DOI: 10.1016/s0304-3991(01)00155-3. Improved background-fitting algorithms for ionization edges in electron energy-loss spectra

Improved background-fitting algorithms for ionization edges in electron energy-loss spectra

10.1016/s0304-3991(01)00155-3

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Egerton, R. F., & Malac, M. (2002). Improved background-fitting algorithms for ionization edges in electron energy-loss spectra. Ultramicroscopy, 92(2), 47â56.

Authors 2

R.F. Egerton (first)
M. Malac (additional)

References 33 Referenced 41

R.F. Egerton, Electron Energy-loss Spectroscopy in the Electron Microscope, 2nd Edition, Plenum Publishing Co., New York, 1996, pp. 272–284. (10.1007/978-1-4757-5099-7)
10.1016/S0304-3991(78)80031-X / Ultramicroscopy by Egerton (1978)
10.1016/S0304-3991(00)00094-2 / Ultramicroscopy by Zhu (2001)
10.1016/0304-3991(82)90101-2 / Ultramicroscopy by Egerton (1982)
10.1016/S0304-3991(79)90157-8 / Ultramicroscopy by Egerton (1979)
10.1111/j.1749-6632.1986.tb34541.x / Ann. NY Acad. Sci. by Ottensmeyer (1986)
10.1002/jemt.1079 / Microsc. Res. Tech. by Quintana (2001)
10.1016/0304-3991(85)90136-6 / Ultramicroscopy by Zaluzec (1985)
10.1016/0304-3991(92)90100-X / Ultramicroscopy by Bonnet (1992)
10.1016/0304-3991(93)90177-Y / Ultramicroscopy by Michel (1993)
10.1016/0304-3991(89)90300-8 / Ultramicroscopy by Zaluzec (1989)
10.1021/ac00066a003 / Anal. Chem. by Leapman (1993)
10.1016/0304-3991(87)90004-0 / Ultramicroscopy by Shuman (1987)
10.1016/0304-3991(92)90091-W / Ultramicroscopy by Wang (1992)
10.1016/0304-3991(85)90095-6 / Ultramicroscopy by Steele (1985)
10.1063/1.1138336 / Rev. Sci. Instrum. by Shuman (1985)
10.1016/0304-3991(88)90239-2 / Ultramicroscopy by Leapman (1988)
10.1111/j.1365-2818.1992.tb01482.x / J. Microsc. by Leapman (1992)
10.1016/0304-3991(93)90229-Q / Ultramicroscopy by Leapman (1993)
10.1016/0304-3991(94)00177-O / Ultramicroscopy by Tence (1995)
10.1016/0304-3991(94)90048-5 / Ultramicroscopy by Mullejans (1994)
P.R. Bevington, Data Reduction and Error Analysis for the Physical Sciences, McGraw-Hill, New York, 1969, p. 114.
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10.1063/1.326667 / J. Appl. Phys. by Maher (1979)
10.1063/1.439184 / J. Chem. Phys. by Leapman (1980)
10.1016/0304-3991(93)90087-E / Ultramicroscopy by Egerton (1993)
10.1016/0304-3991(82)90213-3 / Ultramicroscopy by Rez (1982)
F. Hofer, in: L Reimer (Ed.), Energy-Filtering Transmission Electron Microscopy, Springer Series in Optical Sciences, Vol. 71, Springer, Berlin, 1995 (Chapter 4).
C.C. Ahn, O.L. Krivanek, EELS Atlas, Gatan Inc., 780 Commonwealth Drive, Warrendale, PA 15086, USA.
10.1016/0304-3991(91)90169-7 / Ultramicroscopy by Egerton (1991)
10.1017/S1431927699000021 / Microsc. Microanal. by Malac (1999)
10.1016/0304-3991(88)90008-3 / Ultramicroscopy by Weng (1988)
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Dates

Type	When
Created	22 years, 10 months ago (Oct. 15, 2002, 9:27 a.m.)
Deposited	6 years, 4 months ago (May 3, 2019, 2:54 a.m.)
Indexed	3 months, 4 weeks ago (May 6, 2025, 12:09 a.m.)
Issued	23 years, 2 months ago (July 1, 2002)
Published	23 years, 2 months ago (July 1, 2002)
Published Print	23 years, 2 months ago (July 1, 2002)

Funders 0

None

BibTeX

@article{Egerton_2002, title={Improved background-fitting algorithms for ionization edges in electron energy-loss spectra}, volume={92}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(01)00155-3}, DOI={10.1016/s0304-3991(01)00155-3}, number={2}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Egerton, R.F. and Malac, M.}, year={2002}, month=jul, pages={47–56} }

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