DOI: 10.1016/s0304-3991(01)00077-8. Image-spectroscopy – I. The advantages of increased spectral information for compositional EFTEM analysis

Image-spectroscopy – I. The advantages of increased spectral information for compositional EFTEM analysis

10.1016/s0304-3991(01)00077-8

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Thomas, P. J., & Midgley, P. A. (2001). Image-spectroscopy â I. The advantages of increased spectral information for compositional EFTEM analysis. Ultramicroscopy, 88(3), 179â186.

Authors 2

P.J Thomas (first)
P.A Midgley (additional)

References 25 Referenced 54

10.1046/j.1365-2818.1999.00469.x / J. Microsc. by Freitag (1998)
10.1051/mmm:0199100202-3025700 / Microsc. Microanal. Microstruct. by Krivanek (1991)
{'key': '10.1016/S0304-3991(01)00077-8_BIB3', 'series-title': '51st Ann. Proc. Electron. Microsc. Soc. Am', 'first-page': '586', 'author': 'Krivanek', 'year': '1993'} / 51st Ann. Proc. Electron. Microsc. Soc. Am by Krivanek (1993)
10.1016/S0304-3991(78)80030-8 / Ultramicroscopy by Jeanguillaume (1978)
10.1051/mmm:0199200306051700 / Microsc. Microanal. Microstruct. by Lavergne (1992)
10.1016/S0968-4328(97)00037-1 / Micron by Mayer (1997)
10.1111/j.1365-2818.1994.tb03463.x / J. Microsc. by Körtje (1994)
10.1111/j.1365-2818.1994.tb03465.x / J. Microsc. by Beckers (1994)
10.1016/0304-3991(89)90304-5 / Ultramicroscopy by Jeanguillaume (1989)
10.1016/S0968-4328(97)00037-1 / Micron by Mayer (1997)
{'key': '10.1016/S0304-3991(01)00077-8_BIB11', 'first-page': '245', 'volume': '145', 'author': 'Unser', 'year': '1986', 'journal-title': 'J. Microsc.'} / J. Microsc. by Unser (1986)
P.J. Thomas, P.A. Midgley, Inst. Phys. Conf. Ser. 161 (EMAG) (1999) 179.
{'key': '10.1016/S0304-3991(01)00077-8_BIB13', 'first-page': '93', 'volume': '3', 'author': 'Leapman', 'year': '1995', 'journal-title': 'J. Microsc. Soc. Am.'} / J. Microsc. Soc. Am. by Leapman (1995)
G. Deshais, Stress corrosion cracking in Al based alloys, Ph.D. Thesis, University of Cambridge, 1999.
10.1111/j.1365-2818.1995.tb03691.x / J. Microsc. by Yuan (1995)
10.1111/j.1365-2818.1995.tb03686.x / J. Microsc. by Krivanek (1995)
10.1002/(SICI)1097-0029(20000501)49:3<269::AID-JEMT5>3.0.CO;2-B / Microsc. Res. Tech. by Meyer (2000)
10.1016/0304-3991(82)90101-2 / Ultramicroscopy by Egerton (1982)
10.1016/S0968-4328(98)00014-6 / Micron by Kothleitner (1998)
EL/P software v 2.1, © Gatan Inc. 6678 Owens Drive, Pleasanton, CA 94588-3334 USA, 1993.
{'key': '10.1016/S0304-3991(01)00077-8_BIB21', 'first-page': '177', 'volume': '78', 'author': 'Chapman', 'year': '1985', 'journal-title': 'Inst. Phys. Conf. Ser.'} / Inst. Phys. Conf. Ser. by Chapman (1985)
10.1080/01418638508241891 / Philos. Mag. B by Chan (1985)
P.J. Thomas, P.A. Midgley, Ultramicroscopy, next paper in this issue, 88 (2001) 187.
{'key': '10.1016/S0304-3991(01)00077-8_BIB24', 'first-page': '1315', 'volume': '12', 'author': 'Rose', 'year': '1970', 'journal-title': 'Image Technol.'} / Image Technol. by Rose (1970)
{'key': '10.1016/S0304-3991(01)00077-8_BIB25', 'first-page': '175', 'volume': '92', 'author': 'Berger', 'year': '1993', 'journal-title': 'Optik'} / Optik by Berger (1993)

Dates

Type	When
Created	23 years ago (July 25, 2002, 2:23 p.m.)
Deposited	6 years, 4 months ago (April 23, 2019, 6:20 p.m.)
Indexed	1 year, 4 months ago (April 9, 2024, 10:16 p.m.)
Issued	24 years ago (Aug. 1, 2001)
Published	24 years ago (Aug. 1, 2001)
Published Print	24 years ago (Aug. 1, 2001)

Funders 0

None

BibTeX

@article{Thomas_2001, title={Image-spectroscopy – I. The advantages of increased spectral information for compositional EFTEM analysis}, volume={88}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(01)00077-8}, DOI={10.1016/s0304-3991(01)00077-8}, number={3}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Thomas, P.J and Midgley, P.A}, year={2001}, month=aug, pages={179–186} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        4,
        10
      ]
    ],
    "date-time": "2024-04-10T02:16:42Z",
    "timestamp": 1712715402805
  },
  "reference-count": 25,
  "publisher": "Elsevier BV",
  "issue": "3",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2001,
            8,
            1
          ]
        ],
        "date-time": "2001-08-01T00:00:00Z",
        "timestamp": 996624000000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2001,
        8
      ]
    ]
  },
  "DOI": "10.1016/s0304-3991(01)00077-8",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        7,
        25
      ]
    ],
    "date-time": "2002-07-25T18:23:14Z",
    "timestamp": 1027621394000
  },
  "page": "179-186",
  "source": "Crossref",
  "is-referenced-by-count": 54,
  "title": "Image-spectroscopy \u2013 I. The advantages of increased spectral information for compositional EFTEM analysis",
  "prefix": "10.1016",
  "volume": "88",
  "author": [
    {
      "given": "P.J",
      "family": "Thomas",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "P.A",
      "family": "Midgley",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB1",
      "doi-asserted-by": "crossref",
      "first-page": "42",
      "DOI": "10.1046/j.1365-2818.1999.00469.x",
      "volume": "194",
      "author": "Freitag",
      "year": "1998",
      "journal-title": "J. Microsc."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB2",
      "doi-asserted-by": "crossref",
      "first-page": "257",
      "DOI": "10.1051/mmm:0199100202-3025700",
      "volume": "2",
      "author": "Krivanek",
      "year": "1991",
      "journal-title": "Microsc. Microanal. Microstruct."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB3",
      "series-title": "51st Ann. Proc. Electron. Microsc. Soc. Am",
      "first-page": "586",
      "author": "Krivanek",
      "year": "1993"
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB4",
      "doi-asserted-by": "crossref",
      "first-page": "237",
      "DOI": "10.1016/S0304-3991(78)80030-8",
      "volume": "3",
      "author": "Jeanguillaume",
      "year": "1978",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB5",
      "doi-asserted-by": "crossref",
      "first-page": "517",
      "DOI": "10.1051/mmm:0199200306051700",
      "volume": "3",
      "author": "Lavergne",
      "year": "1992",
      "journal-title": "Microsc. Microanal. Microstruct."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB6",
      "doi-asserted-by": "crossref",
      "first-page": "361",
      "DOI": "10.1016/S0968-4328(97)00037-1",
      "volume": "28",
      "author": "Mayer",
      "year": "1997",
      "journal-title": "Micron"
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB7",
      "doi-asserted-by": "crossref",
      "first-page": "149",
      "DOI": "10.1111/j.1365-2818.1994.tb03463.x",
      "volume": "174",
      "author": "K\u00f6rtje",
      "year": "1994",
      "journal-title": "J. Microsc."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB8",
      "doi-asserted-by": "crossref",
      "first-page": "171",
      "DOI": "10.1111/j.1365-2818.1994.tb03465.x",
      "volume": "174",
      "author": "Beckers",
      "year": "1994",
      "journal-title": "J. Microsc."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB9",
      "doi-asserted-by": "crossref",
      "first-page": "252",
      "DOI": "10.1016/0304-3991(89)90304-5",
      "volume": "28",
      "author": "Jeanguillaume",
      "year": "1989",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB10",
      "doi-asserted-by": "crossref",
      "first-page": "361",
      "DOI": "10.1016/S0968-4328(97)00037-1",
      "volume": "28",
      "author": "Mayer",
      "year": "1997",
      "journal-title": "Micron"
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB11",
      "first-page": "245",
      "volume": "145",
      "author": "Unser",
      "year": "1986",
      "journal-title": "J. Microsc."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB12",
      "unstructured": "P.J. Thomas, P.A. Midgley, Inst. Phys. Conf. Ser. 161 (EMAG) (1999) 179."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB13",
      "first-page": "93",
      "volume": "3",
      "author": "Leapman",
      "year": "1995",
      "journal-title": "J. Microsc. Soc. Am."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB14",
      "unstructured": "G. Deshais, Stress corrosion cracking in Al based alloys, Ph.D. Thesis, University of Cambridge, 1999."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB15",
      "doi-asserted-by": "crossref",
      "first-page": "313",
      "DOI": "10.1111/j.1365-2818.1995.tb03691.x",
      "volume": "180",
      "author": "Yuan",
      "year": "1995",
      "journal-title": "J. Microsc."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB16",
      "doi-asserted-by": "crossref",
      "first-page": "277",
      "DOI": "10.1111/j.1365-2818.1995.tb03686.x",
      "volume": "180",
      "author": "Krivanek",
      "year": "1995",
      "journal-title": "J. Microsc."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB17",
      "doi-asserted-by": "crossref",
      "first-page": "269",
      "DOI": "10.1002/(SICI)1097-0029(20000501)49:3<269::AID-JEMT5>3.0.CO;2-B",
      "volume": "49",
      "author": "Meyer",
      "year": "2000",
      "journal-title": "Microsc. Res. Tech."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB18",
      "doi-asserted-by": "crossref",
      "first-page": "387",
      "DOI": "10.1016/0304-3991(82)90101-2",
      "volume": "9",
      "author": "Egerton",
      "year": "1982",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB19",
      "doi-asserted-by": "crossref",
      "first-page": "349",
      "DOI": "10.1016/S0968-4328(98)00014-6",
      "volume": "29",
      "author": "Kothleitner",
      "year": "1998",
      "journal-title": "Micron"
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB20",
      "unstructured": "EL/P software v 2.1, \u00a9 Gatan Inc. 6678 Owens Drive, Pleasanton, CA 94588-3334 USA, 1993."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB21",
      "first-page": "177",
      "volume": "78",
      "author": "Chapman",
      "year": "1985",
      "journal-title": "Inst. Phys. Conf. Ser."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB22",
      "doi-asserted-by": "crossref",
      "first-page": "1019",
      "DOI": "10.1080/01418638508241891",
      "volume": "52",
      "author": "Chan",
      "year": "1985",
      "journal-title": "Philos. Mag. B"
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB23",
      "unstructured": "P.J. Thomas, P.A. Midgley, Ultramicroscopy, next paper in this issue, 88 (2001) 187."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB24",
      "first-page": "1315",
      "volume": "12",
      "author": "Rose",
      "year": "1970",
      "journal-title": "Image Technol."
    },
    {
      "key": "10.1016/S0304-3991(01)00077-8_BIB25",
      "first-page": "175",
      "volume": "92",
      "author": "Berger",
      "year": "1993",
      "journal-title": "Optik"
    }
  ],
  "container-title": "Ultramicroscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399101000778?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399101000778?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2019,
        4,
        23
      ]
    ],
    "date-time": "2019-04-23T22:20:48Z",
    "timestamp": 1556058048000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0304399101000778"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2001,
        8
      ]
    ]
  },
  "references-count": 25,
  "journal-issue": {
    "issue": "3",
    "published-print": {
      "date-parts": [
        [
          2001,
          8
        ]
      ]
    }
  },
  "alternative-id": [
    "S0304399101000778"
  ],
  "URL": "http://dx.doi.org/10.1016/S0304-3991(01)00077-8",
  "relation": {},
  "ISSN": [
    "0304-3991"
  ],
  "subject": [],
  "container-title-short": "Ultramicroscopy",
  "published": {
    "date-parts": [
      [
        2001,
        8
      ]
    ]
  }
}