DOI: 10.1016/s0169-4332(98)00545-5. Imaging of chemical reactivity and buckled dimers on Si(100)2×1 reconstructed surface with noncontact AFM

Imaging of chemical reactivity and buckled dimers on Si(100)2×1 reconstructed surface with noncontact AFM

10.1016/s0169-4332(98)00545-5

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Uchihashi, T., Sugawara, Y., Tsukamoto, T., Minobe, T., Orisaka, S., Okada, T., & Morita, S. (1999). Imaging of chemical reactivity and buckled dimers on Si(100)2Ã1 reconstructed surface with noncontact AFM. Applied Surface Science, 140(3â4), 304â308.

Authors 7

T. Uchihashi (first)
Y. Sugawara (additional)
T. Tsukamoto (additional)
T. Minobe (additional)
S. Orisaka (additional)
T. Okada (additional)
S. Morita (additional)

References 18 Referenced 24

10.1126/science.267.5194.68 / Science by Giessibl (1995)
10.1143/JJAP.34.L145 / Jpn. J. Appl. Phys. by Kitamura (1995)
10.1103/PhysRevB.54.R8309 / Phys. Rev. B by Erlandsson (1996)
10.1007/s002570050106 / Z. Phys. B by Lüthi (1996)
10.1116/1.588873 / J. Vac. Sci. Technol. B by Güthner (1996)
10.1016/S0039-6028(96)01276-9 / Surf. Sci. Lett. by Nakagiri (1997)
10.1016/S0169-4332(96)00877-X / Appl. Surf. Sci. by Sugawara (1997)
10.1126/science.270.5242.1646 / Science by Sugawara (1995)
10.1143/JJAP.35.L668 / Jpn. J. Appl. Phys. by Kitamura (1996)
10.1063/1.1148499 / Rev. Sci. Instr. by Allers (1998)
{'key': '10.1016/S0169-4332(98)00545-5_BIB11', 'first-page': '3', 'volume': '1', 'author': 'Bammerlin', 'year': '1997', 'journal-title': 'Probe Microsc.'} / Probe Microsc. by Bammerlin (1997)
10.1103/PhysRevLett.79.4202 / Phys. Rev. Lett. by Fukui (1997)
10.1103/PhysRevB.56.9834 / Phys. Rev. B by Uchihashi (1997)
10.1116/1.576158 / J. Vac. Sci. Technol. A by Hamers (1989)
10.1116/1.587581 / J. Vac. Sci. Technol. B by Ohta (1994)
10.1063/1.347347 / J. Appl. Phys. by Albrecht (1991)
Y. Sugawara, H. Ueyama, T. Uchihashi, M. Ohta, Y. Yanase, T. Shigematsu, M. Suzuki, S. Morita, in: J. Michel, T. Kenedy, K. Wada, K. Thonke (Eds.), Defects in Electronic Materials II, MRS Symposia Proceedings No. 442, Materials Research Society, Pittsburgh, 1997, p. 15. (10.1557/PROC-442-15)
10.1103/PhysRevB.34.5343 / Phys. Rev. B by Hamers (1986)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 12:35 a.m.)
Deposited	3 years, 2 months ago (June 26, 2022, 11:12 a.m.)
Indexed	6 months, 1 week ago (Feb. 20, 2025, 11:01 p.m.)
Issued	26 years, 6 months ago (Feb. 1, 1999)
Published	26 years, 6 months ago (Feb. 1, 1999)
Published Print	26 years, 6 months ago (Feb. 1, 1999)

Funders 1

Ministry of Education, Culture, Sports, Science and Technology 10.13039/501100001700
Region: Asia
gov (National government)
Labels3
1. Monbu-kagaku-shō
2. 文部科学省
3. MEXT

BibTeX

@article{Uchihashi_1999, title={Imaging of chemical reactivity and buckled dimers on Si(100)2×1 reconstructed surface with noncontact AFM}, volume={140}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/s0169-4332(98)00545-5}, DOI={10.1016/s0169-4332(98)00545-5}, number={3–4}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Uchihashi, T. and Sugawara, Y. and Tsukamoto, T. and Minobe, T. and Orisaka, S. and Okada, T. and Morita, S.}, year={1999}, month=feb, pages={304–308} }

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