Crossref
journal-article
Elsevier BV
Acta Materialia (78)
References
57
Referenced
211
- Neugebauer, C. A., Newkirk, J. B., and Vermilyea, D. A. (ed.), Structure and Properties of Thin Films. John Wiley and Sons, New York, 1959.
10.1007/BF02666659
/ Met. Trans. A by Nix (1989)10.1179/imr.1994.39.1.24
/ Int. Mater. Rev. by Brotzen (1994)10.1002/1527-2648(200103)3:3<99::AID-ADEM99>3.0.CO;2-2
/ Adv. Eng. Mater. by Kraft (2001)10.1080/01418617908239287
/ Philos. Mag. A by Chaudhari (1979)10.1557/JMR.1993.0237
/ J. Mater. Res. by Thompson (1993)10.1557/JMR.1998.0186
/ J. Mater. Res. by Keller (1998){'key': '10.1016/S1359-6454(01)00293-2_BIB8', 'series-title': 'Strengthening Methods in Crystals', 'first-page': '331', 'author': 'Embury', 'year': '1971'}
/ Strengthening Methods in Crystals by Embury (1971)10.1016/0036-9748(79)90286-2
/ Scr. Metall. by Murr (1979)10.1080/14786437008238426
/ Phil. Mag. by Ashby (1970){'key': '10.1016/S1359-6454(01)00293-2_BIB11', 'series-title': 'Strengthening Methods in Crystals', 'first-page': '137', 'author': 'Ashby', 'year': '1971'}
/ Strengthening Methods in Crystals by Ashby (1971)10.1557/JMR.1992.2040
/ J. Mater. Res. by Venkatraman (1992)10.1080/01418617908243094
/ Phil. Mag. A by Ronay (1979)10.1557/JMR.1998.0272
/ J. Mater. Res. by Shen (1998)10.1557/JMR.1993.1542
/ J. Mater. Res. by Read (1993)10.1557/JMR.1993.0112
/ J. Mater. Res. by Ruud (1993){'key': '10.1016/S1359-6454(01)00293-2_BIB17', 'series-title': 'Microelectromechanical Structures for Materials Research (MRS Symposium Proceedings 518, Pittsburgh, PA, 1998)', 'first-page': '81', 'author': 'Cornella', 'year': '1998'}
/ Microelectromechanical Structures for Materials Research (MRS Symposium Proceedings 518, Pittsburgh, PA, 1998) by Cornella (1998)10.1016/S0142-1123(97)00080-7
/ Int. J. Fatigue by Read (1998)10.1109/84.623107
/ J. Microelectromech. Syst. by Sharpe (1997)10.1557/JMR.1998.0397
/ J. Mater. Res. by Josell (1998)10.1016/S1359-6454(00)00128-2
/ Acta mater. by Huang (2000)10.1007/s11664-997-0255-9
/ J. Elect. Mater. by Kang (1997)10.1557/JMR.1998.0390
/ J. Mater. Res. by Macionczyk (1998)10.1007/BF00729763
/ J. Mater. Sci. Lett. by Schadler (1992)10.1063/1.114168
/ Appl. Phys. Lett. by Schadler (1995)10.1557/JMR.1999.0317
/ J. Mater. Res. by Hommel (1999){'key': '10.1016/S1359-6454(01)00293-2_BIB27', 'series-title': 'Materials Science of Microelectromechanical System (MEMS) Devices (MRS Symposium Proceedings 546, Pittsburgh, PA, 1999)', 'first-page': '133', 'author': 'Hommel', 'year': '1999'}
/ Materials Science of Microelectromechanical System (MEMS) Devices (MRS Symposium Proceedings 546, Pittsburgh, PA, 1999) by Hommel (1999)10.1116/1.577228
/ J. Vac. Sci. Technol. by Pappas (1991)- Hommel, M., Ph.D. Thesis, Universität Stuttgart, 1999.
10.1557/JMR.1998.0405
/ J. Mater. Res. by Kuschke (1998){'key': '10.1016/S1359-6454(01)00293-2_BIB31', 'first-page': '59', 'volume': '436', 'author': 'Kretschmann', 'year': '1996'}
by Kretschmann (1996){'key': '10.1016/S1359-6454(01)00293-2_BIB32', 'series-title': 'Residual Stress: Measurement by Diffraction and Interpretation', 'author': 'Noyan', 'year': '1987'}
/ Residual Stress: Measurement by Diffraction and Interpretation by Noyan (1987)10.1107/S0021889878012601
/ J. Appl. Cryst. by Langford (1978){'key': '10.1016/S1359-6454(01)00293-2_BIB34', 'series-title': 'Residual Stress: Measurement by Diffraction and Interpretation', 'author': 'Noyan', 'year': '1987'}
/ Residual Stress: Measurement by Diffraction and Interpretation by Noyan (1987){'key': '10.1016/S1359-6454(01)00293-2_BIB35', 'series-title': 'Numerical Data and Functional Relationship in Science and Technology—New Series 11', 'author': 'Landolt-Börnstein', 'year': '1979'}
/ Numerical Data and Functional Relationship in Science and Technology—New Series 11 by Landolt-Börnstein (1979)10.1063/1.345411
/ J. Appl. Phys. by Flinn (1990){'key': '10.1016/S1359-6454(01)00293-2_BIB37', 'volume': '144', 'author': 'Steeb', 'year': '1985'}
by Steeb (1985)10.1017/S0885715600016791
/ Powder Diffraction by Balasingh (1991){'key': '10.1016/S1359-6454(01)00293-2_BIB39', 'first-page': '279', 'volume': '71', 'author': 'Megaw', 'year': '1945', 'journal-title': 'J. Inst. Met.'}
/ J. Inst. Met. by Megaw (1945){'key': '10.1016/S1359-6454(01)00293-2_BIB40', 'first-page': '129', 'volume': '13', 'author': 'Stroppe', 'year': '1969', 'journal-title': 'Wiss. Z. Tech. Hochschule Otto von Guericke Magdeburg'}
/ Wiss. Z. Tech. Hochschule Otto von Guericke Magdeburg by Stroppe (1969)10.1016/0040-6090(95)05834-6
/ Thin Solid Films by Vinci (1995)10.1016/0921-5093(96)10253-7
/ Mater. Sci. Eng. by Keller (1996)10.1016/S1359-6454(98)00387-5
/ Acta mater. by Keller (1999)10.1115/1.3173068
/ J. Appl. Mech. by Freund (1987)10.1016/S1359-6454(98)00231-6
/ Acta metall. mater. by Arzt (1998)10.1080/01418619808214247
/ Phil. Mag. A by Friedman (1998){'key': '10.1016/S1359-6454(01)00293-2_BIB47', 'series-title': 'Structure and Properties of Thin Films', 'first-page': '111', 'author': 'Menter', 'year': '1959'}
/ Structure and Properties of Thin Films by Menter (1959){'key': '10.1016/S1359-6454(01)00293-2_BIB48', 'series-title': 'Structure and Properties of Thin Films', 'first-page': '151', 'author': 'Wilsdorf', 'year': '1959'}
/ Structure and Properties of Thin Films by Wilsdorf (1959)10.1088/0965-0393/9/3/303
/ Modelling Simulation Mater. Sci. Eng. by von Blanckenhagen (2001){'key': '10.1016/S1359-6454(01)00293-2_BIB50', 'series-title': 'Strengthening Methods in Crystals', 'first-page': '12', 'author': 'Brown', 'year': '1971'}
/ Strengthening Methods in Crystals by Brown (1971)10.1016/S1359-6454(01)00170-7
/ Acta mater. by Weihnacht (2001){'key': '10.1016/S1359-6454(01)00293-2_BIB52', 'first-page': 'P2.3', 'volume': '673', 'author': 'von Blanckenhagen', 'year': '2001'}
by von Blanckenhagen (2001){'key': '10.1016/S1359-6454(01)00293-2_BIB53', 'first-page': 'P2.2', 'volume': '673', 'author': 'Pant', 'year': '2001'}
by Pant (2001)10.1080/01418617908234871
/ Phil. Mag. A by Essmann (1979)10.1080/01418618108239541
/ Phil. Mag. A by Essmann (1981)10.1016/S1359-6454(99)00403-6
/ Acta mater. by Kobrinsky (2000)-
Baker, S. P., Kretschmann, A. and Arzt, E., Acta mater., 2001, 49, 2145.
(
10.1016/S1359-6454(01)00127-6
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 25, 2002, 3:12 a.m.) |
Deposited | 6 years, 3 months ago (May 6, 2019, 2:53 p.m.) |
Indexed | 3 months, 1 week ago (May 21, 2025, 5:08 p.m.) |
Issued | 23 years, 10 months ago (Nov. 1, 2001) |
Published | 23 years, 10 months ago (Nov. 1, 2001) |
Published Print | 23 years, 10 months ago (Nov. 1, 2001) |
@article{Hommel_2001, title={Deformation behavior of thin copper films on deformable substrates}, volume={49}, ISSN={1359-6454}, url={http://dx.doi.org/10.1016/s1359-6454(01)00293-2}, DOI={10.1016/s1359-6454(01)00293-2}, number={19}, journal={Acta Materialia}, publisher={Elsevier BV}, author={Hommel, M. and Kraft, O.}, year={2001}, month=nov, pages={3935–3947} }