DOI: 10.1016/s0368-2048(99)00066-3. A self-modeling approach to the resolution of XPS spectra into surface and bulk components

A self-modeling approach to the resolution of XPS spectra into surface and bulk components

10.1016/s0368-2048(99)00066-3

Crossref journal-article

Elsevier BV

Journal of Electron Spectroscopy and Related Phenomena (78)

Bibliography

Simmons, G. W., Angst, D. L., & Klier, K. (1999). A self-modeling approach to the resolution of XPS spectra into surface and bulk components. Journal of Electron Spectroscopy and Related Phenomena, 105(2â3), 197â210.

Authors 3

Gary W. Simmons (first)
David L. Angst (additional)
Kamil Klier (additional)

References 22 Referenced 7

{'key': '10.1016/S0368-2048(99)00066-3_BIB1', 'article-title': 'Chemometrics: A Textbook', 'volume': 'Vol. 2', 'author': 'Massart', 'year': '1988'} / Chemometrics: A Textbook by Massart (1988)
{'key': '10.1016/S0368-2048(99)00066-3_BIB2', 'volume': 'Vol. 82', 'author': 'Sharaf', 'year': '1986'} by Sharaf (1986)
{'key': '10.1016/S0368-2048(99)00066-3_BIB3', 'series-title': 'Factor Analysis in Chemistry', 'author': 'Malinowski', 'year': '1980'} / Factor Analysis in Chemistry by Malinowski (1980)
10.1021/ac00162a020 / Anal. Chem. by Haaland (1988)
10.1021/ac00162a021 / Anal. Chem. by Haaland (1988)
10.1016/0003-2670(86)80028-9 / Anal. Chim. Acta by Geladia (1986)
10.2307/1267173 / Technometrics by Lawton (1971)
10.2307/1267665 / Technometrics by Sylvestre (1974)
10.1366/0003702824639565 / Appl. Spectros. by Gilbert (1982)
10.1016/S0021-9673(00)95266-X / J. Chromatogr. by Halket (1979)
10.1021/ac00226a031 / Anal. Chem. by Sharaf (1981)
10.1021/ac00245a009 / Anal. Chem. by Sharaf (1982)
10.1021/ac50044a030 / Anal. Chem. by Knoor (1979)
10.1021/ac60325a010 / Anal. Chem. by Ohta (1973)
10.1016/0368-2048(74)90001-2 / J. Elect. Spec. Relat. Phenom. by Fadley (1974)
{'key': '10.1016/S0368-2048(99)00066-3_BIB16', 'article-title': 'Angle-resolved X-ray Photoelectron Spectroscopy', 'volume': 'Vol. 16', 'author': 'Fadley', 'year': '1984'} / Angle-resolved X-ray Photoelectron Spectroscopy by Fadley (1984)
10.1002/sia.740020406 / Surf. and Interface Anal. by Hofmann (1980)
10.1002/sia.740060207 / Surf. and Interface Anal. by Hofmann (1984)
{'key': '10.1016/S0368-2048(99)00066-3_BIB19', 'series-title': 'Electron Spectroscopy, Theory, Techniques, and Applications', 'author': 'Brundle', 'year': '1978'} / Electron Spectroscopy, Theory, Techniques, and Applications by Brundle (1978)
10.1149/1.2086825 / J. Electrochem. Soc. by Kern (1990)
{'key': '10.1016/S0368-2048(99)00066-3_BIB21', 'series-title': 'The Colloid Chemistry of Silica and Silicates', 'author': 'Iler', 'year': '1955'} / The Colloid Chemistry of Silica and Silicates by Iler (1955)
MATLAB: The Language of Technical Computing, The Math Works, Inc., Natick, Massachusetts.

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 2:56 p.m.)
Deposited	6 years, 4 months ago (April 23, 2019, 2:25 a.m.)
Indexed	2 years ago (Aug. 20, 2023, 1:14 p.m.)
Issued	25 years, 9 months ago (Dec. 1, 1999)
Published	25 years, 9 months ago (Dec. 1, 1999)
Published Print	25 years, 9 months ago (Dec. 1, 1999)

Funders 0

None

BibTeX

@article{Simmons_1999, title={A self-modeling approach to the resolution of XPS spectra into surface and bulk components}, volume={105}, ISSN={0368-2048}, url={http://dx.doi.org/10.1016/s0368-2048(99)00066-3}, DOI={10.1016/s0368-2048(99)00066-3}, number={2–3}, journal={Journal of Electron Spectroscopy and Related Phenomena}, publisher={Elsevier BV}, author={Simmons, Gary W. and Angst, David L. and Klier, Kamil}, year={1999}, month=dec, pages={197–210} }

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