DOI: 10.1016/s0169-4332(99)00025-2. Brightness measurements of a ZrO/W Schottky electron emitter in a transmission electron microscope

Brightness measurements of a ZrO/W Schottky electron emitter in a transmission electron microscope

10.1016/s0169-4332(99)00025-2

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Fransen, M. J., Overwijk, M. H. F., & Kruit, P. (1999). Brightness measurements of a ZrO/W Schottky electron emitter in a transmission electron microscope. Applied Surface Science, 146(1â4), 357â362.

Authors 3

M.J. Fransen (first)
M.H.F. Overwijk (additional)
P. Kruit (additional)

References 14 Referenced 28

L.W. Swanson, G.A. Schwind, Handbook of Charged Particle Optics, Chap. 2: A Review of the ZrO/W Schottky Cathode, CRC Press, New York, 1997.
10.1063/1.364081 / J. Appl. Phys. / Energy distributions of Zr/O/W Schottky electron emission by Kim (1997)
10.1116/1.590128 / J. Vac. Sci. Technol. B / Experimental evaluation of the extended-Schottky model for ZrO/W electron emission by Fransen (1998)
P.W. Hawkes, E. Kasper, Principles of Electron Optics, Vol. 2: Applied Geometrical Optics, Chap. 47, Brightness, Academic Press, New York, 1989. (10.1016/B978-0-12-333352-0.50018-9)
M.T. Otten, Performance of the CM200 FEG, in: Proceedings ICEM 13-Paris, 1994, pp. 235–236. (10.1017/S0424820100170256)
10.1143/JJAP.24.766 / Jap. J. Appl. Phys. / A stable high-brightness electron gun with Zr/W tip for nanometer lithography: I. Emission properties in Schottky- and thermal field-emission regions by Samoto (1985)
P. Kruit, G.H. Jansen, Handbook of Charged Particle Optics, Chap. 7, Space Charge and Statistical Coulomb Effects, CRC Press, New York, 1997.
10.1016/0304-3991(84)90045-7 / Ultramicroscopy / Theoretical considerations on electron optical brightness for thermionic, field and T-F emissions by Shimoyama (1984)
10.1002/pssb.19660170103 / Phys. Stat. Sol. / General theory of electron emission from metals by Christov (1966)
L.W. Swanson, A.E. Bell, Recent advances in field electron microscopy of metals, in: Advances in Electronics and Electron Physics, Vol. 32, Appendix I, Academic Press, New York, pp. 296–304. (10.1016/S0065-2539(08)60236-X)
{'issue': '3', 'key': '10.1016/S0169-4332(99)00025-2_BIB11', 'first-page': '101', 'article-title': 'Addition of different contributions to the charged particle probe size', 'volume': '101', 'author': 'Barth', 'year': '1996', 'journal-title': 'Optik'} / Optik / Addition of different contributions to the charged particle probe size by Barth (1996)
{'issue': '2', 'key': '10.1016/S0169-4332(99)00025-2_BIB12', 'first-page': '173', 'article-title': 'Richtstrahlwertmessungen an einem Strahlerzeugungssystem mit Feldemissionskathode', 'volume': '49', 'author': 'Speidel', 'year': '1977', 'journal-title': 'Optik'} / Optik / Richtstrahlwertmessungen an einem Strahlerzeugungssystem mit Feldemissionskathode by Speidel (1977)
R. Lauer, K.-J. Hanszen, G. Ade, Analyse des interferometrischen Verfahrens zur Messung des Richtstrahlwerts von Elektronenkanonen, Number APh-24 in PTB-Bericht, Physikalisch-Technischen Bundesanstalt, 1985.
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Dates

Type	When
Created	23 years ago (July 26, 2002, 12:35 a.m.)
Deposited	4 years, 3 months ago (May 15, 2021, 12:34 a.m.)
Indexed	2 months, 2 weeks ago (June 6, 2025, 6:42 p.m.)
Issued	26 years, 3 months ago (May 1, 1999)
Published	26 years, 3 months ago (May 1, 1999)
Published Print	26 years, 3 months ago (May 1, 1999)

Funders 0

None

BibTeX

@article{Fransen_1999, title={Brightness measurements of a ZrO/W Schottky electron emitter in a transmission electron microscope}, volume={146}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/s0169-4332(99)00025-2}, DOI={10.1016/s0169-4332(99)00025-2}, number={1–4}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Fransen, M.J. and Overwijk, M.H.F. and Kruit, P.}, year={1999}, month=may, pages={357–362} }

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