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Materials Science and Engineering: A (78)
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Lang, Ch., & Schmitz, G. (2003). Microstructure-controlled interdiffusion of Cu/Co/Au thin films investigated by three-dimensional atom probe. Materials Science and Engineering: A, 353(1–2), 119–125.

Authors 2
  1. Ch. Lang (first)
  2. G. Schmitz (additional)
References 16 Referenced 16
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Dates
Type When
Created 22 years, 7 months ago (Jan. 17, 2003, 1:40 p.m.)
Deposited 6 years, 5 months ago (March 30, 2019, 6:57 a.m.)
Indexed 1 year, 11 months ago (Sept. 24, 2023, 11:07 a.m.)
Issued 22 years, 2 months ago (July 1, 2003)
Published 22 years, 2 months ago (July 1, 2003)
Published Print 22 years, 2 months ago (July 1, 2003)
Funders 0

None

@article{Lang_2003, title={Microstructure-controlled interdiffusion of Cu/Co/Au thin films investigated by three-dimensional atom probe}, volume={353}, ISSN={0921-5093}, url={http://dx.doi.org/10.1016/s0921-5093(02)00677-9}, DOI={10.1016/s0921-5093(02)00677-9}, number={1–2}, journal={Materials Science and Engineering: A}, publisher={Elsevier BV}, author={Lang, Ch. and Schmitz, G.}, year={2003}, month=jul, pages={119–125} }