Crossref
journal-article
Elsevier BV
Ultramicroscopy (78)
References
32
Referenced
47
10.1073/pnas.74.5.1802
/ Proc. Natl. Acad. Sci. USA by Issacson (1977)10.1111/j.1365-2818.1979.tb00228.x
/ J. Microscopy by Howie (1979)10.1016/0304-3991(90)90027-J
/ Ultramicroscopy by Xu (1990)10.1103/PhysRevLett.64.938
/ Phys. Rev. Lett. by Pennycook (1990)10.1016/0304-3991(91)90004-P
/ Ultramicroscopy by Pennycook (1991)10.1016/0304-3991(91)90006-R
/ Ultramicroscopy by Liu (1991)10.1098/rspa.1993.0060
/ Proc. Roy. Soc. London Ser. A by Jesson (1993)10.1098/rspa.1995.0044
/ Proc. Roy. Soc. London Ser. A by Jesson (1995)10.1093/oxfordjournals.jmicro.a023629
/ J. Electron Microsc. by James (1998)10.1126/science.266.5182.102
/ Science by McGibbon (1994)10.1126/science.269.5223.519
/ Science by McGibbon (1995)10.1093/oxfordjournals.jmicro.a023410
/ J. Electron Microsc. by Pennycook (1997)10.1016/S0304-3991(97)00041-7
/ Ultramicroscopy by Anderson (1997)10.1103/PhysRevLett.81.132
/ Phys. Rev. Lett. by Yan (1998)10.1103/PhysRevLett.81.132
/ Phys. Rev. Lett. by Chisholm (1998)10.1103/PhysRevLett.81.4156
/ Phys. Rev. Lett. by Nellist (1998)10.1103/PhysRevLett.82.3082
/ Phys. Rev. Lett. by Mitsuishi (1999)10.1093/oxfordjournals.jmicro.a023656
/ J. Electron Microsc. by Saitoh (1999){'key': '10.1016/S0304-3991(02)00131-6_BIB19', 'series-title': 'Impact of Electron and Scanning Probe Microscopy on Materials Research', 'first-page': '161', 'author': 'Pennycook', 'year': '1999'}
/ Impact of Electron and Scanning Probe Microscopy on Materials Research by Pennycook (1999)10.1103/PhysRevB.61.13833
/ Phys. Rev. B by Yamazaki (2000)10.1080/01418610108216630
/ Philos. Mag. A by Kawasaki (2001)10.1093/oxfordjournals.jmicro.a023868
/ J. Electron Microsc. by Yamazaki (2000)10.1103/PhysRevB.63.085316
/ Phys. Rev. B by Watanabe (2001)10.1093/jmicro/50.6.517
/ J. Electron Microsc. by Yamazaki (2001)10.1016/0304-3991(87)90229-4
/ Ultramicroscopy by Kirkland (1987)10.1107/S0108767388006403
/ Acta Crystallogr. Sect. A: Found. Crystallogr. by Loane (1988)10.1016/0304-3991(92)90054-N
/ Ultramicroscopy by Loane (1992)10.1016/0304-3991(93)90209-G
/ Ultramicroscopy by Hillyard (1993)10.1016/0304-3991(93)90043-W
/ Ultramicroscopy by Hillyard (1993)10.1016/0304-3991(94)00173-K
/ Ultramicroscopy by Hillyard (1995)10.1103/PhysRevB.64.115432
/ Phys. Rev. B by Watanabe (2001)10.1016/S0304-3991(99)00018-2
/ Ultramicroscopy by James (1999)
Dates
Type | When |
---|---|
Created | 22 years, 10 months ago (Oct. 15, 2002, 9:27 a.m.) |
Deposited | 6 years, 4 months ago (April 13, 2019, 6:24 p.m.) |
Indexed | 11 months ago (Sept. 16, 2024, 5:29 p.m.) |
Issued | 23 years ago (Aug. 1, 2002) |
Published | 23 years ago (Aug. 1, 2002) |
Published Print | 23 years ago (Aug. 1, 2002) |
@article{Yamazaki_2002, title={Effect of small crystal tilt on atomic-resolution high-angle annular dark field STEM imaging}, volume={92}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(02)00131-6}, DOI={10.1016/s0304-3991(02)00131-6}, number={3–4}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Yamazaki, T and Kawasaki, M and Watanabe, K and Hashimoto, I and Shiojiri, M}, year={2002}, month=aug, pages={181–189} }