DOI: 10.1016/s0169-4332(98)00538-8. High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique

High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique

10.1016/s0169-4332(98)00538-8

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Kitamura, S., Suzuki, K., & Iwatsuki, M. (1999). High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique. Applied Surface Science, 140(3â4), 265â270.

Authors 3

Shinichi Kitamura (first)
Katsuyuki Suzuki (additional)
Masashi Iwatsuki (additional)

References 12 Referenced 77

10.1116/1.585423 / J. Vac. Sci. Technol. B by Weaver (1991)
10.1063/1.105227 / Appl. Phys. Lett. by Nonnenmacher (1991)
10.1063/1.358819 / J. Appl. Phys. by Henning (1995)
10.1116/1.588491 / J. Vac. Sci. Technol. B by Hochwitz (1996)
10.1126/science.267.5194.68 / Science by Giessibl (1995)
10.1143/JJAP.34.L145 / Jpn. J. Appl. Phys. by Kitamura (1995)
10.1143/JJAP.34.L1086 / Jpn. J. Appl. Phys. by Ueyama (1995)
{'key': '10.1016/S0169-4332(98)00538-8_BIB8', 'first-page': '42', 'volume': '32E', 'author': 'Kitamura', 'year': '1995', 'journal-title': 'JEOL News'} / JEOL News by Kitamura (1995)
10.1063/1.121577 / Appl. Phys. Lett. by Kitamura (1998)
CRC Handbook of Chemistry and Physics, 65th. edn., CRC Press, FL, 1984, p. E-76.
10.1143/JJAP.36.3860 / Jpn. J. Appl. Phys. by Kurokawa (1995)
10.1143/JJAP.36.3864 / Jpn. J. Appl. Phys. by Horiguchi (1995)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 12:35 a.m.)
Deposited	6 years, 4 months ago (April 12, 2019, 1:28 a.m.)
Indexed	3 weeks ago (Aug. 6, 2025, 9:52 a.m.)
Issued	26 years, 6 months ago (Feb. 1, 1999)
Published	26 years, 6 months ago (Feb. 1, 1999)
Published Print	26 years, 6 months ago (Feb. 1, 1999)

Funders 0

None

BibTeX

@article{Kitamura_1999, title={High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique}, volume={140}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/s0169-4332(98)00538-8}, DOI={10.1016/s0169-4332(98)00538-8}, number={3–4}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Kitamura, Shinichi and Suzuki, Katsuyuki and Iwatsuki, Masashi}, year={1999}, month=feb, pages={265–270} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        8,
        6
      ]
    ],
    "date-time": "2025-08-06T13:52:13Z",
    "timestamp": 1754488333027
  },
  "reference-count": 12,
  "publisher": "Elsevier BV",
  "issue": "3-4",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            1999,
            2,
            1
          ]
        ],
        "date-time": "1999-02-01T00:00:00Z",
        "timestamp": 917827200000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1999,
        2
      ]
    ]
  },
  "DOI": "10.1016/s0169-4332(98)00538-8",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        7,
        26
      ]
    ],
    "date-time": "2002-07-26T04:35:25Z",
    "timestamp": 1027658125000
  },
  "page": "265-270",
  "source": "Crossref",
  "is-referenced-by-count": 77,
  "title": "High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique",
  "prefix": "10.1016",
  "volume": "140",
  "author": [
    {
      "given": "Shinichi",
      "family": "Kitamura",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "Katsuyuki",
      "family": "Suzuki",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Masashi",
      "family": "Iwatsuki",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB1",
      "doi-asserted-by": "crossref",
      "first-page": "1559",
      "DOI": "10.1116/1.585423",
      "volume": "9",
      "author": "Weaver",
      "year": "1991",
      "journal-title": "J. Vac. Sci. Technol. B"
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB2",
      "doi-asserted-by": "crossref",
      "first-page": "2921",
      "DOI": "10.1063/1.105227",
      "volume": "58",
      "author": "Nonnenmacher",
      "year": "1991",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB3",
      "doi-asserted-by": "crossref",
      "first-page": "1888",
      "DOI": "10.1063/1.358819",
      "volume": "77",
      "author": "Henning",
      "year": "1995",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB4",
      "doi-asserted-by": "crossref",
      "first-page": "440",
      "DOI": "10.1116/1.588491",
      "volume": "14",
      "author": "Hochwitz",
      "year": "1996",
      "journal-title": "J. Vac. Sci. Technol. B"
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB5",
      "doi-asserted-by": "crossref",
      "first-page": "68",
      "DOI": "10.1126/science.267.5194.68",
      "volume": "267",
      "author": "Giessibl",
      "year": "1995",
      "journal-title": "Science"
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB6",
      "doi-asserted-by": "crossref",
      "first-page": "L145",
      "DOI": "10.1143/JJAP.34.L145",
      "volume": "34",
      "author": "Kitamura",
      "year": "1995",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB7",
      "doi-asserted-by": "crossref",
      "first-page": "L1086",
      "DOI": "10.1143/JJAP.34.L1086",
      "volume": "34",
      "author": "Ueyama",
      "year": "1995",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB8",
      "first-page": "42",
      "volume": "32E",
      "author": "Kitamura",
      "year": "1995",
      "journal-title": "JEOL News"
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB9",
      "doi-asserted-by": "crossref",
      "first-page": "3154",
      "DOI": "10.1063/1.121577",
      "volume": "72",
      "author": "Kitamura",
      "year": "1998",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB10",
      "unstructured": "CRC Handbook of Chemistry and Physics, 65th. edn., CRC Press, FL, 1984, p. E-76."
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB11",
      "doi-asserted-by": "crossref",
      "first-page": "3860",
      "DOI": "10.1143/JJAP.36.3860",
      "volume": "36",
      "author": "Kurokawa",
      "year": "1995",
      "journal-title": "Jpn. J. Appl. Phys."
    },
    {
      "key": "10.1016/S0169-4332(98)00538-8_BIB12",
      "doi-asserted-by": "crossref",
      "first-page": "3864",
      "DOI": "10.1143/JJAP.36.3864",
      "volume": "36",
      "author": "Horiguchi",
      "year": "1995",
      "journal-title": "Jpn. J. Appl. Phys."
    }
  ],
  "container-title": "Applied Surface Science",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0169433298005388?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0169433298005388?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2019,
        4,
        12
      ]
    ],
    "date-time": "2019-04-12T05:28:12Z",
    "timestamp": 1555046892000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0169433298005388"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1999,
        2
      ]
    ]
  },
  "references-count": 12,
  "journal-issue": {
    "issue": "3-4",
    "published-print": {
      "date-parts": [
        [
          1999,
          2
        ]
      ]
    }
  },
  "alternative-id": [
    "S0169433298005388"
  ],
  "URL": "http://dx.doi.org/10.1016/S0169-4332(98)00538-8",
  "relation": {},
  "ISSN": [
    "0169-4332"
  ],
  "subject": [],
  "container-title-short": "Applied Surface Science",
  "published": {
    "date-parts": [
      [
        1999,
        2
      ]
    ]
  }
}