DOI: 10.1016/s0927-796x(96)00197-0. Nanoscale characterization of semiconductor materials and devices using scanning probe techniques

Nanoscale characterization of semiconductor materials and devices using scanning probe techniques

10.1016/s0927-796x(96)00197-0

Crossref journal-article

Elsevier BV

Materials Science and Engineering: R: Reports (78)

Bibliography

Yu, E. T. (1996). Nanoscale characterization of semiconductor materials and devices using scanning probe techniques. Materials Science and Engineering: R: Reports, 17(4â5), 147â206.

Authors 1

Edward T. Yu (first)

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Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 8:55 a.m.)
Deposited	6 years, 4 months ago (April 29, 2019, 11 p.m.)
Indexed	4 months, 3 weeks ago (April 8, 2025, 4:03 a.m.)
Issued	28 years, 10 months ago (Nov. 1, 1996)
Published	28 years, 10 months ago (Nov. 1, 1996)
Published Print	28 years, 10 months ago (Nov. 1, 1996)

Funders 0

None

BibTeX

@article{Yu_1996, title={Nanoscale characterization of semiconductor materials and devices using scanning probe techniques}, volume={17}, ISSN={0927-796X}, url={http://dx.doi.org/10.1016/s0927-796x(96)00197-0}, DOI={10.1016/s0927-796x(96)00197-0}, number={4–5}, journal={Materials Science and Engineering: R: Reports}, publisher={Elsevier BV}, author={Yu, Edward T.}, year={1996}, month=nov, pages={147–206} }

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