Crossref
journal-article
Elsevier BV
Physica B: Condensed Matter (78)
References
12
Referenced
12
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 25, 2002, 7:24 p.m.) |
Deposited | 6 years, 4 months ago (April 18, 2019, 12:28 a.m.) |
Indexed | 1 year, 7 months ago (Feb. 3, 2024, 5:44 p.m.) |
Issued | 27 years, 3 months ago (June 1, 1998) |
Published | 27 years, 3 months ago (June 1, 1998) |
Published Print | 27 years, 3 months ago (June 1, 1998) |
@article{Howes_1998, title={An X-ray diffraction study of direct-bonded silicon interfaces: A model semiconductor grain boundary}, volume={248}, ISSN={0921-4526}, url={http://dx.doi.org/10.1016/s0921-4526(98)00206-3}, DOI={10.1016/s0921-4526(98)00206-3}, number={1–4}, journal={Physica B: Condensed Matter}, publisher={Elsevier BV}, author={Howes, P.B. and Benamara, M. and Grey, F. and Feidenhansl, R. and Nielsen, M. and Rasmussen, F.B. and Baker, J.}, year={1998}, month=jun, pages={74–78} }