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journal-article
Elsevier BV
Ultramicroscopy (78)
References
36
Referenced
81
-
L.J. Allen, S.D. Findlay, M.P. Oxley, C.J. Rossouw, preceding article in this issue, Ultramicroscopy 96 (2003).
(
10.1016/S0304-3991(02)00380-7
) 10.1107/S0108767388006403
/ Acta Crystallogr. A by Loane (1988)10.1016/S0304-3991(97)00041-7
/ Ultramicroscopy by Anderson (1997)10.1016/0304-3991(93)90209-G
/ Ultramicroscopy by Hillyard (1993)10.1016/0304-3991(91)90004-P
/ Ultramicroscopy by Pennycook (1990)10.1016/S0304-3991(99)00017-0
/ Ultramicroscopy by Nellist (1999)10.1016/S1076-5670(00)80013-0
/ Adv. Imaging Electron Phys. by Nellist (2000)10.1093/oxfordjournals.jmicro.a023868
/ J. Electron Microsc. by Yamazaki (2000)10.1103/PhysRevB.61.13833
/ Phys. Rev. B by Yamazaki (2000)10.1103/PhysRevB.63.085316
/ Phys. Rev. B by Watanabe (2000)- P. Rez, private communication, 2001.
10.1103/PhysRevB.53.11285
/ Phys. Rev. B by Allen (1996)10.1107/S0108767391000375
/ Acta Crystallogr. A by Loane (1991)10.1016/0304-3991(92)90054-N
/ Ultramicroscopy by Loane (1992)10.1088/0034-4885/42/11/002
/ Rep. Prog. Phys. by Humphreys (1979)10.1107/S0108767398003560
/ Acta Crystallogr. A by Allen (1998)10.1107/S0108767399014798
/ Acta. Crystallogr. A by Allen (2000)10.1017/S1431927697970021
/ Microsc. Microanal. by Amali (1997)10.1103/PhysRevB.64.115432
/ Phys. Rev. B by Watanabe (2001)- P.G. Self, O'Keefe, in: P.R. Buseck, J.M. Cowley, L. Eyring (Eds.), High-Resolution Transmission Electron Microscopy, Oxford University Press, Oxford, 1988, pp. 244–307.
- G. Kästner, Many Beam Electron Diffraction Related to Electron Microscope Diffraction Contrast Akademie Verlag, Berlin, 1993, pp. 9–19.
10.1063/1.1652901
/ Appl. Phys. Lett. by Cowley (1969)-
Z.L. Wang, Elastic and Inelastic Scattering in Electron Diffraction and Imaging, Plenum Press, New York, London, 1995, pp. 241–246.
(
10.1007/978-1-4899-1579-5_9
) -
E.J. Kirkland, Advanced Computing in Electron Microscopy, Plenum Press, New York, London, 1998, pp. 14–16.
(
10.1007/978-1-4757-4406-4
) 10.1107/S0567739468000136
/ Acta Crystallogr. A by Pogany (1968)- W.H. Press, S.A. Teukolsky, W.T. Vetterling, B.P. Flannery, Numerical Recipes in FORTRAN, 2nd Edition, Cambridge University Press, Cambridge, 1992, pp. 449–489.
{'key': '10.1016/S0304-3991(02)00381-9_BIB27', 'first-page': '129', 'volume': '50', 'author': 'Spence', 'year': '1978', 'journal-title': 'Optik'}
/ Optik by Spence (1978)10.1093/jmicro/50.4.291
/ J. Electron Microsc. by Ishizuka (2001)10.1016/S0304-3991(01)00145-0
/ Ultramicroscopy by Ishizuka (2002)10.1103/PhysRevB.39.8313
/ Phys. Rev. B by Allen (1989)10.1016/0304-3991(94)00195-S
/ Ultramicroscopy by Rossouw (1995)10.1103/PhysRevB.52.3184
/ Phys. Rev. B by Allen (1995)10.1016/S0968-4328(96)00050-9
/ Micron by Rossouw (1997)10.1107/S0567739478000182
/ Acta Crystallogr. A by Fields (1978)10.1107/S0567739479000061
/ Acta Crystallogr. A by Cowley (1979)10.1016/S0927-796X(99)00005-4
/ Mater. Sci. Eng. by Spence (1999)
Dates
Type | When |
---|---|
Created | 22 years, 5 months ago (March 4, 2003, 7:47 a.m.) |
Deposited | 5 years, 5 months ago (March 11, 2020, 9:24 p.m.) |
Indexed | 3 months, 1 week ago (May 21, 2025, 4:47 p.m.) |
Issued | 22 years, 1 month ago (July 1, 2003) |
Published | 22 years, 1 month ago (July 1, 2003) |
Published Print | 22 years, 1 month ago (July 1, 2003) |
@article{Findlay_2003, title={Lattice-resolution contrast from a focused coherent electron probe. Part II}, volume={96}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(02)00381-9}, DOI={10.1016/s0304-3991(02)00381-9}, number={1}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Findlay, S.D. and Allen, L.J. and Oxley, M.P. and Rossouw, C.J.}, year={2003}, month=jul, pages={65–81} }