Crossref
journal-article
Elsevier BV
Vibrational Spectroscopy (78)
References
9
Referenced
5
10.1103/PhysRevB.62.7365
/ Phys. Rev. B by Kasic (2000)10.1063/1.1344913
/ J. Appl. Phys. by Kasic (2001)10.1063/1.1355010
/ Appl. Phys. Lett. by Kasic (2001)- R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, North-Holland, Amsterdam, 1984.
10.1016/S0040-6090(97)00765-7
/ Thin Solid Films by Jellison (1998)- C.M. Wolfe, N. Holonyak, G.E. Stillmann, Physical Properties of Semiconductors, Prentice Hall, New Jersey, 1989.
10.1103/PhysRevB.61.8187
/ Phys. Rev. B by Schubert (2000)10.1116/1.589802
/ J. Vac. Sci. Technol. B by Tiwald (1998)10.1103/PhysRevB.61.6091
/ Phys. Rev. B by Grille (2000)
Dates
Type | When |
---|---|
Created | 22 years, 10 months ago (Oct. 15, 2002, 10:10 a.m.) |
Deposited | 6 years, 3 months ago (April 28, 2019, 11 a.m.) |
Indexed | 1 year, 9 months ago (Nov. 20, 2023, 3:03 p.m.) |
Issued | 23 years, 1 month ago (July 1, 2002) |
Published | 23 years, 1 month ago (July 1, 2002) |
Published Print | 23 years, 1 month ago (July 1, 2002) |
@article{Kasic_2002, title={Infrared spectroscopic ellipsometry—a new tool for characterization of semiconductor heterostructures}, volume={29}, ISSN={0924-2031}, url={http://dx.doi.org/10.1016/s0924-2031(01)00197-7}, DOI={10.1016/s0924-2031(01)00197-7}, number={1–2}, journal={Vibrational Spectroscopy}, publisher={Elsevier BV}, author={Kasic, A. and Schubert, M. and Einfeldt, S. and Hommel, D.}, year={2002}, month=jul, pages={121–124} }