Crossref
journal-article
Elsevier BV
Journal of Magnetism and Magnetic Materials (78)
References
5
Referenced
32
10.1103/PhysRev.119.127
/ Phys. Rev. by Aharoni (1960)10.1109/20.489777
/ IEEE Trans. Magn. by Gadbois (1995)- R.H. Koch, J.G. Deak, D.W. Abraham, P.L. Trouilloud, R.A. Altman, Yu Lu, W.J. Gallagher, R.E. Scheuerlein, K.P. Roche, S.S.P. Parkin, Phys. Rev. Lett. XX (1998) YY.
10.1063/1.340320
/ J. Appl. Phys. by Mansuripur (1988)10.1143/JJAP.35.6065
/ Jpn. J. Appl. Phys. by Hayashi (1996)
Dates
Type | When |
---|---|
Created | 23 years ago (July 25, 2002, 10:05 p.m.) |
Deposited | 6 years, 4 months ago (April 14, 2019, 9:55 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 9, 2024, 6:29 p.m.) |
Issued | 25 years, 4 months ago (April 1, 2000) |
Published | 25 years, 4 months ago (April 1, 2000) |
Published Print | 25 years, 4 months ago (April 1, 2000) |
@article{Deak_2000, title={The effect of edge roughness on magnetization reversal in micron-sized permalloy thin films}, volume={213}, ISSN={0304-8853}, url={http://dx.doi.org/10.1016/s0304-8853(99)00603-4}, DOI={10.1016/s0304-8853(99)00603-4}, number={1–2}, journal={Journal of Magnetism and Magnetic Materials}, publisher={Elsevier BV}, author={Deak, J.G and Koch, R.H}, year={2000}, month=apr, pages={25–31} }