DOI: 10.1016/s0304-3991(97)00037-5. Height anomalies in tapping mode atomic force microscopy in air caused by adhesion

Height anomalies in tapping mode atomic force microscopy in air caused by adhesion

10.1016/s0304-3991(97)00037-5

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Van Noort, S. J. T., Van der Werf, K. O., De Grooth, B. G., Van Hulst, N. F., & Greve, J. (1997). Height anomalies in tapping mode atomic force microscopy in air caused by adhesion. Ultramicroscopy, 69(2), 117â127.

Authors 5

S.John T. Van Noort (first)
Kees O. Van der Werf (additional)
Bart G. De Grooth (additional)
Niek F. Van Hulst (additional)
Jan Greve (additional)

References 21 Referenced 126

10.1116/1.589105 / J. Vac. Sci. Technol. B by Hansma (1996)
10.1016/S0006-3495(96)79713-8 / Biophys. J. by Schabert (1996)
10.1002/j.1460-2075.1995.tb06981.x / EMBO J. by Wyman (1995)
10.1021/la00009a040 / Langmuir by Fritz (1995)
10.1088/0957-4484/5/4/003 / Nanotechnology by Chen (1994)
10.1088/0957-4484/6/2/002 / Nanotechnology by Spatz (1995)
10.1016/S0006-3495(93)81433-4 / Biophys. J. by Radmacher (1993)
10.1103/PhysRevLett.74.5092 / Phys. Rev. Lett. by Burnham (1995)
10.1021/la960189l / Langmuir by Tamayo (1996)
M. Amrein, Institut für Medizinische Physik und Biophysk, Universität Münster, personal communications.
10.1063/1.347347 / J. Appl. Phys. by Albrecht (1991)
S.N. Magonov, M. Allen, Application note Digital Instruments, Inc.
10.1016/S0032-3861(96)00513-7 / Polymer by Magonov (1997)
10.1063/1.1144378 / J. Greve, Rev. Sci. Instr. by Van der Werf (1993)
10.1116/1.577700 / J. Vac. Sci. Technol. A by Thundat (1992)
10.1016/0304-3991(92)90430-R / Ultramicroscopy by Vesenka (1992)
10.1002/sca.1996.4950180504 / Scanning by Yang (1995)
10.1116/1.587272 / J. Vac. Sci. Technol. B by Anselmetti (1994)
10.1016/0022-460X(91)90592-8 / J. Sound Vib. B by Nordmark (1991)
10.1103/PhysRevLett.76.3951 / Phys. Rev. Lett. by De Weger (1996)
10.1063/1.112106 / Appl. Phys. Lett. by Van der Werf (1994)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 8:20 a.m.)
Deposited	5 years, 7 months ago (Jan. 10, 2020, 8:22 p.m.)
Indexed	1 year ago (Aug. 24, 2024, 3:48 a.m.)
Issued	28 years ago (Sept. 1, 1997)
Published	28 years ago (Sept. 1, 1997)
Published Print	28 years ago (Sept. 1, 1997)

Funders 0

None

BibTeX

@article{Van_Noort_1997, title={Height anomalies in tapping mode atomic force microscopy in air caused by adhesion}, volume={69}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(97)00037-5}, DOI={10.1016/s0304-3991(97)00037-5}, number={2}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Van Noort, S.John T. and Van der Werf, Kees O. and De Grooth, Bart G. and Van Hulst, Niek F. and Greve, Jan}, year={1997}, month=sep, pages={117–127} }

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