Crossref journal-article
Elsevier BV
Acta Materialia (78)
Bibliography

Hommel, M., & Kraft, O. (2001). Deformation behavior of thin copper films on deformable substrates. Acta Materialia, 49(19), 3935–3947.

Authors 2
  1. M. Hommel (first)
  2. O. Kraft (additional)
References 57 Referenced 211
  1. Neugebauer, C. A., Newkirk, J. B., and Vermilyea, D. A. (ed.), Structure and Properties of Thin Films. John Wiley and Sons, New York, 1959.
  2. 10.1007/BF02666659 / Met. Trans. A by Nix (1989)
  3. 10.1179/imr.1994.39.1.24 / Int. Mater. Rev. by Brotzen (1994)
  4. 10.1002/1527-2648(200103)3:3<99::AID-ADEM99>3.0.CO;2-2 / Adv. Eng. Mater. by Kraft (2001)
  5. 10.1080/01418617908239287 / Philos. Mag. A by Chaudhari (1979)
  6. 10.1557/JMR.1993.0237 / J. Mater. Res. by Thompson (1993)
  7. 10.1557/JMR.1998.0186 / J. Mater. Res. by Keller (1998)
  8. {'key': '10.1016/S1359-6454(01)00293-2_BIB8', 'series-title': 'Strengthening Methods in Crystals', 'first-page': '331', 'author': 'Embury', 'year': '1971'} / Strengthening Methods in Crystals by Embury (1971)
  9. 10.1016/0036-9748(79)90286-2 / Scr. Metall. by Murr (1979)
  10. 10.1080/14786437008238426 / Phil. Mag. by Ashby (1970)
  11. {'key': '10.1016/S1359-6454(01)00293-2_BIB11', 'series-title': 'Strengthening Methods in Crystals', 'first-page': '137', 'author': 'Ashby', 'year': '1971'} / Strengthening Methods in Crystals by Ashby (1971)
  12. 10.1557/JMR.1992.2040 / J. Mater. Res. by Venkatraman (1992)
  13. 10.1080/01418617908243094 / Phil. Mag. A by Ronay (1979)
  14. 10.1557/JMR.1998.0272 / J. Mater. Res. by Shen (1998)
  15. 10.1557/JMR.1993.1542 / J. Mater. Res. by Read (1993)
  16. 10.1557/JMR.1993.0112 / J. Mater. Res. by Ruud (1993)
  17. {'key': '10.1016/S1359-6454(01)00293-2_BIB17', 'series-title': 'Microelectromechanical Structures for Materials Research (MRS Symposium Proceedings 518, Pittsburgh, PA, 1998)', 'first-page': '81', 'author': 'Cornella', 'year': '1998'} / Microelectromechanical Structures for Materials Research (MRS Symposium Proceedings 518, Pittsburgh, PA, 1998) by Cornella (1998)
  18. 10.1016/S0142-1123(97)00080-7 / Int. J. Fatigue by Read (1998)
  19. 10.1109/84.623107 / J. Microelectromech. Syst. by Sharpe (1997)
  20. 10.1557/JMR.1998.0397 / J. Mater. Res. by Josell (1998)
  21. 10.1016/S1359-6454(00)00128-2 / Acta mater. by Huang (2000)
  22. 10.1007/s11664-997-0255-9 / J. Elect. Mater. by Kang (1997)
  23. 10.1557/JMR.1998.0390 / J. Mater. Res. by Macionczyk (1998)
  24. 10.1007/BF00729763 / J. Mater. Sci. Lett. by Schadler (1992)
  25. 10.1063/1.114168 / Appl. Phys. Lett. by Schadler (1995)
  26. 10.1557/JMR.1999.0317 / J. Mater. Res. by Hommel (1999)
  27. {'key': '10.1016/S1359-6454(01)00293-2_BIB27', 'series-title': 'Materials Science of Microelectromechanical System (MEMS) Devices (MRS Symposium Proceedings 546, Pittsburgh, PA, 1999)', 'first-page': '133', 'author': 'Hommel', 'year': '1999'} / Materials Science of Microelectromechanical System (MEMS) Devices (MRS Symposium Proceedings 546, Pittsburgh, PA, 1999) by Hommel (1999)
  28. 10.1116/1.577228 / J. Vac. Sci. Technol. by Pappas (1991)
  29. Hommel, M., Ph.D. Thesis, Universität Stuttgart, 1999.
  30. 10.1557/JMR.1998.0405 / J. Mater. Res. by Kuschke (1998)
  31. {'key': '10.1016/S1359-6454(01)00293-2_BIB31', 'first-page': '59', 'volume': '436', 'author': 'Kretschmann', 'year': '1996'} by Kretschmann (1996)
  32. {'key': '10.1016/S1359-6454(01)00293-2_BIB32', 'series-title': 'Residual Stress: Measurement by Diffraction and Interpretation', 'author': 'Noyan', 'year': '1987'} / Residual Stress: Measurement by Diffraction and Interpretation by Noyan (1987)
  33. 10.1107/S0021889878012601 / J. Appl. Cryst. by Langford (1978)
  34. {'key': '10.1016/S1359-6454(01)00293-2_BIB34', 'series-title': 'Residual Stress: Measurement by Diffraction and Interpretation', 'author': 'Noyan', 'year': '1987'} / Residual Stress: Measurement by Diffraction and Interpretation by Noyan (1987)
  35. {'key': '10.1016/S1359-6454(01)00293-2_BIB35', 'series-title': 'Numerical Data and Functional Relationship in Science and Technology—New Series 11', 'author': 'Landolt-Börnstein', 'year': '1979'} / Numerical Data and Functional Relationship in Science and Technology—New Series 11 by Landolt-Börnstein (1979)
  36. 10.1063/1.345411 / J. Appl. Phys. by Flinn (1990)
  37. {'key': '10.1016/S1359-6454(01)00293-2_BIB37', 'volume': '144', 'author': 'Steeb', 'year': '1985'} by Steeb (1985)
  38. 10.1017/S0885715600016791 / Powder Diffraction by Balasingh (1991)
  39. {'key': '10.1016/S1359-6454(01)00293-2_BIB39', 'first-page': '279', 'volume': '71', 'author': 'Megaw', 'year': '1945', 'journal-title': 'J. Inst. Met.'} / J. Inst. Met. by Megaw (1945)
  40. {'key': '10.1016/S1359-6454(01)00293-2_BIB40', 'first-page': '129', 'volume': '13', 'author': 'Stroppe', 'year': '1969', 'journal-title': 'Wiss. Z. Tech. Hochschule Otto von Guericke Magdeburg'} / Wiss. Z. Tech. Hochschule Otto von Guericke Magdeburg by Stroppe (1969)
  41. 10.1016/0040-6090(95)05834-6 / Thin Solid Films by Vinci (1995)
  42. 10.1016/0921-5093(96)10253-7 / Mater. Sci. Eng. by Keller (1996)
  43. 10.1016/S1359-6454(98)00387-5 / Acta mater. by Keller (1999)
  44. 10.1115/1.3173068 / J. Appl. Mech. by Freund (1987)
  45. 10.1016/S1359-6454(98)00231-6 / Acta metall. mater. by Arzt (1998)
  46. 10.1080/01418619808214247 / Phil. Mag. A by Friedman (1998)
  47. {'key': '10.1016/S1359-6454(01)00293-2_BIB47', 'series-title': 'Structure and Properties of Thin Films', 'first-page': '111', 'author': 'Menter', 'year': '1959'} / Structure and Properties of Thin Films by Menter (1959)
  48. {'key': '10.1016/S1359-6454(01)00293-2_BIB48', 'series-title': 'Structure and Properties of Thin Films', 'first-page': '151', 'author': 'Wilsdorf', 'year': '1959'} / Structure and Properties of Thin Films by Wilsdorf (1959)
  49. 10.1088/0965-0393/9/3/303 / Modelling Simulation Mater. Sci. Eng. by von Blanckenhagen (2001)
  50. {'key': '10.1016/S1359-6454(01)00293-2_BIB50', 'series-title': 'Strengthening Methods in Crystals', 'first-page': '12', 'author': 'Brown', 'year': '1971'} / Strengthening Methods in Crystals by Brown (1971)
  51. 10.1016/S1359-6454(01)00170-7 / Acta mater. by Weihnacht (2001)
  52. {'key': '10.1016/S1359-6454(01)00293-2_BIB52', 'first-page': 'P2.3', 'volume': '673', 'author': 'von Blanckenhagen', 'year': '2001'} by von Blanckenhagen (2001)
  53. {'key': '10.1016/S1359-6454(01)00293-2_BIB53', 'first-page': 'P2.2', 'volume': '673', 'author': 'Pant', 'year': '2001'} by Pant (2001)
  54. 10.1080/01418617908234871 / Phil. Mag. A by Essmann (1979)
  55. 10.1080/01418618108239541 / Phil. Mag. A by Essmann (1981)
  56. 10.1016/S1359-6454(99)00403-6 / Acta mater. by Kobrinsky (2000)
  57. Baker, S. P., Kretschmann, A. and Arzt, E., Acta mater., 2001, 49, 2145. (10.1016/S1359-6454(01)00127-6)
Dates
Type When
Created 23 years, 1 month ago (July 25, 2002, 3:12 a.m.)
Deposited 6 years, 3 months ago (May 6, 2019, 2:53 p.m.)
Indexed 3 months, 1 week ago (May 21, 2025, 5:08 p.m.)
Issued 23 years, 10 months ago (Nov. 1, 2001)
Published 23 years, 10 months ago (Nov. 1, 2001)
Published Print 23 years, 10 months ago (Nov. 1, 2001)
Funders 0

None

@article{Hommel_2001, title={Deformation behavior of thin copper films on deformable substrates}, volume={49}, ISSN={1359-6454}, url={http://dx.doi.org/10.1016/s1359-6454(01)00293-2}, DOI={10.1016/s1359-6454(01)00293-2}, number={19}, journal={Acta Materialia}, publisher={Elsevier BV}, author={Hommel, M. and Kraft, O.}, year={2001}, month=nov, pages={3935–3947} }