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Ultramicroscopy (78)
Bibliography

Brink, H. A., Barfels, M. M. G., Burgner, R. P., & Edwards, B. N. (2003). A sub-50meV spectrometer and energy filter for use in combination with 200kV monochromated (S)TEMs. Ultramicroscopy, 96(3–4), 367–384.

Authors 4
  1. H.A. Brink (first)
  2. M.M.G. Barfels (additional)
  3. R.P. Burgner (additional)
  4. B.N. Edwards (additional)
References 36 Referenced 51
  1. 10.1046/j.1365-2818.1998.00376.x / J. Microsc. by Varlot (1998)
  2. 10.1016/0304-3991(94)00178-P / Ultramicroscopy by Hunt (1995)
  3. 10.1093/oxfordjournals.jmicro.a023806 / J. Microsc. by Batson (2000)
  4. 10.1093/jmicro/51.Supplement.S97 / J. Electron Microsc. by Reed (2002)
  5. S. Takeda, M. Terauchi, M. Tanaka, M. Kohyama, Electron Microscopy 1994, Proceedings of the 13th International Congress on Electron Microscopy, Paris, Vol. 3, p. 567.
  6. 10.1016/S0304-3991(00)00121-2 / Ultramicroscopy by van Benthem (2001)
  7. 10.1016/0368-2048(93)01857-B / J. Electron Spectrosc. Relat. Phenom. by Fink (1994)
  8. C. Mitterbauer, G. Kothleitner, H. Zandbergen, B. Freitag, P. Tiemeijer, F. Hofer, in these Proceedings (SALSA 2002), Ultramicroscopy 96 (3–4) (2003). (10.1016/S0304-3991(03)00109-8)
  9. 10.1016/S0304-3991(00)00127-3 / Ultramicroscopy by Mizoguchi (2001)
  10. 10.1016/S0304-3991(99)00030-3 / Ultramicroscopy by Rez (1999)
  11. M. Disko, C.C. Ahn, B. Fultz (Eds.) Transmission Electron Energy Loss Spectroscopy in Materials Science, Minerals Materials Society, Pittsburgh, PA, 1992.
  12. 10.1016/S0304-3991(78)80011-4 / Ultramicroscopy by Hainfeld (1978)
  13. 10.1093/oxfordjournals.jmicro.a023852 / J. Electron Microsc. by Davis (2000)
  14. 10.1016/S0968-4328(97)00047-4 / Micron by Diociaiuti (1997)
  15. 10.1016/S0304-3991(00)00128-5 / Ultramicroscopy by Muller (2001)
  16. {'key': '10.1016/S0304-3991(03)00102-5_BIB16', 'first-page': '191', 'volume': '161', 'author': 'iemeijer', 'year': '1999', 'journal-title': 'Inst. Phys. Conf. Ser.'} / Inst. Phys. Conf. Ser. by iemeijer (1999)
  17. F. Kahl, Ph.D. Thesis, TU-Darmstadt, Germany, 1999.
  18. 10.1016/S0304-3991(99)00034-0 / Ultramicroscopy by Mook (1999)
  19. N.K. Menon, J.A. Hunt, submitted for publication.
  20. 10.1016/S0304-3991(99)00027-3 / Ultramicroscopy by Tiemeijer (1999)
  21. 10.1016/S0968-4328(97)00075-9 / Micron by Gubbens (1998)
  22. {'key': '10.1016/S0304-3991(03)00102-5_BIB22', 'first-page': '163', 'volume': '96', 'author': 'Uhlemann', 'year': '1994', 'journal-title': 'Optik'} / Optik by Uhlemann (1994)
  23. 10.1063/1.1147797 / Rev. Sci. Instrum. by Tsuno (1997)
  24. {'issue': '1', 'key': '10.1016/S0304-3991(03)00102-5_BIB24', 'first-page': '490b', 'volume': '82', 'author': 'Mooney', 'year': '2002', 'journal-title': 'Biophys. J.'} / Biophys. J. by Mooney (2002)
  25. G.C. Holst, Sampling, Aliasing and Data Fidelity, SPIE Optical Engineering Press, Bellingham and JCD Publishing, Winter Park, 1998.
  26. M.K. Kundmann, J.A. Hunt, H.A. Brink, Automated set up of an energy filtering transmission electron microscope, United States Patent 6,184,524, 2001.
  27. 10.1016/S0968-4328(97)00048-6 / Micron by Golla (1997)
  28. 10.1016/S0968-4328(97)00037-1 / Micron by Mayer (1997)
  29. F. Tichelaar, Delft University of Technology, personal communication.
  30. R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd Edition, Plenum Press, New York, London, 1996. (10.1007/978-1-4757-5099-7)
  31. 10.1016/S0304-3991(01)00123-1 / Ultramicroscopy by Alexandrou (2001)
  32. 10.1016/S0304-3991(01)00070-5 / Ultramicroscopy by Schamm (2001)
  33. P.C. Tiemeijer, J.H.A. van Lin, B.H. Freitag, A.F. de Jong, Microscopy and Microanalysis 2002, Proceedings Quebec City, Vol. 8, No. 2, 2002, p. 70. (10.1017/S143192760210184X)
  34. H.W. Zandbergen, F.D. Tichelaar, M.-Y. Wu, J.H. Chen, Abstracts for Strategies and Advances in Atomic Level Spectroscopy and Analysis Conference Guadeloupe, 2002, p. 21.
  35. 10.1017/S1431927602020111 / Microsc. Microanal. by Menon (2002)
  36. O.L. Krivanek, Proceedings of EUREM-11 Dublin 1996V. (1), Committee of European Societies of Microscopy, Brussels, 1998, p. 200.
Dates
Type When
Created 22 years, 3 months ago (May 27, 2003, 11:03 p.m.)
Deposited 5 years, 5 months ago (March 20, 2020, 8:32 a.m.)
Indexed 1 year, 2 months ago (June 16, 2024, 10:33 a.m.)
Issued 22 years ago (Sept. 1, 2003)
Published 22 years ago (Sept. 1, 2003)
Published Print 22 years ago (Sept. 1, 2003)
Funders 0

None

@article{Brink_2003, title={A sub-50meV spectrometer and energy filter for use in combination with 200kV monochromated (S)TEMs}, volume={96}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(03)00102-5}, DOI={10.1016/s0304-3991(03)00102-5}, number={3–4}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Brink, H.A. and Barfels, M.M.G. and Burgner, R.P. and Edwards, B.N.}, year={2003}, month=sep, pages={367–384} }