Crossref journal-article
Elsevier BV
Journal of Magnetism and Magnetic Materials (78)
Bibliography

Deak, J. G., & Koch, R. H. (2000). The effect of edge roughness on magnetization reversal in micron-sized permalloy thin films. Journal of Magnetism and Magnetic Materials, 213(1–2), 25–31.

Authors 2
  1. J.G Deak (first)
  2. R.H Koch (additional)
References 5 Referenced 32
  1. 10.1103/PhysRev.119.127 / Phys. Rev. by Aharoni (1960)
  2. 10.1109/20.489777 / IEEE Trans. Magn. by Gadbois (1995)
  3. R.H. Koch, J.G. Deak, D.W. Abraham, P.L. Trouilloud, R.A. Altman, Yu Lu, W.J. Gallagher, R.E. Scheuerlein, K.P. Roche, S.S.P. Parkin, Phys. Rev. Lett. XX (1998) YY.
  4. 10.1063/1.340320 / J. Appl. Phys. by Mansuripur (1988)
  5. 10.1143/JJAP.35.6065 / Jpn. J. Appl. Phys. by Hayashi (1996)
Dates
Type When
Created 23 years ago (July 25, 2002, 10:05 p.m.)
Deposited 6 years, 4 months ago (April 14, 2019, 9:55 p.m.)
Indexed 1 year, 6 months ago (Feb. 9, 2024, 6:29 p.m.)
Issued 25 years, 4 months ago (April 1, 2000)
Published 25 years, 4 months ago (April 1, 2000)
Published Print 25 years, 4 months ago (April 1, 2000)
Funders 0

None

@article{Deak_2000, title={The effect of edge roughness on magnetization reversal in micron-sized permalloy thin films}, volume={213}, ISSN={0304-8853}, url={http://dx.doi.org/10.1016/s0304-8853(99)00603-4}, DOI={10.1016/s0304-8853(99)00603-4}, number={1–2}, journal={Journal of Magnetism and Magnetic Materials}, publisher={Elsevier BV}, author={Deak, J.G and Koch, R.H}, year={2000}, month=apr, pages={25–31} }