Crossref journal-article
Elsevier BV
Materials Science and Engineering: A (78)
Bibliography

Hellman, O., Vandenbroucke, J., Blatz du Rivage, J., & Seidman, D. N. (2002). Application software for data analysis for three-dimensional atom probe microscopy. Materials Science and Engineering: A, 327(1), 29–33.

Authors 4
  1. Olof Hellman (first)
  2. Justin Vandenbroucke (additional)
  3. John Blatz du Rivage (additional)
  4. David N Seidman (additional)
References 11 Referenced 59
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  6. Apple Computer, AppleScript Language Guide: English Dialect, Apple Computer: Cupertino, CA, 1996.
  7. Philippe Lacroute, Marc Levoy, Proceedings of SIGGRAPH'94, Orlando, Florida, 24–29 July 1994, Computer Graphics Proceedings, Annual Conference Series, 1994, ACM SIGGRAPH, pp. 451–458. (10.1145/192161.192283)
  8. 10.1145/37402.37422 / ACM SIGGRAPH Comput. Graphics by Lorensen (1987)
  9. O. Hellman, J. Vandenbroucke, Jörg Rüsing, Dieter Isheim, David N. Seidman, Microsc. Microanal. 6 (5) (2000) 437. (10.1007/S100050010051)
  10. 10.1063/1.126545 / Appl. Phys. Lett. by Vurpillot (2000)
  11. 10.1016/S1359-6462(99)00412-1 / Scripta Mater. by Isheim (2000)
Dates
Type When
Created 22 years, 10 months ago (Oct. 14, 2002, 4:48 p.m.)
Deposited 8 months, 3 weeks ago (Dec. 3, 2024, 9:45 a.m.)
Indexed 1 month, 1 week ago (July 16, 2025, 7:48 a.m.)
Issued 23 years, 4 months ago (April 1, 2002)
Published 23 years, 4 months ago (April 1, 2002)
Published Print 23 years, 4 months ago (April 1, 2002)
Funders 0

None

@article{Hellman_2002, title={Application software for data analysis for three-dimensional atom probe microscopy}, volume={327}, ISSN={0921-5093}, url={http://dx.doi.org/10.1016/s0921-5093(01)01887-1}, DOI={10.1016/s0921-5093(01)01887-1}, number={1}, journal={Materials Science and Engineering: A}, publisher={Elsevier BV}, author={Hellman, Olof and Vandenbroucke, Justin and Blatz du Rivage, John and Seidman, David N}, year={2002}, month=apr, pages={29–33} }