DOI: 10.1016/s1387-1811(00)00360-7. Nanoscale crystal orientation in silicalite-1 films studied by grazing incidence X-ray diffraction

Nanoscale crystal orientation in silicalite-1 films studied by grazing incidence X-ray diffraction

10.1016/s1387-1811(00)00360-7

Crossref journal-article

Elsevier BV

Microporous and Mesoporous Materials (78)

Bibliography

Metzger, T. H., Mintova, S., & Bein, T. (2001). Nanoscale crystal orientation in silicalite-1 films studied by grazing incidence X-ray diffraction. Microporous and Mesoporous Materials, 43(2), 191â200.

Authors 3

T.H Metzger (first)
S Mintova (additional)
T Bein (additional)

References 22 Referenced 20

{'key': '10.1016/S1387-1811(00)00360-7_BIB1', 'series-title': 'Molecular Sieves. Principles of Synthesis and Identification', 'author': 'Szostak', 'year': '1998'} / Molecular Sieves. Principles of Synthesis and Identification by Szostak (1998)
10.1021/cm960148a / Chem. Mater. by Bein (1996)
10.1002/(SICI)1521-4095(199908)11:12<975::AID-ADMA975>3.0.CO;2-0 / Adv. Mater. by Tavolaro (1999)
10.1021/jp990298j / J. Phys. Chem. B by Kirschhock (1999)
10.1039/a904162a / Phys. Chem. Chem. Phys. by Singh (1999)
10.1126/science.283.5404.958 / Science by Mintova (1999)
10.1002/(SICI)1521-3773(19991102)38:21<3201::AID-ANIE3201>3.0.CO;2-H / Angew. Chemie by Mintova (1999)
10.1002/adma.19970090716 / Adv. Mater. by Mintova (1997)
10.1021/cm970151+ / Chem. Mater. by Boudreau (1997)
10.1016/S1387-1811(99)00118-3 / Micropor. Mesopor. Mater. by Mihailiva (1999)
10.1016/S1387-1811(98)00300-X / Micropor. Mesopor. Mater. by Hedlund (1999)
10.1016/S0927-6513(97)00037-0 / Micropor. Mesopor. Mater. by Mintova (1997)
V. Holý, U. Pietsch, T. Baumbach, High-resolution X-ray Scattering from Thin Films and Multilayers, Springer Tract of Modern Physics, vol. 149, Springer, Berlin, 1999
10.1209/epl/i1999-00150-y / Europhys. Lett. by Kegel (1999)
10.1103/PhysRevB.60.2516 / Phys. Rev. by Kegel (1999)
10.1063/1.123985 / Appl. Phys. Lett. by Kegel (1999)
10.1088/0022-3727/32/10A/339 / J. Phys. D: Appl. Phys. by Metzger (1999)
H. Dosch, Critical Phenomena at Surfaces and Interfaces, vol. 126, Springer, Berlin, 1992 (10.1007/BFb0045209)
M.M.J. Treacy, J.B. Higgins, R. von Ballmoos, Collection of Simulated XRD Powder Patterns for Zeolites, Elsevier, 1996, p. 524
http://www.esrf.fr/exp_facilities/ID10B/handbook/
10.1016/0144-2449(95)00102-6 / Zeolites by Iwasaki (1996)
10.1002/pssa.2211350104 / Phys. Stat. Sol. A by Wallner (1993)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 4:05 p.m.)
Deposited	6 years, 4 months ago (April 21, 2019, 7:51 p.m.)
Indexed	2 months, 1 week ago (June 26, 2025, 8:46 a.m.)
Issued	24 years, 5 months ago (April 1, 2001)
Published	24 years, 5 months ago (April 1, 2001)
Published Print	24 years, 5 months ago (April 1, 2001)

Funders 0

None

BibTeX

@article{Metzger_2001, title={Nanoscale crystal orientation in silicalite-1 films studied by grazing incidence X-ray diffraction}, volume={43}, ISSN={1387-1811}, url={http://dx.doi.org/10.1016/s1387-1811(00)00360-7}, DOI={10.1016/s1387-1811(00)00360-7}, number={2}, journal={Microporous and Mesoporous Materials}, publisher={Elsevier BV}, author={Metzger, T.H and Mintova, S and Bein, T}, year={2001}, month=apr, pages={191–200} }

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