DOI: 10.1016/s0304-3991(00)00061-9. Electric charging of thin films measured using the contrast transfer function

Electric charging of thin films measured using the contrast transfer function

10.1016/s0304-3991(00)00061-9

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Danov, K., Danev, R., & Nagayama, K. (2001). Electric charging of thin films measured using the contrast transfer function. Ultramicroscopy, 87(1â2), 45â54.

Authors 3

Krassimir Danov (first)
Radostin Danev (additional)
Kuniaki Nagayama (additional)

References 16 Referenced 21

E. Plies, in: T. Mulvey, C.J.R. Sheppard (Eds.), Advances in Optical and Electron Microscopy, Vol. 13, Academic Press, New York, 1994, p. 123.
10.1016/0304-3991(95)00077-1 / Ultramicroscopy by Cazaux (1995)
10.1063/1.348970 / J. Appl. Phys. by Matteucci (1991)
10.1046/j.1365-2818.1997.1840748.x / J. Microsc. by Frost (1997)
10.1016/S0304-3991(98)00059-X / Ultramicroscopy by Frost (1998)
10.1016/S0304-3991(98)00015-1 / Ultramicroscopy by Frost (1998)
10.1098/rstb.1971.0039 / Philos. Trans. Roy. Soc. London B by Unwin (1971)
J. Rouse, in: T. Mulvey, C.J.R. Sheppard (Eds.), Advances in Optical and Electron Microscopy, Vol. 13, Academic Press, New York, 1994, p. 1.
{'key': '10.1016/S0304-3991(00)00061-9_BIB9', 'first-page': '245', 'volume': '42', 'author': 'Krakow', 'year': '1975', 'journal-title': 'Optik'} / Optik by Krakow (1975)
10.1063/1.336493 / J. Appl. Phys. by Cazaux (1986)
10.1016/0304-3991(96)00033-2 / Ultramicroscopy by Matsumoto (1996)
F. Thon, in: U. Valdre (Ed.), Electron Microscopy in Material Sciences, Academic Press, London, 1971, p. 571. (10.1016/B978-0-12-780584-9.50021-0)
M. Abramowitz, I.A. Stegun (Eds.), Handbook of Mathematical Functions with Formulas, Graphs and Mathematical Tables, Applied Mathematics Series, Vol. 55, National Bureau of Standards, New York, 1964. (10.1115/1.3625776)
{'key': '10.1016/S0304-3991(00)00061-9_BIB14', 'first-page': '17', 'volume': '44', 'author': 'Willasch', 'year': '1975', 'journal-title': 'Optik'} / Optik by Willasch (1975)
L. Reimer, Scanning Electron Microscopy, Physics of Image Formation and Microanalysis, Springer, Berlin, 1998. (10.1007/978-3-540-38967-5)
10.1143/JPSJ.68.811 / J. Phys. Soc. Japan by Nagayama (1999)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 5:52 p.m.)
Deposited	5 years, 7 months ago (Jan. 28, 2020, 1:19 p.m.)
Indexed	4 weeks, 2 days ago (Aug. 7, 2025, 5:03 p.m.)
Issued	24 years, 6 months ago (March 1, 2001)
Published	24 years, 6 months ago (March 1, 2001)
Published Print	24 years, 6 months ago (March 1, 2001)

Funders 0

None

BibTeX

@article{Danov_2001, title={Electric charging of thin films measured using the contrast transfer function}, volume={87}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/s0304-3991(00)00061-9}, DOI={10.1016/s0304-3991(00)00061-9}, number={1–2}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Danov, Krassimir and Danev, Radostin and Nagayama, Kuniaki}, year={2001}, month=mar, pages={45–54} }

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