DOI: 10.1016/s0304-3991(99)00055-8. Field-ion specimen preparation using focused ion-beam milling

Field-ion specimen preparation using focused ion-beam milling

10.1016/s0304-3991(99)00055-8

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Larson, D. J., Foord, D. T., Petford-Long, A. K., Liew, H., Blamire, M. G., Cerezo, A., & Smith, G. D. W. (1999). Field-ion specimen preparation using focused ion-beam milling. Ultramicroscopy, 79(1â4), 287â293.

Authors 7

D.J Larson (first)
D.T Foord (additional)
A.K Petford-Long (additional)
H Liew (additional)
M.G Blamire (additional)
A Cerezo (additional)
G.D.W Smith (additional)

References 21 Referenced 237

M.K. Miller, G.D.W. Smith, Atom Probe Microanalysis, Materials Research Society, 1989.
10.1116/1.585467 / J. Vac. Sci. Technol. B by Melmed (1991)
10.1007/BF02427178 / J. Mater. Sci. by Barber (1970)
10.1016/0042-207X(74)90009-8 / Vacuum by Walls (1974)
10.1088/0022-3735/16/7/014 / J. Phys. E by Henjered (1983)
10.1179/mst.1988.4.9.824 / Mater. Sci. Technol. by Hellsing (1988)
{'key': '10.1016/S0304-3991(99)00055-8_BIB7', 'first-page': '336', 'volume': '94/95', 'author': 'Kvist', 'year': '1995', 'journal-title': 'Appl. Surf. Sci.'} / Appl. Surf. Sci. by Kvist (1995)
{'key': '10.1016/S0304-3991(99)00055-8_BIB8', 'first-page': '271', 'volume': 'C5-6', 'author': 'Larson', 'year': '1996', 'journal-title': 'J. Phys. IV'} / J. Phys. IV by Larson (1996)
{'key': '10.1016/S0304-3991(99)00055-8_BIB9', 'first-page': '207', 'volume': '45-C9', 'author': 'Waugh', 'year': '1984', 'journal-title': 'J. Phys.'} / J. Phys. by Waugh (1984)
{'key': '10.1016/S0304-3991(99)00055-8_BIB10', 'first-page': '549', 'volume': '50-C8', 'author': 'Alexander', 'year': '1989', 'journal-title': 'J. Phys.'} / J. Phys. by Alexander (1989)
10.1016/S0304-3991(98)00058-8 / Ultramicroscopy by Larson (1998)
10.1116/1.585846 / J. Vac. Sci. Technol. B by Vasile (1991)
10.1116/1.588376 / J. Vac. Sci. Technol. B by Hopkins (1995)
10.1103/PhysRevLett.61.2472 / Phys. Rev. Lett. by Baibich (1988)
10.1016/0169-4332(93)90345-C / Appl. Surf. Sci. by Hasegawa (1993)
D.J. Larson, A.K. Petford-Long, A. Cerezo, Microsc. Microanal., G.W. Bailey, K.B. Alexander, W G. Jerome, M.G. Bond, J.J. McCarthy (Eds.), 4 (2) (1998) 112. (10.1017/S1431927600020687)
10.1063/1.122104 / Appl. Phys. Lett. by Larson (1998)
10.1088/0957-4484/10/1/010 / Nanotechnology by Larson (1999)
D.J. Larson, A.K. Petford-Long, A. Cerezo, Mater. Sci. Eng. A 270 (1999), in press. (10.1016/S0921-5093(99)00240-3)
H. Liew, G.D.W. Smith, A. Cerezo, D.J. Larson, Mater. Sci. Eng. A 270 (1999), in press. (10.1016/S0921-5093(99)00237-3)
10.1016/0956-7151(92)90472-Q / Acta Metall. by Inui (1992)

Dates

Type	When
Created	23 years ago (July 25, 2002, 9:16 p.m.)
Deposited	4 years, 3 months ago (May 13, 2021, 6:10 p.m.)
Indexed	1 month, 1 week ago (July 16, 2025, 9:13 a.m.)
Issued	25 years, 11 months ago (Sept. 1, 1999)
Published	25 years, 11 months ago (Sept. 1, 1999)
Published Print	25 years, 11 months ago (Sept. 1, 1999)

Funders 0

None

BibTeX

@article{Larson_1999, title={Field-ion specimen preparation using focused ion-beam milling}, volume={79}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(99)00055-8}, DOI={10.1016/s0304-3991(99)00055-8}, number={1–4}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Larson, D.J and Foord, D.T and Petford-Long, A.K and Liew, H and Blamire, M.G and Cerezo, A and Smith, G.D.W}, year={1999}, month=sep, pages={287–293} }

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