DOI: 10.1016/s0169-4332(98)00875-7. Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

10.1016/s0169-4332(98)00875-7

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Sushko, P. V., Foster, A. S., Kantorovich, L. N., & Shluger, A. L. (1999). Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM). Applied Surface Science, 144â145, 608â612.

Authors 4

Peter V Sushko (first)
Adam S Foster (additional)
Lev N Kantorovich (additional)
Alexander L Shluger (additional)

References 28 Referenced 23

10.1126/science.267.5194.68 / Science by Giessibl (1995)
{'key': '10.1016/S0169-4332(98)00875-7_BIB2', 'first-page': '3', 'volume': '1', 'author': 'Bammerlin', 'year': '1997', 'journal-title': 'Probe Microsc.'} / Probe Microsc. by Bammerlin (1997)
10.1007/s003390051148 / Appl. Phys. A by Bammerlin (1998)
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10.1088/0953-8984/6/10/003 / J. Phys.: Condens. Matter by Shluger (1994)
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10.1143/JJAP.35.2394 / Jpn. J. Appl. Phys. by Fukano (1996)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 12:35 a.m.)
Deposited	6 years, 4 months ago (April 12, 2019, 1:50 a.m.)
Indexed	1 year, 1 month ago (July 3, 2024, 7:06 a.m.)
Issued	26 years, 5 months ago (April 1, 1999)
Published	26 years, 5 months ago (April 1, 1999)
Published Print	26 years, 5 months ago (April 1, 1999)

Funders 0

None

BibTeX

@article{Sushko_1999, title={Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)}, volume={144–145}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/s0169-4332(98)00875-7}, DOI={10.1016/s0169-4332(98)00875-7}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Sushko, Peter V and Foster, Adam S and Kantorovich, Lev N and Shluger, Alexander L}, year={1999}, month=apr, pages={608–612} }

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