DOI: 10.1016/s0169-4332(97)00217-1. Lateral force microscopy and force modulation microscopy on SILAR-grown lead sulfide samples

Lateral force microscopy and force modulation microscopy on SILAR-grown lead sulfide samples

10.1016/s0169-4332(97)00217-1

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Resch, R., Friedbacher, G., Grasserbauer, M., Kanniainen, T., Lindroos, S., LeskelÃ¤, M., & NiinistÃ¶, L. (1997). Lateral force microscopy and force modulation microscopy on SILAR-grown lead sulfide samples. Applied Surface Science, 120(1â2), 51â57.

Authors 7

R Resch (first)
G Friedbacher (additional)
M Grasserbauer (additional)
T Kanniainen (additional)
S Lindroos (additional)
M Leskelä (additional)
L Niinistö (additional)

References 21 Referenced 29

10.1016/0042-207X(90)93989-V / Vacuum by Leskelä (1990)
10.1039/JM9940401409 / J. Mater. Chem. by Nykänen (1994)
10.1016/0378-5963(85)90241-7 / Appl. Surf. Sci. by Nicolau (1985)
Y.F. Nicolau, US Patent 4675207 (1987).
10.1103/PhysRevLett.67.2029 / Phys. Rev. Lett. by Bourdien (1991)
10.1016/0040-6090(92)90366-J / Thin Solid Films by Fuchs (1992)
10.1016/0040-6090(95)05846-X / Thin Solid Films by Gesang (1995)
10.1143/JJAP.31.L1277 / Jpn. J. Appl. Phys. by Izunome (1992)
10.1039/JM9950500985 / J. Mater. Chem. by Kanniainen (1995)
10.1007/BF00321369 / Fres. J. Anal. Chem. by Resch (1995)
R. Resch, G. Friedbacher, M. Grasserbauer, T. Kanniainen, S. Lindroos, M. Leskelä, L. Niinistö, Fres. J. Anal. Chem., in press.
10.1038/359133a0 / Nature by Overney (1992)
10.1021/ma9503975 / Macromolecules by Vansco (1996)
10.1016/S0006-3495(93)81433-4 / Biophys. J. by Radmacher (1993)
10.1088/0957-4484/2/2/004 / Nanotechnol. by Maivald (1991)
10.1039/JM9960600161 / J. Mater. Chem. by Kanniainen (1996)
10.1126/science.265.5176.1209 / Science by Cieplak (1994)
10.1116/1.588528 / J. Vac. Sci. Technol. B by Schumacher (1996)
10.1021/la00012a009 / Langmuir by Marti (1995)
10.1016/0169-4332(96)00110-9 / Appl. Surf. Sci. by Asikainen (1996)
10.1116/1.589127 / J. Vac. Sci. Technol. B by Jacobi (1996)

Dates

Type	When
Created	23 years ago (July 25, 2002, 7:30 p.m.)
Deposited	6 years, 4 months ago (April 17, 2019, 9:50 p.m.)
Indexed	2 months, 2 weeks ago (June 6, 2025, 5:46 a.m.)
Issued	27 years, 9 months ago (Nov. 1, 1997)
Published	27 years, 9 months ago (Nov. 1, 1997)
Published Print	27 years, 9 months ago (Nov. 1, 1997)

Funders 0

None

BibTeX

@article{Resch_1997, title={Lateral force microscopy and force modulation microscopy on SILAR-grown lead sulfide samples}, volume={120}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/s0169-4332(97)00217-1}, DOI={10.1016/s0169-4332(97)00217-1}, number={1–2}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Resch, R and Friedbacher, G and Grasserbauer, M and Kanniainen, T and Lindroos, S and Leskelä, M and Niinistö, L}, year={1997}, month=nov, pages={51–57} }

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