Crossref journal-article
Elsevier BV
Vibrational Spectroscopy (78)
Bibliography

Kasic, A., Schubert, M., Einfeldt, S., & Hommel, D. (2002). Infrared spectroscopic ellipsometry—a new tool for characterization of semiconductor heterostructures. Vibrational Spectroscopy, 29(1–2), 121–124.

Authors 4
  1. A. Kasic (first)
  2. M. Schubert (additional)
  3. S. Einfeldt (additional)
  4. D. Hommel (additional)
References 9 Referenced 5
  1. 10.1103/PhysRevB.62.7365 / Phys. Rev. B by Kasic (2000)
  2. 10.1063/1.1344913 / J. Appl. Phys. by Kasic (2001)
  3. 10.1063/1.1355010 / Appl. Phys. Lett. by Kasic (2001)
  4. R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, North-Holland, Amsterdam, 1984.
  5. 10.1016/S0040-6090(97)00765-7 / Thin Solid Films by Jellison (1998)
  6. C.M. Wolfe, N. Holonyak, G.E. Stillmann, Physical Properties of Semiconductors, Prentice Hall, New Jersey, 1989.
  7. 10.1103/PhysRevB.61.8187 / Phys. Rev. B by Schubert (2000)
  8. 10.1116/1.589802 / J. Vac. Sci. Technol. B by Tiwald (1998)
  9. 10.1103/PhysRevB.61.6091 / Phys. Rev. B by Grille (2000)
Dates
Type When
Created 22 years, 10 months ago (Oct. 15, 2002, 10:10 a.m.)
Deposited 6 years, 3 months ago (April 28, 2019, 11 a.m.)
Indexed 1 year, 9 months ago (Nov. 20, 2023, 3:03 p.m.)
Issued 23 years, 1 month ago (July 1, 2002)
Published 23 years, 1 month ago (July 1, 2002)
Published Print 23 years, 1 month ago (July 1, 2002)
Funders 0

None

@article{Kasic_2002, title={Infrared spectroscopic ellipsometry—a new tool for characterization of semiconductor heterostructures}, volume={29}, ISSN={0924-2031}, url={http://dx.doi.org/10.1016/s0924-2031(01)00197-7}, DOI={10.1016/s0924-2031(01)00197-7}, number={1–2}, journal={Vibrational Spectroscopy}, publisher={Elsevier BV}, author={Kasic, A. and Schubert, M. and Einfeldt, S. and Hommel, D.}, year={2002}, month=jul, pages={121–124} }