DOI: 10.1016/s0920-2307(86)80001-9. Chemical and electronic structure of the SiO2/Si interface

Chemical and electronic structure of the SiO2/Si interface

10.1016/s0920-2307(86)80001-9

Crossref journal-article

Elsevier BV

Materials Science Reports (78)

Bibliography

Grunthaner, F. J., & Grunthaner, P. J. (1986). Chemical and electronic structure of the SiO2/Si interface. Materials Science Reports, 1(2), 65â160.

Authors 2

F.J. Grunthaner (first)
P.J. Grunthaner (additional)

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Dates

Type	When
Created	19 years, 10 months ago (Oct. 13, 2005, 5:45 a.m.)
Deposited	6 years, 7 months ago (Jan. 21, 2019, 12:22 p.m.)
Indexed	3 weeks, 2 days ago (Aug. 2, 2025, 1:18 a.m.)
Issued	39 years, 7 months ago (Jan. 1, 1986)
Published	39 years, 7 months ago (Jan. 1, 1986)
Published Print	39 years, 7 months ago (Jan. 1, 1986)

Funders 0

None

BibTeX

@article{Grunthaner_1986, title={Chemical and electronic structure of the SiO2/Si interface}, volume={1}, ISSN={0920-2307}, url={http://dx.doi.org/10.1016/s0920-2307(86)80001-9}, DOI={10.1016/s0920-2307(86)80001-9}, number={2}, journal={Materials Science Reports}, publisher={Elsevier BV}, author={Grunthaner, F.J. and Grunthaner, P.J.}, year={1986}, month=jan, pages={65–160} }

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