      "family": "Kato",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "Ichiro",
      "family": "Konomi",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Yoshiki",
      "family": "Seno",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Tomoyoshi",
      "family": "Motohiro",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/j.apsusc.2004.10.145_bib1",
      "doi-asserted-by": "crossref",
      "first-page": "2849",
      "DOI": "10.1063/1.348620",
      "volume": "69",
      "author": "Yamada",
      "year": "1991",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "10.1016/j.apsusc.2004.10.145_bib2",
      "doi-asserted-by": "crossref",
      "first-page": "1649",
      "DOI": "10.1143/JJAP.38.1649",
      "volume": "38",
      "author": "Chiang",
      "year": "1999",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "10.1016/j.apsusc.2004.10.145_bib3",
      "doi-asserted-by": "crossref",
      "first-page": "1707",
      "DOI": "10.1143/JJAP.38.1707",
      "volume": "38",
      "author": "Kato",
      "year": "1999",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "10.1016/j.apsusc.2004.10.145_bib4",
      "doi-asserted-by": "crossref",
      "first-page": "2098",
      "DOI": "10.1143/JJAP.37.2098",
      "volume": "37",
      "author": "Kojima",
      "year": "1998",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "10.1016/j.apsusc.2004.10.145_bib5",
      "first-page": "387",
      "volume": "5",
      "author": "Kato",
      "year": "2000",
      "journal-title": "Spring-8 User Exp. Rep."
    },
    {
      "key": "10.1016/j.apsusc.2004.10.145_bib6",
      "doi-asserted-by": "crossref",
      "first-page": "2775",
      "DOI": "10.1143/JJAP.39.2775",
      "volume": "39",
      "author": "Jeong",
      "year": "2000",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "10.1016/j.apsusc.2004.10.145_bib7",
      "first-page": "417",
      "volume": "13",
      "author": "Petrov",
      "year": "1968",
      "journal-title": "Kristallografiya"
    }
  ],
  "container-title": "Applied Surface Science",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0169433204017891?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0169433204017891?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2019,
        1,
        30
      ]
    ],
    "date-time": "2019-01-30T09:51:41Z",
    "timestamp": 1548841901000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0169433204017891"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2005,
        5
      ]
    ]
  },
  "references-count": 7,
  "journal-issue": {
    "issue": "1-4",
    "published-print": {
      "date-parts": [
        [
          2005,
          5
        ]
      ]
    }
  },
  "alternative-id": [
    "S0169433204017891"
  ],
  "URL": "http://dx.doi.org/10.1016/j.apsusc.2004.10.145",
  "relation": {},
  "ISSN": [
    "0169-4332"
  ],
  "subject": [],
  "container-title-short": "Applied Surface Science",
  "published": {
    "date-parts": [
      [
        2005,
        5
      ]
    ]
  }
}