DOI: 10.1016/s0968-4328(97)00032-2. Electron diffraction based techniques in scanning electron microscopy of bulk materials

Electron diffraction based techniques in scanning electron microscopy of bulk materials

10.1016/s0968-4328(97)00032-2

Crossref journal-article

Elsevier BV

Micron (78)

Bibliography

Wilkinson, A. J., & Hirsch, P. B. (1997). Electron diffraction based techniques in scanning electron microscopy of bulk materials. Micron, 28(4), 279â308.

Authors 2

Angus J. Wilkinson (first)
Peter B. Hirsch (additional)

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Dates

Type	When
Created	23 years ago (July 25, 2002, 7:57 p.m.)
Deposited	6 years, 4 months ago (April 17, 2019, 9:25 a.m.)
Indexed	2 weeks, 1 day ago (Aug. 5, 2025, 9:05 a.m.)
Issued	28 years ago (Aug. 1, 1997)
Published	28 years ago (Aug. 1, 1997)
Published Print	28 years ago (Aug. 1, 1997)

Funders 0

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BibTeX

@article{Wilkinson_1997, title={Electron diffraction based techniques in scanning electron microscopy of bulk materials}, volume={28}, ISSN={0968-4328}, url={http://dx.doi.org/10.1016/s0968-4328(97)00032-2}, DOI={10.1016/s0968-4328(97)00032-2}, number={4}, journal={Micron}, publisher={Elsevier BV}, author={Wilkinson, Angus J. and Hirsch, Peter B.}, year={1997}, month=aug, pages={279–308} }

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