DOI: 10.1016/s0304-3991(02)00291-7. A novel STM-assisted microwave microscope with capacitance and loss imaging capability

A novel STM-assisted microwave microscope with capacitance and loss imaging capability

10.1016/s0304-3991(02)00291-7

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Imtiaz, A., & Anlage, S. M. (2003). A novel STM-assisted microwave microscope with capacitance and loss imaging capability. Ultramicroscopy, 94(3â4), 209â216.

Authors 2

Atif Imtiaz (first)
Steven M. Anlage (additional)

References 28 Referenced 57

10.1063/1.334506 / J. Appl. Phys. by Matey (1985)
10.1063/1.349388 / J. Appl. Phys. by Barrett (1991)
10.1063/1.102096 / Appl. Phys. Lett. by Williams (1989)
10.1063/1.1144738 / Rev. Sci. Instrum. by Lanyi (1994)
10.1116/1.589169 / J. Vac. Sci. Technol. B by Lanyi (1996)
10.1063/1.112788 / Appl. Phys. Lett. by -P. Bourgoin (1994)
{'key': '10.1016/S0304-3991(02)00291-7_BIB7', 'first-page': '379', 'volume': '42–44', 'author': 'Seifert', 'year': '1991', 'journal-title': 'Ultramicroscopy'} / Ultramicroscopy by Seifert (1991)
10.1116/1.589808 / J. Vac. Sci. Technol. B by McMurray (1998)
10.1016/S0921-5107(96)01797-7 / Mater. Sci. Eng. B by Kopanski (1997)
10.1126/science.283.5410.2034 / Science by Moreo (1999)
10.1103/PhysRevLett.84.147 / Phys. Rev. Lett. by Cren (2000)
10.1063/1.120918 / Appl. Phys. Lett. by Steinhauer (1998)
10.1063/1.123940 / Appl. Phys. Lett. by Duewer (1999)
10.1063/1.1144921 / Rev. Sci. Instrum. by Stranick (1994)
10.1063/1.119255 / Appl. Phys. Lett. by Knoll (1997)
10.1063/1.118272 / Appl. Phys. Lett. by van der Weide (1997)
10.1063/1.125165 / Appl. Phys. Lett. by Cho (1999)
{'key': '10.1016/S0304-3991(02)00291-7_BIB18', 'first-page': '3810', 'volume': '39', 'author': 'Odagawa', 'year': '2000', 'journal-title': 'Jpn. J. Appl. Phys.'} / Jpn. J. Appl. Phys. by Odagawa (2000)
10.1063/1.125270 / Appl. Phys. Lett. by Steinhauer (1999)
10.1063/1.118033 / Appl. Phys. Lett. by Vlahacos (1996)
D.E. Steinhauer, Quantitative imaging of sheet resistance, permittivity, and ferroelectric critical phenomena with a near field scanning microwave microscope, Ph.D Thesis, University of Maryland, 2000 (Chapter 3).
{'key': '10.1016/S0304-3991(02)00291-7_BIB22', 'first-page': '2751', 'volume': '71', 'author': 'Steinhauer', 'year': '2000', 'journal-title': 'Appl. Phys. Lett.'} / Appl. Phys. Lett. by Steinhauer (2000)
10.1063/1.1337600 / J. Appl. Phys. by Steinhauer (2001)
10.1063/1.125216 / Appl. Phys. Lett. by Gao (1999)
10.1103/PhysRevB.61.9665 / Phys. Rev. B. by Biswas (2000)
S.M. Sze, Physics of Semiconductor Devices, Wiley, New York 1969, p. 43.
Sheng-Chiang Lee, S.M. Anlage, Study of local nonlinear properties using a near-field microwave microscope, IEEE Trans. Appl. Supercond., 2003. (10.1109/TASC.2003.812406)
Sheng-Chiang Lee, S.M. Anlage, Spatially resolved nonlinearity measurements of YBa2Cu3O7−δ Bi-crystal grain boundaries, Appl. Phys. Lett., 2002, submitted.

Dates

Type	When
Created	22 years, 7 months ago (Jan. 17, 2003, 3:54 p.m.)
Deposited	5 years, 5 months ago (March 9, 2020, 2:16 p.m.)
Indexed	2 weeks, 5 days ago (Aug. 6, 2025, 9:39 a.m.)
Issued	22 years, 4 months ago (April 1, 2003)
Published	22 years, 4 months ago (April 1, 2003)
Published Print	22 years, 4 months ago (April 1, 2003)

Funders 0

None

BibTeX

@article{Imtiaz_2003, title={A novel STM-assisted microwave microscope with capacitance and loss imaging capability}, volume={94}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(02)00291-7}, DOI={10.1016/s0304-3991(02)00291-7}, number={3–4}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Imtiaz, Atif and Anlage, Steven M.}, year={2003}, month=apr, pages={209–216} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        8,
        6
      ]
    ],
    "date-time": "2025-08-06T13:39:39Z",
    "timestamp": 1754487579258
  },
  "reference-count": 28,
  "publisher": "Elsevier BV",
  "issue": "3-4",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2003,
            4,
            1
          ]
        ],
        "date-time": "2003-04-01T00:00:00Z",
        "timestamp": 1049155200000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2003,
        4
      ]
    ]
  },
  "DOI": "10.1016/s0304-3991(02)00291-7",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2003,
        1,
        17
      ]
    ],
    "date-time": "2003-01-17T20:54:46Z",
    "timestamp": 1042836886000
  },
  "page": "209-216",
  "source": "Crossref",
  "is-referenced-by-count": 57,
  "title": "A novel STM-assisted microwave microscope with capacitance and loss imaging capability",
  "prefix": "10.1016",
  "volume": "94",
  "author": [
    {
      "given": "Atif",
      "family": "Imtiaz",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "Steven M.",
      "family": "Anlage",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB1",
      "doi-asserted-by": "crossref",
      "first-page": "1437",
      "DOI": "10.1063/1.334506",
      "volume": "57",
      "author": "Matey",
      "year": "1985",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB2",
      "doi-asserted-by": "crossref",
      "first-page": "2725",
      "DOI": "10.1063/1.349388",
      "volume": "70",
      "author": "Barrett",
      "year": "1991",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB3",
      "doi-asserted-by": "crossref",
      "first-page": "203",
      "DOI": "10.1063/1.102096",
      "volume": "55",
      "author": "Williams",
      "year": "1989",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB4",
      "doi-asserted-by": "crossref",
      "first-page": "2258",
      "DOI": "10.1063/1.1144738",
      "volume": "65",
      "author": "Lanyi",
      "year": "1994",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB5",
      "doi-asserted-by": "crossref",
      "first-page": "892",
      "DOI": "10.1116/1.589169",
      "volume": "14",
      "author": "Lanyi",
      "year": "1996",
      "journal-title": "J. Vac. Sci. Technol. B"
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB6",
      "doi-asserted-by": "crossref",
      "first-page": "2045",
      "DOI": "10.1063/1.112788",
      "volume": "65",
      "author": "-P. Bourgoin",
      "year": "1994",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB7",
      "first-page": "379",
      "volume": "42\u201344",
      "author": "Seifert",
      "year": "1991",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB8",
      "doi-asserted-by": "crossref",
      "first-page": "344",
      "DOI": "10.1116/1.589808",
      "volume": "16",
      "author": "McMurray",
      "year": "1998",
      "journal-title": "J. Vac. Sci. Technol. B"
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB9",
      "doi-asserted-by": "crossref",
      "first-page": "46",
      "DOI": "10.1016/S0921-5107(96)01797-7",
      "volume": "44",
      "author": "Kopanski",
      "year": "1997",
      "journal-title": "Mater. Sci. Eng. B"
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB10",
      "doi-asserted-by": "crossref",
      "first-page": "2034",
      "DOI": "10.1126/science.283.5410.2034",
      "volume": "283",
      "author": "Moreo",
      "year": "1999",
      "journal-title": "Science"
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB11",
      "doi-asserted-by": "crossref",
      "first-page": "147",
      "DOI": "10.1103/PhysRevLett.84.147",
      "volume": "84",
      "author": "Cren",
      "year": "2000",
      "journal-title": "Phys. Rev. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB12",
      "doi-asserted-by": "crossref",
      "first-page": "861",
      "DOI": "10.1063/1.120918",
      "volume": "72",
      "author": "Steinhauer",
      "year": "1998",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB13",
      "doi-asserted-by": "crossref",
      "first-page": "2696",
      "DOI": "10.1063/1.123940",
      "volume": "74",
      "author": "Duewer",
      "year": "1999",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB14",
      "doi-asserted-by": "crossref",
      "first-page": "918",
      "DOI": "10.1063/1.1144921",
      "volume": "65",
      "author": "Stranick",
      "year": "1994",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB15",
      "doi-asserted-by": "crossref",
      "first-page": "2667",
      "DOI": "10.1063/1.119255",
      "volume": "70",
      "author": "Knoll",
      "year": "1997",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB16",
      "doi-asserted-by": "crossref",
      "first-page": "677",
      "DOI": "10.1063/1.118272",
      "volume": "70",
      "author": "van der Weide",
      "year": "1997",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB17",
      "doi-asserted-by": "crossref",
      "first-page": "2833",
      "DOI": "10.1063/1.125165",
      "volume": "75",
      "author": "Cho",
      "year": "1999",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB18",
      "first-page": "3810",
      "volume": "39",
      "author": "Odagawa",
      "year": "2000",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB19",
      "doi-asserted-by": "crossref",
      "first-page": "3180",
      "DOI": "10.1063/1.125270",
      "volume": "75",
      "author": "Steinhauer",
      "year": "1999",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB20",
      "doi-asserted-by": "crossref",
      "first-page": "3272",
      "DOI": "10.1063/1.118033",
      "volume": "69",
      "author": "Vlahacos",
      "year": "1996",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB21",
      "unstructured": "D.E. Steinhauer, Quantitative imaging of sheet resistance, permittivity, and ferroelectric critical phenomena with a near field scanning microwave microscope, Ph.D Thesis, University of Maryland, 2000 (Chapter 3)."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB22",
      "first-page": "2751",
      "volume": "71",
      "author": "Steinhauer",
      "year": "2000",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB23",
      "doi-asserted-by": "crossref",
      "first-page": "2314",
      "DOI": "10.1063/1.1337600",
      "volume": "89",
      "author": "Steinhauer",
      "year": "2001",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB24",
      "doi-asserted-by": "crossref",
      "first-page": "3005",
      "DOI": "10.1063/1.125216",
      "volume": "75",
      "author": "Gao",
      "year": "1999",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB25",
      "doi-asserted-by": "crossref",
      "first-page": "9665",
      "DOI": "10.1103/PhysRevB.61.9665",
      "volume": "61",
      "author": "Biswas",
      "year": "2000",
      "journal-title": "Phys. Rev. B."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB26",
      "unstructured": "S.M. Sze, Physics of Semiconductor Devices, Wiley, New York 1969, p. 43."
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB27",
      "doi-asserted-by": "crossref",
      "unstructured": "Sheng-Chiang Lee, S.M. Anlage, Study of local nonlinear properties using a near-field microwave microscope, IEEE Trans. Appl. Supercond., 2003.",
      "DOI": "10.1109/TASC.2003.812406"
    },
    {
      "key": "10.1016/S0304-3991(02)00291-7_BIB28",
      "unstructured": "Sheng-Chiang Lee, S.M. Anlage, Spatially resolved nonlinearity measurements of YBa2Cu3O7\u2212\u03b4 Bi-crystal grain boundaries, Appl. Phys. Lett., 2002, submitted."
    }
  ],
  "container-title": "Ultramicroscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399102002917?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399102002917?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2020,
        3,
        9
      ]
    ],
    "date-time": "2020-03-09T18:16:37Z",
    "timestamp": 1583777797000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0304399102002917"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2003,
        4
      ]
    ]
  },
  "references-count": 28,
  "journal-issue": {
    "issue": "3-4",
    "published-print": {
      "date-parts": [
        [
          2003,
          4
        ]
      ]
    }
  },
  "alternative-id": [
    "S0304399102002917"
  ],
  "URL": "http://dx.doi.org/10.1016/S0304-3991(02)00291-7",
  "relation": {},
  "ISSN": [
    "0304-3991"
  ],
  "subject": [],
  "container-title-short": "Ultramicroscopy",
  "published": {
    "date-parts": [
      [
        2003,
        4
      ]
    ]
  }
}