Crossref
journal-article
Elsevier BV
Ultramicroscopy (78)
References
36
Referenced
51
10.1046/j.1365-2818.1998.00376.x
/ J. Microsc. by Varlot (1998)10.1016/0304-3991(94)00178-P
/ Ultramicroscopy by Hunt (1995)10.1093/oxfordjournals.jmicro.a023806
/ J. Microsc. by Batson (2000)10.1093/jmicro/51.Supplement.S97
/ J. Electron Microsc. by Reed (2002)- S. Takeda, M. Terauchi, M. Tanaka, M. Kohyama, Electron Microscopy 1994, Proceedings of the 13th International Congress on Electron Microscopy, Paris, Vol. 3, p. 567.
10.1016/S0304-3991(00)00121-2
/ Ultramicroscopy by van Benthem (2001)10.1016/0368-2048(93)01857-B
/ J. Electron Spectrosc. Relat. Phenom. by Fink (1994)-
C. Mitterbauer, G. Kothleitner, H. Zandbergen, B. Freitag, P. Tiemeijer, F. Hofer, in these Proceedings (SALSA 2002), Ultramicroscopy 96 (3–4) (2003).
(
10.1016/S0304-3991(03)00109-8
) 10.1016/S0304-3991(00)00127-3
/ Ultramicroscopy by Mizoguchi (2001)10.1016/S0304-3991(99)00030-3
/ Ultramicroscopy by Rez (1999)- M. Disko, C.C. Ahn, B. Fultz (Eds.) Transmission Electron Energy Loss Spectroscopy in Materials Science, Minerals Materials Society, Pittsburgh, PA, 1992.
10.1016/S0304-3991(78)80011-4
/ Ultramicroscopy by Hainfeld (1978)10.1093/oxfordjournals.jmicro.a023852
/ J. Electron Microsc. by Davis (2000)10.1016/S0968-4328(97)00047-4
/ Micron by Diociaiuti (1997)10.1016/S0304-3991(00)00128-5
/ Ultramicroscopy by Muller (2001){'key': '10.1016/S0304-3991(03)00102-5_BIB16', 'first-page': '191', 'volume': '161', 'author': 'iemeijer', 'year': '1999', 'journal-title': 'Inst. Phys. Conf. Ser.'}
/ Inst. Phys. Conf. Ser. by iemeijer (1999)- F. Kahl, Ph.D. Thesis, TU-Darmstadt, Germany, 1999.
10.1016/S0304-3991(99)00034-0
/ Ultramicroscopy by Mook (1999)- N.K. Menon, J.A. Hunt, submitted for publication.
10.1016/S0304-3991(99)00027-3
/ Ultramicroscopy by Tiemeijer (1999)10.1016/S0968-4328(97)00075-9
/ Micron by Gubbens (1998){'key': '10.1016/S0304-3991(03)00102-5_BIB22', 'first-page': '163', 'volume': '96', 'author': 'Uhlemann', 'year': '1994', 'journal-title': 'Optik'}
/ Optik by Uhlemann (1994)10.1063/1.1147797
/ Rev. Sci. Instrum. by Tsuno (1997){'issue': '1', 'key': '10.1016/S0304-3991(03)00102-5_BIB24', 'first-page': '490b', 'volume': '82', 'author': 'Mooney', 'year': '2002', 'journal-title': 'Biophys. J.'}
/ Biophys. J. by Mooney (2002)- G.C. Holst, Sampling, Aliasing and Data Fidelity, SPIE Optical Engineering Press, Bellingham and JCD Publishing, Winter Park, 1998.
- M.K. Kundmann, J.A. Hunt, H.A. Brink, Automated set up of an energy filtering transmission electron microscope, United States Patent 6,184,524, 2001.
10.1016/S0968-4328(97)00048-6
/ Micron by Golla (1997)10.1016/S0968-4328(97)00037-1
/ Micron by Mayer (1997)- F. Tichelaar, Delft University of Technology, personal communication.
-
R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd Edition, Plenum Press, New York, London, 1996.
(
10.1007/978-1-4757-5099-7
) 10.1016/S0304-3991(01)00123-1
/ Ultramicroscopy by Alexandrou (2001)10.1016/S0304-3991(01)00070-5
/ Ultramicroscopy by Schamm (2001)-
P.C. Tiemeijer, J.H.A. van Lin, B.H. Freitag, A.F. de Jong, Microscopy and Microanalysis 2002, Proceedings Quebec City, Vol. 8, No. 2, 2002, p. 70.
(
10.1017/S143192760210184X
) - H.W. Zandbergen, F.D. Tichelaar, M.-Y. Wu, J.H. Chen, Abstracts for Strategies and Advances in Atomic Level Spectroscopy and Analysis Conference Guadeloupe, 2002, p. 21.
10.1017/S1431927602020111
/ Microsc. Microanal. by Menon (2002)- O.L. Krivanek, Proceedings of EUREM-11 Dublin 1996V. (1), Committee of European Societies of Microscopy, Brussels, 1998, p. 200.
Dates
Type | When |
---|---|
Created | 22 years, 3 months ago (May 27, 2003, 11:03 p.m.) |
Deposited | 5 years, 5 months ago (March 20, 2020, 8:32 a.m.) |
Indexed | 1 year, 2 months ago (June 16, 2024, 10:33 a.m.) |
Issued | 22 years ago (Sept. 1, 2003) |
Published | 22 years ago (Sept. 1, 2003) |
Published Print | 22 years ago (Sept. 1, 2003) |
@article{Brink_2003, title={A sub-50meV spectrometer and energy filter for use in combination with 200kV monochromated (S)TEMs}, volume={96}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(03)00102-5}, DOI={10.1016/s0304-3991(03)00102-5}, number={3–4}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Brink, H.A. and Barfels, M.M.G. and Burgner, R.P. and Edwards, B.N.}, year={2003}, month=sep, pages={367–384} }