DOI: 10.1016/s0304-3991(02)00193-6. A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils

A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils

10.1016/s0304-3991(02)00193-6

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Hutchinson, C. R., Hackenberg, R. E., & Shiflet, G. J. (2003). A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils. Ultramicroscopy, 94(1), 37â48.

Authors 3

C.R Hutchinson (first)
R.E Hackenberg (additional)
G.J Shiflet (additional)

References 28 Referenced 32

10.1002/sia.740230204 / Surf. Interface Anal. by Stevie (1995)
E.C.G. Kirk, D.A. Williams, H. Ahmed, in: Proceedings of the Sixth Microscopy of Semiconducting Materials Conference, Institute of Physics Conference Series, No. 100: Section 7, 1986, pp. 501.
R.J. Young, E.C.G. Kirk, D.A. Williams, H. Ahmed, in: R. Anderson (Ed.), Specimen Preparation for Transmission Electron Microscopy of Materials-II, Materials Research Society Symposium Proceedings, Vol. 199, San Fransisco, CA, 1990, pp. 205.
S. Morris, S. Tatti, E. Black, N. Dickson, H. Mendez, B. Schwiesow, R. Pyle, in: Proceedings of the 17th International Symposium for Testing and Failure Analysis, Los Angeles, CA, 1991, pp. 417.
{'key': '10.1016/S0304-3991(02)00193-6_BIB5', 'first-page': '23', 'volume': '253', 'author': 'Basile', 'year': '1992', 'journal-title': 'Mater. Res. Soc. Symp. Proc.'} / Mater. Res. Soc. Symp. Proc. by Basile (1992)
10.1116/1.586537 / J. Vac. Sci. Technol. B by Overwijk (1993)
10.1116/1.586536 / J. Vac. Sci. Technol. B by Yamaguchi (1993)
10.1016/S0968-4328(99)00012-8 / Micron by Phaneuf (1999)
10.1016/S0968-4328(99)00005-0 / Micron by Giannuzzi (1999)
H. Saka, T. Kato, M.H. Hong, K. Sasaki, Kuroda, T. Kamino, GALVATECH ‘95 Conference Proceedings, 1995, pp. 809.
{'key': '10.1016/S0304-3991(02)00193-6_BIB11', 'first-page': '376', 'volume': '44', 'author': 'Kitano', 'year': '1995', 'journal-title': 'J. Electron Microsc.'} / J. Electron Microsc. by Kitano (1995)
{'key': '10.1016/S0304-3991(02)00193-6_BIB12', 'first-page': '410', 'volume': '44', 'author': 'Kitano', 'year': '1995', 'journal-title': 'J. Electron Microsc.'} / J. Electron Microsc. by Kitano (1995)
10.1016/0304-3991(93)90025-S / Ultramicroscopy by Barber (1993)
A.J. Leslie, K.L. Pey, K.S. Sim, M.T.F. Beh, G.P. Goh, in: Proceedings of the 21st International Symposium for Testing and Failure Analysis, Santa Clara, CA, 1995, pp. 353.
10.1116/1.588213 / J. Vac. Sci. Technol. B by Yamaguchi (1995)
10.1116/1.581795 / J. Vac. Sci. Technol. A by Kato (1995)
10.1080/00337577008235022 / Radiat. Eff. by Hermanne (1970)
10.1016/0304-3991(87)90031-3 / Ultramicroscopy by Kim (1987)
10.1016/0039-6028(78)90294-7 / Surf. Sci. by Ho (1978)
F.V. Nolfi (Ed.), Phase Transformations During Irradiation, Applied Science Publishers, London, 1983.
10.1007/S100050010048 / Microsc. Microanal. by Cairney (2000)
R.W. Fonda, G.J. Shiflet, Metall. Mater. Trans. A, in press.
10.1016/S0304-3991(99)00081-9 / Ultramicroscopy by Longo (1999)
10.1111/j.1365-2818.1975.tb03895.x / J. Microsc. by Cliff (1975)
P.L. Morris, M.D. Ball, P.J. Stratham, Institute of Physics Conference Series, No. 52, 1980, p. 413.
D.B. Williams, C.B. Carter, Transmission Electron Microscopy; Vol. IV Spectroscopy, Plenum Press, New York, 1996, pp. 599. (10.1007/978-1-4757-2519-3_1)
{'key': '10.1016/S0304-3991(02)00193-6_BIB27', 'series-title': 'Principles of Analytical Electron Microscopy', 'first-page': '141', 'author': 'Williams', 'year': '1986'} / Principles of Analytical Electron Microscopy by Williams (1986)
10.1016/S1044-5803(00)00107-8 / Mater. Characterization by Cairney (2001)

Dates

Type	When
Created	22 years, 8 months ago (Dec. 10, 2002, 8:29 p.m.)
Deposited	4 years, 3 months ago (May 26, 2021, 11:38 a.m.)
Indexed	1 year, 2 months ago (June 7, 2024, 8:43 a.m.)
Issued	22 years, 8 months ago (Jan. 1, 2003)
Published	22 years, 8 months ago (Jan. 1, 2003)
Published Print	22 years, 8 months ago (Jan. 1, 2003)

Funders 0

None

BibTeX

@article{Hutchinson_2003, title={A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils}, volume={94}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(02)00193-6}, DOI={10.1016/s0304-3991(02)00193-6}, number={1}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Hutchinson, C.R and Hackenberg, R.E and Shiflet, G.J}, year={2003}, month=jan, pages={37–48} }

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