DOI: 10.1016/s0304-3991(00)00096-6. Surface damage formation during ion-beam thinning of samples for transmission electron microscopy

Surface damage formation during ion-beam thinning of samples for transmission electron microscopy

10.1016/s0304-3991(00)00096-6

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

McCaffrey, J. P., Phaneuf, M. W., & Madsen, L. D. (2001). Surface damage formation during ion-beam thinning of samples for transmission electron microscopy. Ultramicroscopy, 87(3), 97â104.

Authors 3

J.P. McCaffrey (first)
M.W. Phaneuf (additional)
L.D. Madsen (additional)

References 19 Referenced 200

J.C. Bravman, R.M. Anderson, M.L. McDonald (Eds.), Specimen Preparation for Transmission Electron Microscopy of Materials, Vol. 115, Materials Research Society, Pittsburgh, PA, 1988.
R. Anderson (Ed.), Specimen Preparation for Transmission Electron Microscopy of Materials II, Vol. 199, Materials Research Society, Pittsburgh, PA, 1990.
R. Anderson, B. Tracy, J. Bravman (Eds.), Specimen Preparation for Transmission Electron Microscopy of Materials III, Vol. 254, Materials Research Society, Pittsburgh, PA, 1992.
R.M. Anderson, S.D. Walck (Eds.), Specimen Preparation for Transmission Electron Microscopy of Materials IV, Vol. 480, Materials Research Society, Pittsburgh, PA, 1997.
10.1016/0304-3991(91)90116-N / Ultramicroscopy by McCaffrey (1991)
10.1002/jemt.1070240210 / Microsc. Res. Tech. by McCaffrey (1993)
S.D. Walck, J.P. McCaffrey, in: R.M. Anderson, S.D.Walek (Eds.),Specimen Preparation for Transmission Electron Microscopy of Materials IV, Vol. 480, Materials Research Society, Pittsburgh, PA, 1997, p. 149.
10.1016/0304-3991(92)90223-7 / Ultramicroscopy by Schuhrke (1992)
10.1016/S0304-3991(97)00120-4 / Ultramicroscopy by Barna (1998)
10.1016/0168-583X(87)90005-X / Nucl. Instr. and Meth. B by Biersack (1987)
J.F. Zeigler, SRIM (Stopping and Range of Ions in Matter), IBM-Research, 28-0, Yorktown, NY 10598, http://www.research.ibm.com/ionbeams.
10.1002/jemt.1070320507 / Microsc. Res. Tech. by McCaffrey (1995)
10.1063/1.120438 / Appl. Phys. Lett. by Lu (1997)
10.1116/1.586537 / J. Vac. Sci. Technol. by Overwijk (1993)
J.F. Walker, R.F. Broom, Institute of Physics Conference Series, Vol. 157, IOP Publishing Ltd., Amsterdam, 1997, p. 473.
A.J. Mardinly, Institute of Physics Conference Series, Vol. 164, IOP Publishing Ltd., Amsterdam, 1999, p. 575.
P.H. Albarède, H.J. Lezec, Electron Microscopy 1998, Symposium HH, Vol. III, 1998, p. 431.
H. Bender, Institute of Physics Conference Series Vol. 164, IOP Publishing Ltd., Amsterdam,1999, p. 593.
10.1016/S0968-4328(99)00014-1 / Micron by Botton (1999)

Dates

Type	When
Created	23 years ago (July 25, 2002, 7:33 a.m.)
Deposited	6 years, 3 months ago (May 1, 2019, 2:20 p.m.)
Indexed	3 weeks, 5 days ago (July 26, 2025, 5:04 a.m.)
Issued	24 years, 4 months ago (April 1, 2001)
Published	24 years, 4 months ago (April 1, 2001)
Published Print	24 years, 4 months ago (April 1, 2001)

Funders 0

None

BibTeX

@article{McCaffrey_2001, title={Surface damage formation during ion-beam thinning of samples for transmission electron microscopy}, volume={87}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(00)00096-6}, DOI={10.1016/s0304-3991(00)00096-6}, number={3}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={McCaffrey, J.P. and Phaneuf, M.W. and Madsen, L.D.}, year={2001}, month=apr, pages={97–104} }

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