DOI: 10.1016/s0921-5107(97)00259-6. Observation of surface potential at nanometer scale by electrostatic force microscopy (EFM) with large signals

Observation of surface potential at nanometer scale by electrostatic force microscopy (EFM) with large signals

10.1016/s0921-5107(97)00259-6

Crossref journal-article

Elsevier BV

Materials Science and Engineering: B (78)

Bibliography

Leveque, G., Bonnet, J., Tahraoui, A., & Girard, P. (1998). Observation of surface potential at nanometer scale by electrostatic force microscopy (EFM) with large signals. Materials Science and Engineering: B, 51(1â3), 197â201.

Authors 4

G Leveque (first)
J Bonnet (additional)
A Tahraoui (additional)
P Girard (additional)

References 22 Referenced 6

10.1063/1.99224 / Appl. Phys. Lett. by Martin (1988)
10.1063/1.96491 / Appl. Phys. Lett. by Muralt (1986)
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10.1116/1.588519 / J. Vac. Sci. Technol. by Khang (1996)
10.1116/1.588455 / J. Vac. Sci. Technol. by Kopanski (1996)
10.1116/1.585188 / J. Vac. Sci. Technol. by Hao (1991)
10.1049/el:19921481 / Electron. Lett. by Hou (1992)
10.1063/1.111910 / Appl. Phys. Lett. by Said (1994)
10.1116/1.588726 / J. Vac. Sci. Technol. by Bohm (1996)
10.1116/1.586477 / J. Vac. Technol. by Watanabe (1993)
10.1063/1.102096 / Appl. Phys. Lett. by Williams (1989)
10.1063/1.112462 / Appl. Phys. Lett. by Yokoyama (1994)
10.1063/1.105227 / Appl. Phys. Lett. by Nonenmacher (1991)
10.1116/1.585423 / J. Vac. Sci. Technol. by Weaver (1991)
10.1063/1.1144200 / Rev. Sci. lnstrum. by Mackel (1993)
10.1116/1.588494 / J. Vac. Sci. Technol. by Hochwitz (1996)
10.1116/1.589136 / J. Vac. Sci. Technol. by Tanimoto (1996)
J.M. Sze, Semiconductor Devices, Physics and Technology, Wiley, New York, 1985.
10.1051/jp1:1994217 / J. Phys. I France by Hudlet (1994)
10.1116/1.582595 / J. Vac. Sci. Technol. by Lassabatere (1983)
10.1116/1.585424 / J. Vac. Sci. Technol. by Weaver (1991)
10.1063/1.363884 / J. Appl. Phys. by Belaidi (1997)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 8:55 a.m.)
Deposited	6 years, 4 months ago (April 29, 2019, 11:24 p.m.)
Indexed	3 years, 5 months ago (March 29, 2022, 12:51 p.m.)
Issued	27 years, 7 months ago (Feb. 1, 1998)
Published	27 years, 7 months ago (Feb. 1, 1998)
Published Print	27 years, 7 months ago (Feb. 1, 1998)

Funders 0

None

BibTeX

@article{Leveque_1998, title={Observation of surface potential at nanometer scale by electrostatic force microscopy (EFM) with large signals}, volume={51}, ISSN={0921-5107}, url={http://dx.doi.org/10.1016/s0921-5107(97)00259-6}, DOI={10.1016/s0921-5107(97)00259-6}, number={1–3}, journal={Materials Science and Engineering: B}, publisher={Elsevier BV}, author={Leveque, G and Bonnet, J and Tahraoui, A and Girard, P}, year={1998}, month=feb, pages={197–201} }

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