DOI: 10.1016/s0968-4328(98)00014-6. Optimization of the Signal to Noise Ratio in EFTEM Elemental Maps with Regard to Different Ionization Edge Types

Optimization of the Signal to Noise Ratio in EFTEM Elemental Maps with Regard to Different Ionization Edge Types

10.1016/s0968-4328(98)00014-6

Crossref journal-article

Elsevier BV

Micron (78)

Bibliography

Kothleitner, G., & Hofer, F. (1998). Optimization of the Signal to Noise Ratio in EFTEM Elemental Maps with Regard to Different Ionization Edge Types. Micron, 29(5), 349â357.

Authors 2

G. Kothleitner (first)
F. Hofer (additional)

References 31 Referenced 51

Bentley, J., Lehmann, G. L., Sklad, P. S., 1982. Alternative background fitting for electron energy-loss spectra. In Proc. 40th Annual EMSA Meeting, ed G. W. Bailey, pp. 496 497. Claitor's, Baton Rouge. (10.1017/S0424820100054923)
Bentley, J., Hall, E. L., Kenik, E. A., 1995. Quantitative elemental concentrations by energy-filtered imaging. In Proc. Microscopy and Microanalysis 1995, eds G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J.. Zaluzec, pp. 268 269. Jones and Begell, New York. (10.1017/S0424820100137719)
Berger, A., 1993. Abbildung von Elementverteilungen mit hoher Ortsauflösung im Transmissions-Elektronenmikroskop. Dissertation, Technische Hochschule, Darmstadt, Germany.
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10.1051/mmm:0199200302-3015900 / Microsc. Microanal. Microstr. / Elemental mapping using an imaging energy-filter: image formation and resolution limits by Berger (1993)
10.1016/0304-3991(94)90084-1 / Ultramicroscopy / Detection limits in elemental distribution images produced by energy filtering TEM: case study of grain boundaries in Si3N4 by Berger (1994)
Bonnet, N., Colliex, C., Mory, C., Tence, M., 1988. Developments in processing image sequences for elemental mapping. Scanning Microscopy, Supplement, Vol. 2, pp. 351 364. Scanning Microscopy International, Chicago, IL.
10.1016/0968-4328(96)00017-0 / Micron / On the application of energy-filtering TEM in materials science: II. Study of a fibre-reinforced metal matrix composite by Brydson (1996)
{'key': '10.1016/S0968-4328(98)00014-6_BIB9', 'first-page': '77', 'article-title': 'Filtrage magnetique des vitesses en microscopie electronique', 'volume': 'B255', 'author': 'Castaing', 'year': '1962', 'journal-title': 'Compt. Rend. Acad. Sci. Paris'} / Compt. Rend. Acad. Sci. Paris / Filtrage magnetique des vitesses en microscopie electronique by Castaing (1962)
Egerton, R. F., 1996. Electron Energy-loss Spectroscopy in the Transmission Electron Micoscope. Plenum Press, New York. (10.1007/978-1-4757-5099-7)
10.1007/BF01246156 / Mikrochim. Acta / Quantitative chemical phase imaging by means of energy-filtering transmission electron microscopy by Grogger (1997)
10.1016/0304-3991(93)90143-L / Ultramicroscopy / Applications of a post-column imaging filter in biology and materials science by Gubbens (1993)
10.1016/0304-3991(95)00015-S / Ultramicroscopy / Imaging of nanometer sized precipitates in solids by electron spectroscopic imaging by Hofer (1995)
10.1016/0304-3991(96)00042-3 / Ultramicroscopy / Ionization cross-sections for the L23-edges of the elements Sr to Mo for quantitative EELS analysis by Hofer (1996)
10.1016/S0304-3991(96)00106-4 / Ultramicroscopy / Quantitative analysis of EFTEM elemental distribution images by Hofer (1997)
10.1016/0304-3991(95)00016-T / Ultramicroscopy / Energy-filtered transmission electron microscopy of SimGen superlattices and Si–Ge heterostructures: I. Experimental results by Jäger (1993)
10.1016/S0304-3991(78)80030-8 / Ultramicroscopy / About the use of electron energy-loss spectroscopy for chemical mapping of thin foils with high spatial resolution by Jeanguillaume (1978)
10.1111/j.1365-2818.1981.tb01303.x / J. Microsc. / The quantitation of electron energy-loss spectra by Joy (1981)
10.1016/0304-3991(94)90015-9 / Ultramicroscopy / Three dimensional scatter diagrams: application to surface analytical microscopy by Kenny (1994)
10.1093/oxfordjournals.jmicro.a023423 / J. Electron Microsc. / Quantitative elemental mapping of stainless steel using an imaging filter by Kimoto (1996)
10.1051/mmm:0199100202-3031500 / Microsc. Microanal. Microstr. / Developments in EELS instrumentation for spectroscopy and imaging by Krivanek (1991)
10.1051/mmm:0199200302-3018700 / Microsc. Microanal. Microstr. / Design and first applications of a post-column imaging filter by Krivanek (1991)
10.1111/j.1365-2818.1995.tb03686.x / J. Microsc. / Spatial resolution in EFTEM elemental maps by Krivanek (1995)
10.1093/oxfordjournals.jmicro.a023416 / J. Electron Microsc. / Attainable resolution of energy-selecting image using high-voltage electron microscope by Kurata (1996)
{'key': '10.1016/S0968-4328(98)00014-6_BIB25', 'first-page': '56', 'article-title': 'High-resolution imaging magnetic energy filters with simple structure', 'volume': '73', 'author': 'Lanio', 'year': '1986', 'journal-title': 'Optik'} / Optik / High-resolution imaging magnetic energy filters with simple structure by Lanio (1986)
10.1080/00107518208237087 / Contemp. Phys. / High resolution electron microscopy and microanalysis by Pennycook (1982)
10.1111/j.1365-2818.1984.tb02535.x / J. Microsc. / Optimized acquisition parameters and statistical detection limit in quantitative EELS by Pun (1984)
10.1016/0304-3991(94)90142-2 / Ultramicroscopy / Correction of aberrations, a promising means for improving the spatial resolution and energy resolution of energy-filtering electron microscopes by Rose (1994)
10.1016/0304-3991(86)90201-9 / Ultramicroscopy / Elemental imaging and resolution in energy-filtered conventional electron microscopy by Shuman (1986)
10.1111/j.1365-2818.1992.tb01529.x / J. Microsc. / A new background subtraction for low-energy EELS core edges by Tenailleau (1992)
{'key': '10.1016/S0968-4328(98)00014-6_BIB31', 'first-page': '95', 'article-title': 'An energy filter for high voltage electron microscopy', 'volume': '2', 'author': 'Zanchi', 'year': '1977', 'journal-title': 'J. Microsc. Specrosc. Electron'} / J. Microsc. Specrosc. Electron / An energy filter for high voltage electron microscopy by Zanchi (1977)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 6:49 p.m.)
Deposited	4 years, 3 months ago (May 12, 2021, 3:49 p.m.)
Indexed	11 months, 3 weeks ago (Sept. 9, 2024, 4:36 p.m.)
Issued	26 years, 11 months ago (Oct. 1, 1998)
Published	26 years, 11 months ago (Oct. 1, 1998)
Published Print	26 years, 11 months ago (Oct. 1, 1998)

Funders 0

None

BibTeX

@article{Kothleitner_1998, title={Optimization of the Signal to Noise Ratio in EFTEM Elemental Maps with Regard to Different Ionization Edge Types}, volume={29}, ISSN={0968-4328}, url={http://dx.doi.org/10.1016/s0968-4328(98)00014-6}, DOI={10.1016/s0968-4328(98)00014-6}, number={5}, journal={Micron}, publisher={Elsevier BV}, author={Kothleitner, G. and Hofer, F.}, year={1998}, month=oct, pages={349–357} }

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      ]
    ]
  }
}