DOI: 10.1016/s0960-8974(98)00005-9. Specific site cross-sectional sample preparation using focused ion beam for transmission electron microscopy

Specific site cross-sectional sample preparation using focused ion beam for transmission electron microscopy

10.1016/s0960-8974(98)00005-9

Crossref journal-article

Elsevier BV

Progress in Crystal Growth and Characterization of Materials (78)

Authors 2

David M. Schraub (first)
Raghaw S. Rai (additional)

References 22 Referenced 21

{'key': '10.1016/S0960-8974(98)00005-9_bib1', 'series-title': 'the Proceedings of the 49th Annual Meeting of Electron Microscopy Society of America', 'first-page': '828', 'author': 'Anderson', 'year': '1991'} / the Proceedings of the 49th Annual Meeting of Electron Microscopy Society of America by Anderson (1991)
{'key': '10.1016/S0960-8974(98)00005-9_bib2', 'first-page': '461', 'author': 'Oppolzer', 'year': '1985', 'journal-title': 'Inst. Phys. Conf. Ser. No. 76'} / Inst. Phys. Conf. Ser. No. 76 by Oppolzer (1985)
{'key': '10.1016/S0960-8974(98)00005-9_bib3', 'first-page': '179', 'volume': '115', 'author': 'Klepeis', 'year': '1987'} by Klepeis (1987)
10.1080/09500838708228741 / Phil Mag. Lett. by Szot (1987)
{'key': '10.1016/S0960-8974(98)00005-9_bib5', 'first-page': '141', 'volume': '254', 'author': 'Anderson', 'year': '1992'} by Anderson (1992)
{'key': '10.1016/S0960-8974(98)00005-9_bib6', 'first-page': '85', 'volume': '119', 'author': 'Alani', 'year': '1990'} by Alani (1990)
10.1016/0304-3991(87)90163-X / Ultramicroscopy by Chew (1987)
10.1002/jemt.1060010106 / J. Elect. Micro. Tech. by Bravman (1984)
10.1002/sia.740100406 / Surf. Interface Anal. by Bulle-Lieuwma (1987)
{'key': '10.1016/S0960-8974(98)00005-9_bib10', 'first-page': '121', 'volume': '254', 'author': 'Benedict', 'year': '1992'} by Benedict (1992)
{'key': '10.1016/S0960-8974(98)00005-9_bib11', 'first-page': '271', 'volume': '199', 'author': 'Young', 'year': '1990'} by Young (1990)
{'key': '10.1016/S0960-8974(98)00005-9_bib12', 'series-title': 'Proceedings of the 17th International symposium for Testing and Failure Analysis', 'first-page': '417', 'author': 'Morris', 'year': '1991'} / Proceedings of the 17th International symposium for Testing and Failure Analysis by Morris (1991)
{'key': '10.1016/S0960-8974(98)00005-9_bib13', 'first-page': '501', 'author': 'Kirk', 'year': '1989', 'journal-title': 'Inst Phys. Conf. Ser. No. 100 Section 7'} / Inst Phys. Conf. Ser. No. 100 Section 7 by Kirk (1989)
{'key': '10.1016/S0960-8974(98)00005-9_bib14', 'first-page': '23', 'volume': '254', 'author': 'Basile', 'year': '1992'} by Basile (1992)
10.1116/1.586536 / J. Vac. Sci. Technol. by Yamaguchi (1993)
10.1116/1.586537 / J. Vac. Sci Technol. by Overwijk (1993)
{'key': '10.1016/S0960-8974(98)00005-9_bib17', 'year': '1995'} (1995)
10.1116/1.585694 / J. Vac. Sci Technol. by Nikawa (1991)
10.1116/1.586415 / J. Vac. Sci. Technol by Szot (1992)
{'key': '10.1016/S0960-8974(98)00005-9_bib20', 'series-title': 'Proc. 21st International symposium for Testing and failure Analysis', 'first-page': '353', 'author': 'Leslie', 'year': '1995'} / Proc. 21st International symposium for Testing and failure Analysis by Leslie (1995)
{'key': '10.1016/S0960-8974(98)00005-9_bib21', 'first-page': '82', 'volume': '36', 'author': 'Ichinose', 'year': '1987', 'journal-title': 'J. Electron Microsc.'} / J. Electron Microsc. by Ichinose (1987)
10.1063/1.335263 / J. Appl. Phys. by Byers (1985)

Dates

Type	When
Created	23 years ago (July 25, 2002, 11:33 a.m.)
Deposited	6 years, 3 months ago (April 26, 2019, 11:26 p.m.)
Indexed	1 year, 4 months ago (April 7, 2024, 2:39 a.m.)
Issued	27 years, 7 months ago (Jan. 1, 1998)
Published	27 years, 7 months ago (Jan. 1, 1998)
Published Print	27 years, 7 months ago (Jan. 1, 1998)

Funders 0

None

BibTeX

@article{Schraub_1998, title={Specific site cross-sectional sample preparation using focused ion beam for transmission electron microscopy}, volume={36}, ISSN={0960-8974}, url={http://dx.doi.org/10.1016/s0960-8974(98)00005-9}, DOI={10.1016/s0960-8974(98)00005-9}, number={1–2}, journal={Progress in Crystal Growth and Characterization of Materials}, publisher={Elsevier BV}, author={Schraub, David M. and Rai, Raghaw S.}, year={1998}, month=jan, pages={99–122} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        4,
        7
      ]
    ],
    "date-time": "2024-04-07T06:39:21Z",
    "timestamp": 1712471961508
  },
  "reference-count": 22,
  "publisher": "Elsevier BV",
  "issue": "1-2",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            1998,
            1,
            1
          ]
        ],
        "date-time": "1998-01-01T00:00:00Z",
        "timestamp": 883612800000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1998,
        1
      ]
    ]
  },
  "DOI": "10.1016/s0960-8974(98)00005-9",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        7,
        25
      ]
    ],
    "date-time": "2002-07-25T15:33:13Z",
    "timestamp": 1027611193000
  },
  "page": "99-122",
  "source": "Crossref",
  "is-referenced-by-count": 21,
  "title": "Specific site cross-sectional sample preparation using focused ion beam for transmission electron microscopy",
  "prefix": "10.1016",
  "volume": "36",
  "author": [
    {
      "given": "David M.",
      "family": "Schraub",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "Raghaw S.",
      "family": "Rai",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib1",
      "series-title": "the Proceedings of the 49th Annual Meeting of Electron Microscopy Society of America",
      "first-page": "828",
      "author": "Anderson",
      "year": "1991"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib2",
      "first-page": "461",
      "author": "Oppolzer",
      "year": "1985",
      "journal-title": "Inst. Phys. Conf. Ser. No. 76"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib3",
      "first-page": "179",
      "volume": "115",
      "author": "Klepeis",
      "year": "1987"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib4",
      "doi-asserted-by": "crossref",
      "first-page": "109",
      "DOI": "10.1080/09500838708228741",
      "volume": "55",
      "author": "Szot",
      "year": "1987",
      "journal-title": "Phil Mag. Lett."
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib5",
      "first-page": "141",
      "volume": "254",
      "author": "Anderson",
      "year": "1992"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib6",
      "first-page": "85",
      "volume": "119",
      "author": "Alani",
      "year": "1990"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib7",
      "doi-asserted-by": "crossref",
      "first-page": "175",
      "DOI": "10.1016/0304-3991(87)90163-X",
      "volume": "23",
      "author": "Chew",
      "year": "1987",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib8",
      "doi-asserted-by": "crossref",
      "first-page": "53",
      "DOI": "10.1002/jemt.1060010106",
      "volume": "1",
      "author": "Bravman",
      "year": "1984",
      "journal-title": "J. Elect. Micro. Tech."
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib9",
      "doi-asserted-by": "crossref",
      "first-page": "210",
      "DOI": "10.1002/sia.740100406",
      "volume": "10",
      "author": "Bulle-Lieuwma",
      "year": "1987",
      "journal-title": "Surf. Interface Anal."
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib10",
      "first-page": "121",
      "volume": "254",
      "author": "Benedict",
      "year": "1992"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib11",
      "first-page": "271",
      "volume": "199",
      "author": "Young",
      "year": "1990"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib12",
      "series-title": "Proceedings of the 17th International symposium for Testing and Failure Analysis",
      "first-page": "417",
      "author": "Morris",
      "year": "1991"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib13",
      "first-page": "501",
      "author": "Kirk",
      "year": "1989",
      "journal-title": "Inst Phys. Conf. Ser. No. 100 Section 7"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib14",
      "first-page": "23",
      "volume": "254",
      "author": "Basile",
      "year": "1992"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib15",
      "doi-asserted-by": "crossref",
      "first-page": "2016",
      "DOI": "10.1116/1.586536",
      "volume": "B11",
      "author": "Yamaguchi",
      "year": "1993",
      "journal-title": "J. Vac. Sci. Technol."
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib16",
      "doi-asserted-by": "crossref",
      "first-page": "2021",
      "DOI": "10.1116/1.586537",
      "volume": "B11",
      "author": "Overwijk",
      "year": "1993",
      "journal-title": "J. Vac. Sci Technol."
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib17",
      "year": "1995"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib18",
      "doi-asserted-by": "crossref",
      "first-page": "2566",
      "DOI": "10.1116/1.585694",
      "volume": "B9",
      "author": "Nikawa",
      "year": "1991",
      "journal-title": "J. Vac. Sci Technol."
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib19",
      "doi-asserted-by": "crossref",
      "first-page": "575",
      "DOI": "10.1116/1.586415",
      "volume": "B10",
      "author": "Szot",
      "year": "1992",
      "journal-title": "J. Vac. Sci. Technol"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib20",
      "series-title": "Proc. 21st International symposium for Testing and failure Analysis",
      "first-page": "353",
      "author": "Leslie",
      "year": "1995"
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib21",
      "first-page": "82",
      "volume": "36",
      "author": "Ichinose",
      "year": "1987",
      "journal-title": "J. Electron Microsc."
    },
    {
      "key": "10.1016/S0960-8974(98)00005-9_bib22",
      "doi-asserted-by": "crossref",
      "first-page": "5240",
      "DOI": "10.1063/1.335263",
      "volume": "57",
      "author": "Byers",
      "year": "1985",
      "journal-title": "J. Appl. Phys."
    }
  ],
  "container-title": "Progress in Crystal Growth and Characterization of Materials",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0960897498000059?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0960897498000059?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2019,
        4,
        27
      ]
    ],
    "date-time": "2019-04-27T03:26:04Z",
    "timestamp": 1556335564000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0960897498000059"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1998,
        1
      ]
    ]
  },
  "references-count": 22,
  "journal-issue": {
    "issue": "1-2",
    "published-print": {
      "date-parts": [
        [
          1998,
          1
        ]
      ]
    }
  },
  "alternative-id": [
    "S0960897498000059"
  ],
  "URL": "http://dx.doi.org/10.1016/S0960-8974(98)00005-9",
  "relation": {},
  "ISSN": [
    "0960-8974"
  ],
  "subject": [],
  "container-title-short": "Progress in Crystal Growth and Characterization of Materials",
  "published": {
    "date-parts": [
      [
        1998,
        1
      ]
    ]
  }
}